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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 33 — Nov. 20, 2005
  • pp: 7021–7242

Optics InfoBase > Applied Optics > Volume 44 > Issue 33 > Table of Contents

Topics in this Issue

 
  • Coherence and Statistical Optics
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Interferometry
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Optical Computing
  • Optical Design and Fabrication
  • Optical Devices
  • Remote Sensing
  • Spectroscopy
  • X-ray Optics
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Optical Technology and Biomedical Optics

Coherence and Statistical Optics

  • Applied Optics Vol. 44, Iss. 33, pp. 7021–7031 (2005)
  • Leonid Dombrovsky, Jaona Randrianalisoa, Dominique Baillis, and Laurent Pilon

Diffraction and Gratings

  • Applied Optics Vol. 44, Iss. 33, pp. 7032–7038 (2005)
  • Keio Fujita, Yuji Masuda, Keisuke Nakayama, Maki Ando, Kenji Sakamoto, Jun-pei Mohri, Makoto Yamauchi, Masanori Kimura, Yasuo Mizutani, Susumu Kimura, Takashi Yokouchi, Yoshifumi Suzaki, and Seiki Ejima

Fiber Optics and Optical Communications

  • Applied Optics Vol. 44, Iss. 33, pp. 7039–7042 (2005)
  • Rune Lausten, Paul Rochon, Mario Ivanov, Pavel Cheben, Siegfried Janz, Pierre Desjardins, John Ripmeester, Torsten Siebert, and Albert Stolow

Image Processing

  • Applied Optics Vol. 44, Iss. 33, pp. 7043–7049 (2005)
  • Tuck Wah Ng and Kar Tien Ang

  • Applied Optics Vol. 44, Iss. 33, pp. 7050–7054 (2005)
  • Qifeng Yu, Xia Yang, Sihua Fu, and Xiangyi Sun

Imaging Systems

  • Applied Optics Vol. 44, Iss. 33, pp. 7055–7061 (2005)
  • Keith Krapels, Ronald G. Driggers, and Brian Teaney

Interferometry

  • Applied Optics Vol. 44, Iss. 33, pp. 7062–7069 (2005)
  • Peter de Groot

  • Applied Optics Vol. 44, Iss. 33, pp. 7070–7073 (2005)
  • Deqing Ren and Eugene Serabyn

Medical Optics and Biotechnology

  • Applied Optics Vol. 44, Iss. 33, pp. 7083–7090 (2005)
  • Keigo Iizuka

  • Applied Optics Vol. 44, Iss. 33, pp. 7074–7082 (2005)
  • Olivier Karim Naoun, Valérie Louis Dorr, Paul Allé, Jean-Christophe Sablon, and Anne-Marie Benoit

Spectroscopy

  • Applied Optics Vol. 44, Iss. 33, pp. 7091–7097 (2005)
  • Fabien Chauchard, Sylvie Roussel, Jean-Michel Roger, Véronique Bellon-Maurel, Christoffer Abrahamsson, Tomas Svensson, Stefan Andersson-Engels, and Sune Svanberg

X-ray Optics

  • Applied Optics Vol. 44, Iss. 33, pp. 7098–7105 (2005)
  • Arjan L. Mieremet and Marco W. Beijersbergen

Information Processing

Holography

  • Applied Optics Vol. 44, Iss. 33, pp. 7106–7111 (2005)
  • Yuanjun Guo, Liren Liu, Dean Liu, Shaogeng Deng, and Yanan Zhi

Optical Computing

  • Applied Optics Vol. 44, Iss. 33, pp. 7112–7124 (2005)
  • Yongrong Zuo, Fouad E. Kiamiley, Xiaoqing Wang, Ping Gui, Jeremy Ekman, Xingle Wang, Michael J. McFadden, and Michael W. Haney

Lasers, Photonics, and Environmental Optics

Image Processing

  • Applied Optics Vol. 44, Iss. 33, pp. 7125–7129 (2005)
  • Tuck Wah Ng, Kar Tien Ang, and Gianluca Argentini

