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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 34 — Dec. 1, 2005
  • pp: 7261–7493

Optics InfoBase > Applied Optics > Volume 44 > Issue 34 > Table of Contents

Topics in this Issue

 
  • Atmospheric and oceanic optics
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Interferometry
  • Lasers and Laser Optics
  • Microscopy
  • Nonlinear Optics
  • Optical Data Storage
  • Optical Design and Fabrication
  • Optical Devices
  • Remote sensing and sensors
  • Scattering
  • Thin Films
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Optical Technology and Biomedical Optics

Image Processing

  • Applied Optics Vol. 44, Iss. 34, pp. 7261–7269 (2005)
  • Eric Robin, Valéry Valle, and Fabrice Brémand

Imaging Systems

  • Applied Optics Vol. 44, Iss. 34, pp. 7270–7274 (2005)
  • Ling Fu, Xiaosong Gan, and Min Gu

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 44, Iss. 34, pp. 7275–7281 (2005)
  • Maria Rosaria Vetrano, Jeronimus Petrus Antonius Johannes van Beeck, and Michel Léon Riethmuller

  • Applied Optics Vol. 44, Iss. 34, pp. 7282–7286 (2005)
  • Dawn K. Gifford, Brian J. Soller, Matthew S. Wolfe, and Mark E. Froggatt

Interferometry

  • Applied Optics Vol. 44, Iss. 34, pp. 7287–7294 (2005)
  • Alvarado Tarun, Julius Jecong, and Caesar Saloma

  • Applied Optics Vol. 44, Iss. 34, pp. 7295–7301 (2005)
  • Joseph Nilsen and Walter R. Johnson

Microscopy

  • Applied Optics Vol. 44, Iss. 34, pp. 7302–7306 (2005)
  • Caesar Saloma, Alvarado Tarun, Michelle Bailon, and Maricor Soriano

Optical Data Storage

  • Applied Optics Vol. 44, Iss. 34, pp. 7307–7312 (2005)
  • Sjoerd Stallinga

Optical Design and Fabrication

  • Applied Optics Vol. 44, Iss. 34, pp. 7313–7321 (2005)
  • Dimitri Mawet, Pierre Riaud, Jean Surdej, and Jacques Baudrand

  • Applied Optics Vol. 44, Iss. 34, pp. 7322–7332 (2005)
  • Gérard R. Lemaître, Pierre Montiel, Patrice Joulié, Kjetil Dohlen, and Patrick Lanzoni

Thin Films

  • Applied Optics Vol. 44, Iss. 34, pp. 7333–7338 (2005)
  • Cheng-Chung Lee, Ming-Chung Liu, Masaaki Kaneko, Kazuhide Nakahira, and Yuuichi Takano

Information Processing

Diffraction and Gratings

  • Applied Optics Vol. 44, Iss. 34, pp. 7339–7343 (2005)
  • S. R. Seshadri

Holography

  • Applied Optics Vol. 44, Iss. 34, pp. 7344–7348 (2005)
  • Baoli Yao, Zhiwei Ren, Neimule Menke, Yingli Wang, Yuan Zheng, Ming Lei, Guofu Chen, and Norbert Hampp

Image Processing

  • Applied Optics Vol. 44, Iss. 34, pp. 7349–7356 (2005)
  • Said E. El-Khamy, Mohiy M. Hadhoud, Moawad I. Dessouky, Bassiouny M. Salam, and Fathi E. Abd El-Samie

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 44, Iss. 34, pp. 7357–7363 (2005)
  • Yaofeng Sun, John H. L. Pang, Chee Khuen Wong, and Fei Su

Lasers, Photonics, and Environmental Optics

Atmospheric and oceanic optics

  • Applied Optics Vol. 44, Iss. 34, pp. 7364–7370 (2005)
  • Masahiro Toyoda

  • Applied Optics Vol. 44, Iss. 34, pp. 7371–7377 (2005)
  • Lelia B. Vann, Russell J. DeYoung, Stephen J. Mihailov, Ping Lu, Dan Grobnic, and Robert Walker

  • Applied Optics Vol. 44, Iss. 34, pp. 7378–7393 (2005)
  • Miroslav Kocifaj and Helmuth Horvath

Fiber Optics and Optical Communications

  • Applied Optics Vol. 44, Iss. 34, pp. 7394–7402 (2005)
  • Lei Su, Kin Seng Chiang, and Chao Lu

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 44, Iss. 34, pp. 7403–7406 (2005)
  • Quanhua Liu and Fuzhong Weng

  • Applied Optics Vol. 44, Iss. 34, pp. 7407–7413 (2005)
  • Tatsuo Shiina, Kei Yoshida, Masafumi Ito, and Yasuyuki Okamura

  • Applied Optics Vol. 44, Iss. 34, pp. 7414–7423 (2005)
  • Silvana De Iuliis, Francesco Cignoli, and Giorgio Zizak

Interferometry

  • Applied Optics Vol. 44, Iss. 34, pp. 7424–7438 (2005)
  • Brian Kern, Paul E. Dimotakis, Chris Martin, Daniel B. Lang, and Rachel N. Thessin

Lasers and Laser Optics

  • Applied Optics Vol. 44, Iss. 34, pp. 7439–7441 (2005)
  • Huaijin Zhang, Junhai Liu, Jiyang Wang, Xiangang Xu, and Minhua Jiang

  • Applied Optics Vol. 44, Iss. 34, pp. 7442–7450 (2005)
  • Weiping Wang, Fuli Tan, Baida Lü, and Cangli Liu

Nonlinear Optics

  • Applied Optics Vol. 44, Iss. 34, pp. 7452–7457 (2005)
  • Jennifer L. Carns, Gary Cook, Mohammed A. Saleh, Shekhar Guha, Scott A. Holmstrom, and Dean R. Evans

  • Applied Optics Vol. 44, Iss. 34, pp. 7458–7466 (2005)
  • Husam H. Abu-Safe

Optical Design and Fabrication

  • Applied Optics Vol. 44, Iss. 34, pp. 7467–7474 (2005)
  • Tatsuo Shiina, Kei Yoshida, Masafumi Ito, and Yasuyuki Okamura

Optical Devices

  • Applied Optics Vol. 44, Iss. 34, pp. 7475–7482 (2005)
  • Koji Asakawa and Akira Fujimoto

Remote sensing and sensors

  • Applied Optics Vol. 44, Iss. 34, pp. 7483–7486 (2005)
  • Frank E. Hoge

Scattering

  • Applied Optics Vol. 44, Iss. 34, pp. 7487–7493 (2005)
  • Matthew J. Berg, Christopher M. Sorensen, and Amit Chakrabarti

Erratum

Lasers, Photonics, and Environmental Optics

Lasers and Laser Optics

  • Applied Optics Vol. 44, Iss. 34, pp. 7451–7451 (2005)
  • Martin Ostermeyer, Philip Kappe, Ralf Menzel, and Volker Wulfmeyer
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