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Applied Optics

Applied Optics

  • Editor: James C. Wyant
  • Vol. 45, Iss. 15 — May. 20, 2006
  • pp: 3409–3664

Optics InfoBase > Applied Optics > Volume 45 > Issue 15 > Table of Contents

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  • Applied Optics, Vol. 45, Iss. 15, pp. 3409–3414 (2006)
  • Cheng-Ying Chung, Keng-Chi Cho, Chih-Chiang Chang, Cheng-Hsiang Lin, Wei-Chung Yen, and Shean-Jen Chen

  • Applied Optics, Vol. 45, Iss. 15, pp. 3415–3419 (2006)
  • Cristina Figl, Laurent Longchambon, Matthew Jeppesen, Michael Kruger, Hans A. Bachor, Nicholas P. Robins, and John D. Close

  • Applied Optics, Vol. 45, Iss. 15, pp. 3420–3424 (2006)
  • Shun-Der Wu, Thomas K. Gaylord, and Elias N. Glytsis

  • Applied Optics, Vol. 45, Iss. 15, pp. 3425–3429 (2006)
  • Yael Roichman, Alex Waldron, Emily Gardel, and David G. Grier

  • Applied Optics, Vol. 45, Iss. 15, pp. 3430–3441 (2006)
  • Jin Choi, T. H. Kim, H. J. Kong, and Jong Ung Lee

  • Applied Optics, Vol. 45, Iss. 15, pp. 3442–3455 (2006)
  • Xi Hou, Fan Wu, Li Yang, Shibin Wu, and Qiang Chen

  • Applied Optics, Vol. 45, Iss. 15, pp. 3456–3462 (2006)
  • Giancarlo Pedrini, Wolfgang Osten, and Mikhail E. Gusev

  • Applied Optics, Vol. 45, Iss. 15, pp. 3463–3476 (2006)
  • Robert M. Neal and James C. Wyant

  • Applied Optics, Vol. 45, Iss. 15, pp. 3477–3481 (2006)
  • Javier Salinas-Luna, Roberto Machorro, Javier Camacho, Esteban Luna, and Juan Nunez

  • Applied Optics, Vol. 45, Iss. 15, pp. 3482–3488 (2006)
  • Elizabeth Scherschener, César D. Perciante, Enrique A. Dalchiele, Erna M. Frins, Matthias Korn, and José A. Ferrari

  • Applied Optics, Vol. 45, Iss. 15, pp. 3489–3494 (2006)
  • Koichiro Kishima, Naoko Yoshida, Kiyoshi Osato, and Nobuyoshi Nakagawa

  • Applied Optics, Vol. 45, Iss. 15, pp. 3495–3500 (2006)
  • P. Laird, N. Caron, M. Rioux, E. F. Borra, and A. Ritcey

  • Applied Optics, Vol. 45, Iss. 15, pp. 3501–3509 (2006)
  • Antti Penttilä, Kari Lumme, and Lauri Kuutti

  • Applied Optics, Vol. 45, Iss. 15, pp. 3510–3515 (2006)
  • Jean-Yee Wu and Cheng-Chung Lee

  • Applied Optics, Vol. 45, Iss. 15, pp. 3516–3526 (2006)
  • Fujian Ding, Yud-Ren Chen, Kuanglin Chao, and Moon S. Kim

  • Applied Optics, Vol. 45, Iss. 15, pp. 3527–3533 (2006)
  • Mark L. Tachiki, Yusuke Sando, Masahide Itoh, and Toyohiko Yatagai

  • Applied Optics, Vol. 45, Iss. 15, pp. 3534–3543 (2006)
  • Frida Strömqvist Vetelino, Bradley Clare, Kerry Corbett, Cynthia Young, Kenneth Grant, and Larry Andrews

  • Applied Optics, Vol. 45, Iss. 15, pp. 3544–3544 (2006)
  • Janet L. Machol, Tom Ayers, Karl T. Schwenz, Keith W. Koenig, R. Michael Hardesty, Christoph J. Senff, Michael A. Krainak, James B. Abshire, Hector E. Bravo, and Scott P. Sandberg

  • Applied Optics, Vol. 45, Iss. 15, pp. 3545–3547 (2006)
  • Andreas Jechow, Volker Raab, and Ralf Menzel

  • Applied Optics, Vol. 45, Iss. 15, pp. 3548–3552 (2006)
  • Erkki Lassila and Rolf Hernberg

  • Applied Optics, Vol. 45, Iss. 15, pp. 3553–3560 (2006)
  • Richard Ferriere, Badr-Eddine Benkelfat, John M. Dudley, and Kamal Ghoumid

  • Applied Optics, Vol. 45, Iss. 15, pp. 3561–3576 (2006)
  • Chan Bong Park, Hideaki Nakane, Nobuo Sugimoto, Ichiro Matsui, Yasuhiro Sasano, Yasumi Fujinuma, Izumi Ikeuchi, Jun-Ichi Kurokawa, and Noritaka Furuhashi

  • Applied Optics, Vol. 45, Iss. 15, pp. 3577–3592 (2006)
  • Giorgio Dall'Olmo and Anatoly A. Gitelson

  • Applied Optics, Vol. 45, Iss. 15, pp. 3593–3604 (2006)
  • Grace C. Chang, Andrew H. Barnard, Scott McLean, Peter J. Egli, Casey Moore, J. Ron V. Zaneveld, Tommy D. Dickey, and Al Hanson

  • Applied Optics, Vol. 45, Iss. 15, pp. 3605–3619 (2006)
  • Malik Chami, Eugeny B. Shybanov, Gueorgui A. Khomenko, Michael E.-G. Lee, Oleg V. Martynov, and Gennady K. Korotaev

  • Applied Optics, Vol. 45, Iss. 15, pp. 3620–3628 (2006)
  • Francisco Pedocchi and Marcelo H. García

  • Applied Optics, Vol. 45, Iss. 15, pp. 3629–3633 (2006)
  • Masaharu Hyodo, Kazuyuki Nakayama, Ryuzo Ohmukai, Kazuyoshi Kurihara, and Masayoshi Watanabe

  • Applied Optics, Vol. 45, Iss. 15, pp. 3634–3645 (2006)
  • James A. Lock, Susan Y. Wrbanek, and Kenneth E. Weiland (retired)

  • Applied Optics, Vol. 45, Iss. 15, pp. 3646–3651 (2006)
  • Markus C. Weikl, Frank Beyrau, and Alfred Leipertz

  • Applied Optics, Vol. 45, Iss. 15, pp. 3652–3658 (2006)
  • Robert Voors, Marcel Dobber, Ruud Dirksen, and Pieternel Levelt

  • Applied Optics, Vol. 45, Iss. 15, pp. 3659–3664 (2006)
  • Joseph Kunnil, Sivananthan Sarasanandarajah, Easaw Chacko, and Lou Reinisch
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