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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 32 — Nov. 10, 2005
  • pp: 6813–7004

Optics InfoBase > Applied Optics > Volume 44 > Issue 32 > Table of Contents

Topics in this Issue

 
  • Detectors
  • Fourier optics and signal processing
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Interferometry
  • Lasers and Laser Optics
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Physical Optics
  • Remote Sensing
  • Spectroscopy
  • Thin Films
  • X-ray Optics
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Optical Technology and Biomedical Optics

Detectors

  • Applied Optics Vol. 44, Iss. 32, pp. 6813–6822 (2005)
  • Philip C. D. Hobbs, Robert B. Laibowitz, and Frank R. Libsch

Imaging Systems

  • Applied Optics Vol. 44, Iss. 32, pp. 6823–6832 (2005)
  • Hidehiro Kaneda, Takashi Onaka, Takao Nakagawa, Keigo Enya, Hiroshi Murakami, Ryoji Yamashiro, Tatsuhiko Ezaki, Yasuyuki Numao, and Yoshikazu Sugiyama

  • Applied Optics Vol. 44, Iss. 32, pp. 6833–6840 (2005)
  • Qingguo Yang, Liren Liu, and Haitao Lang

  • Applied Optics Vol. 44, Iss. 32, pp. 6841–6848 (2005)
  • Fabrice Bardin, Stephen Morgan, Stewart Williams, Roy McBride, Andrew J. Moore, Julian D. C. Jones, and Duncan P. Hand

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 44, Iss. 32, pp. 6849–6856 (2005)
  • Takeshi Yasui, Takashi Yasuda, Ken-ichi Sawanaka, and Tsutomu Araki

Integrated Optics

  • Applied Optics Vol. 44, Iss. 32, pp. 6857–6860 (2005)
  • Xiyuan Liu, Karl-Heinz Brenner, Marco Wilzbach, Michael Schwarz, Thomas Fernholz, and Jörg Schmiedmayer

Interferometry

  • Applied Optics Vol. 44, Iss. 32, pp. 6861–6868 (2005)
  • Matt Novak, James Millerd, Neal Brock, Michael North-Morris, John Hayes, and James Wyant

Optical Design and Fabrication

  • Applied Optics Vol. 44, Iss. 32, pp. 6869–6876 (2005)
  • Allen Y. Yi and Thomas W. Raasch

  • Applied Optics Vol. 44, Iss. 32, pp. 6877–6884 (2005)
  • Alexander V. Tikhonravov and Michael K. Trubetskov

Optical Devices

  • Applied Optics Vol. 44, Iss. 32, pp. 6885–6889 (2005)
  • Ralf Leutz and Harald Ries

  • Applied Optics Vol. 44, Iss. 32, pp. 6890–6897 (2005)
  • Manuel Silva-López, William N. MacPherson, Cheng Li, Andrew J. Moore, James S. Barton, Julian D. C. Jones, Donghui Zhao, Lin Zhang, and Ian Bennion

Optics at Surfaces

  • Applied Optics Vol. 44, Iss. 32, pp. 6898–6904 (2005)
  • Evgeny Popov, Michel Nevière, Anne-Laure Fehrembach, and Nicolas Bonod

Physical Optics

  • Applied Optics Vol. 44, Iss. 32, pp. 6905–6909 (2005)
  • Ivan V. Kityk, Akrajas Ali Umar, and Munetaka Oyama

  • Applied Optics Vol. 44, Iss. 32, pp. 6910–6912 (2005)
  • César D. Perciante and José A. Ferrari

Spectroscopy

  • Applied Optics Vol. 44, Iss. 32, pp. 6913–6920 (2005)
  • Daniel V. Hahn, Michael E. Thomas, and David W. Blodgett

Thin Films

  • Applied Optics Vol. 44, Iss. 32, pp. 6921–6926 (2005)
  • Cheng-Chung Lee, Ming-Chung Liu, Masaaki Kaneko, Kazuhide Nakahira, and Yuuichi Takano

X-ray Optics

  • Applied Optics Vol. 44, Iss. 32, pp. 6927–6932 (2005)
  • Kazuto Yamauchi, Kazuya Yamamura, Hidekazu Mimura, Yasuhisa Sano, Akira Saito, Katsuyoshi Endo, Alexei Souvorov, Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa, and Yuzo Mori

Information Processing

Fourier optics and signal processing

  • Applied Optics Vol. 44, Iss. 32, pp. 6933–6939 (2005)
  • G. Mínguez-Vega, M. Fernández-Alonso, E. Tajahuerce, J. Lancis, Z. Jaroszewicz, and P. Andrés

Image Processing

  • Applied Optics Vol. 44, Iss. 32, pp. 6940–6947 (2005)
  • Zlatko Vučić and Jadranko Gladić

Nonlinear Optics

  • Applied Optics Vol. 44, Iss. 32, pp. 6948–6951 (2005)
  • Yuanmei Gao, Simin Liu, Ru Guo, Zhaohong Liu, and Tao Song

Lasers, Photonics, and Environmental Optics

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 44, Iss. 32, pp. 6952–6961 (2005)
  • Minsu Kim and William D. Philpot

Lasers and Laser Optics

  • Applied Optics Vol. 44, Iss. 32, pp. 6962–6970 (2005)
  • Rajiva Bhatnagar, Rajeev Chaube, and Nageshwar Singh

Nonlinear Optics

  • Applied Optics Vol. 44, Iss. 32, pp. 6971–6985 (2005)
  • Pancho Tzankov and Valentin Petrov

Remote Sensing

  • Applied Optics Vol. 44, Iss. 32, pp. 6986–6994 (2005)
  • North F. Larsen and K. Stamnes

Spectroscopy

  • Applied Optics Vol. 44, Iss. 32, pp. 6995–7004 (2005)
  • Eric H. van Veen and Dirk Roekaerts
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