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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 36 — Dec. 20, 2005
  • pp: 7677–7871

Optics InfoBase > Applied Optics > Volume 44 > Issue 36 > Table of Contents

Topics in this Issue

 
  • Atmospheric and ocean optics
  • Fiber Optics and Optical Communications
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Interferometry
  • Lasers and Laser Optics
  • Optical Devices
  • Quantum Optics
  • Remote Sensing
  • Scattering
  • Ultrafast Optics
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  • Applied Optics Vol. 44, Iss. 36, pp. 7676–7676 (2005)
  • Glenn D. Boreman

Information Processing

Imaging Systems

  • Applied Optics Vol. 44, Iss. 36, pp. 7744–7748 (2005)
  • Antonio Manuel Pozo and Manuel Rubiño

  • Applied Optics Vol. 44, Iss. 36, pp. 7749–7753 (2005)
  • Dong-Hak Shin, Byoungho Lee, and Eun-Soo Kim

Optical Devices

  • Applied Optics Vol. 44, Iss. 36, pp. 7754–7759 (2005)
  • Bin Wang, Guoqiang Zhang, Anatoliy Glushchenko, John L. West, Philip J. Bos, and Paul F. McManamon

Quantum Optics

  • Applied Optics Vol. 44, Iss. 36, pp. 7760–7763 (2005)
  • Hai-Qiang Ma, Yuejian Xie, and Ling-An Wu

Lasers, Photonics, and Environmental Optics

Atmospheric and ocean optics

  • Applied Optics Vol. 44, Iss. 36, pp. 7764–7772 (2005)
  • A. I. Lyapustin

Fiber Optics and Optical Communications

  • Applied Optics Vol. 44, Iss. 36, pp. 7773–7779 (2005)
  • Denis Penninckx and Nicolas Beck

  • Applied Optics Vol. 44, Iss. 36, pp. 7780–7788 (2005)
  • Tadeusz Martynkien, Marcin Szpulak, and Waclaw Urbanczyk

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 44, Iss. 36, pp. 7789–7792 (2005)
  • Qian Wang, Gerald Farrell, and Thomas Freir

Interferometry

  • Applied Optics Vol. 44, Iss. 36, pp. 7793–7801 (2005)
  • Richard W. Fox, Brian R. Washburn, Nathan R. Newbury, and Leo Hollberg

Lasers and Laser Optics

  • Applied Optics Vol. 44, Iss. 36, pp. 7802–7805 (2005)
  • H. Abitan, H. Bohr, and C. F. Pedersen

  • Applied Optics Vol. 44, Iss. 36, pp. 7806–7809 (2005)
  • M. Schmiedchen, W. v. Spiegel, and T. Tschudi

  • Applied Optics Vol. 44, Iss. 36, pp. 7810–7813 (2005)
  • Yong Ho Cha, Yong Woo Lee, Kwang-Hoon Ko, Euo Chang Jung, Gwon Lim, Jaewoo Kim, Taek-Soo Kim, and Do-Young Jeong

  • Applied Optics Vol. 44, Iss. 36, pp. 7814–7822 (2005)
  • Alok Kumar Ray, Sasi Kumar, Narayan Vitthal Mayekar, Sucharita Sinha, Soumitra Kundu, Subrata Chattopadhyay, and Kamalesh Dasgupta

  • Applied Optics Vol. 44, Iss. 36, pp. 7823–7827 (2005)
  • Inon Moshe, Steven Jackel, and Avi Meir

Remote Sensing

  • Applied Optics Vol. 44, Iss. 36, pp. 7828–7844 (2005)
  • Nadège Martiny, Robert Frouin, and Richard Santer

Scattering

  • Applied Optics Vol. 44, Iss. 36, pp. 7845–7852 (2005)
  • Zuomin Zhao and Risto Myllylä

  • Applied Optics Vol. 44, Iss. 36, pp. 7853–7857 (2005)
  • Richard S. Conroy, Brian T. Mayers, Dmitri V. Vezenov, Daniel B. Wolfe, Mara G. Prentiss, and George M. Whitesides

  • Applied Optics Vol. 44, Iss. 36, pp. 7858–7861 (2005)
  • Tahereh Mokhtari, Christopher M. Sorensen, and Amit Chakrabarti

Ultrafast Optics

  • Applied Optics Vol. 44, Iss. 36, pp. 7862–7866 (2005)
  • Naum K. Berger, Boris Levit, Vladimir Smulakovsky, and Baruch Fischer

  • Applied Optics Vol. 44, Iss. 36, pp. 7867–7871 (2005)
  • Prince Anandarajah, Marc Rensing, and L. P. Barry
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