Imaging Systems

  • Applied Optics Vol. 44, Iss. 33, pp. 7130–7135 (2005)
  • Luciano Bartolini, Luigi De Dominicis, Mario Ferri de Collibus, Giorgio Fornetti, Massimiliano Guarneri, Emiliano Paglia, Claudio Poggi, and Roberto Ricci

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 44, Iss. 33, pp. 7136–7143 (2005)
  • Alkiviadis F. Bais, Stylianos Kazadzis, Katerina Garane, Natalia Kouremeti, Julian Gröbner, Mario Blumthaler, Gunther Seckmeyer, Ann R. Webb, Tapani Koskela, Peter Görts, and Josef Schreder

Interferometry

  • Applied Optics Vol. 44, Iss. 33, pp. 7144–7155 (2005)
  • Reza Mani, Steven Dobbie, Alan Scott, Gordon Shepherd, William Gault, and Stephen Brown

Lasers and Laser Optics

  • Applied Optics Vol. 44, Iss. 33, pp. 7156–7160 (2005)
  • Ai-Yun Yao, Wei Hou, Yong Bi, Ai-Cong geng, Xue-Chun Lin, Yu-Peng Kong, Da-Fu Cui, Ling-An Wu, and Zu-Yan Xu

  • Applied Optics Vol. 44, Iss. 33, pp. 7161–7169 (2005)
  • Haiwu Yu and Gilbert Bourdet

  • Applied Optics Vol. 44, Iss. 33, pp. 7170–7172 (2005)
  • Guido Sonnabend, Daniel Wirtz, and Rudolf Schieder

Materials

  • Applied Optics Vol. 44, Iss. 33, pp. 7173–7180 (2005)
  • James Sullivan, Jian Zhao, and Ted D. Bennett

  • Applied Optics Vol. 44, Iss. 33, pp. 7181–7186 (2005)
  • Bob Bellini, Jean-François Larchanché, Jean-Pierre Vilcot, Didier Decoster, Romeo Beccherelli, and Antonio d’Alessandro

Optical Design and Fabrication

  • Applied Optics Vol. 44, Iss. 33, pp. 7187–7190 (2005)
  • Degang Deng, Xiaoyong Fu, Chaoyang Wei, Jianda Shao, and Zhengxiu Fan

Optical Devices

  • Applied Optics Vol. 44, Iss. 33, pp. 7191–7195 (2005)
  • Todd W. Du Bosq, Andrey V. Muravjov, Robert E. Peale, and Christopher J. Fredricksen

Remote Sensing

  • Applied Optics Vol. 44, Iss. 33, pp. 7196–7209 (2005)
  • Robert Spurr, Diego Loyola, Werner Thomas, Wolfgang Balzer, Eberhard Mikusch, Bernd Aberle, Sander Slijkhuis, Thomas Ruppert, Michel van Roozendael, Jean-Christopher Lambert, and Trisnanto Soebijanta

  • Applied Optics Vol. 44, Iss. 33, pp. 7210–7217 (2005)
  • Marc L. Simpson, Meng-Dawn Cheng, Thang Q. Dam, Katey E. Lenox, Jeff R. Price, John M. Storey, Eric A. Wachter, and Walt G. Fisher

  • Applied Optics Vol. 44, Iss. 33, pp. 7218–7231 (2005)
  • Chris D. Boone, Ray Nassar, Kaley A. Walker, Yves Rochon, Sean D. McLeod, Curtis P. Rinsland, and Peter F. Bernath

Spectroscopy

  • Applied Optics Vol. 44, Iss. 33, pp. 7232–7238 (2005)
  • Kevin D. Belfield, Mykhailo V. Bondar, I. Cohanoschi, Florencio E. Hernandez, Oleksiy D. Kachkovsky, Olga V. Przhonska, and Sheng Yao

  • Applied Optics Vol. 44, Iss. 33, pp. 7239–7242 (2005)
  • James D. Ayers, Randy L. Apodaca, William R. Simpson, and Douglas S. Baer
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