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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 21 — Jul. 20, 2006
  • pp: 5059–5431

Optics InfoBase > Applied Optics > Volume 45 > Issue 21 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Diffraction and Gratings
  • Fourier Optics and Optical Signal Processing
  • Holography
  • Image Processing
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Polarimetry
  • Polarization-Sensitive Devices
  • Remote Sensing
  • Spectroscopy
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Optical Technology

Diffraction and Gratings

  • Applied Optics Vol. 45, Iss. 21, pp. 5059–5065 (2006)
  • Ling Qing, Wu Gang, Liu Bin, and Wang Qiuping

  • Applied Optics Vol. 45, Iss. 21, pp. 5066–5072 (2006)
  • Rosane Falate, Orlando Frazão, Gaspar Rego, José Luís Fabris, and José Luís Santos

Image Processing

  • Applied Optics Vol. 45, Iss. 21, pp. 5073–5085 (2006)
  • S. Susan Young and Ronald G. Driggers

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 21, pp. 5086–5091 (2006)
  • Peisen S. Huang and Song Zhang

  • Applied Optics Vol. 45, Iss. 21, pp. 5092–5106 (2006)
  • Nicolas Goudemand

Polarimetry

  • Applied Optics Vol. 45, Iss. 21, pp. 5107–5117 (2006)
  • David T. Chuss, Edward J. Wollack, S. Harvey Moseley, and Giles Novak

Lasers and Laser Optics

  • Applied Optics Vol. 45, Iss. 21, pp. 5118–5131 (2006)
  • David L. Shealy and John A. Hoffnagle

Nonlinear Optics

  • Applied Optics Vol. 45, Iss. 21, pp. 5132–5142 (2006)
  • Yi Qiao, Yi Zhou, and Sridhar Krishnaswamy

Optical Design and Fabrication

  • Applied Optics Vol. 45, Iss. 21, pp. 5143–5153 (2006)
  • Stuart B. Shaklan and Joseph J. Green

  • Applied Optics Vol. 45, Iss. 21, pp. 5154–5159 (2006)
  • Yi Yang, Ke-Yuan Qian, and Yi Luo

  • Applied Optics Vol. 45, Iss. 21, pp. 5160–5163 (2006)
  • Dong Hongzhou, Shi Shunxiang, and Chen Shouman

  • Applied Optics Vol. 45, Iss. 21, pp. 5164–5167 (2006)
  • Roman Duplov

Polarization-Sensitive Devices

  • Applied Optics Vol. 45, Iss. 21, pp. 5168–5184 (2006)
  • Claudio Macculi, Mario Zannoni, Oscar Antonio Peverini, Ettore Carretti, Riccardo Tascone, and Stefano Cortiglioni

Spectroscopy

  • Applied Optics Vol. 45, Iss. 21, pp. 5185–5190 (2006)
  • Patrick C. Chaumet, Adel Rahmani, and Manuel Nieto-Vesperinas

  • Applied Optics Vol. 45, Iss. 21, pp. 5191–5206 (2006)
  • Dennis Nevejans, Eddy Neefs, Emiel Van Ransbeeck, Sophie Berkenbosch, Roland Clairquin, Lieve De Vos, Wouter Moelans, Stijn Glorieux, Ann Baeke, Oleg Korablev, Imant Vinogradov, Yuri Kalinnikov, Benny Bach, Jean-Pierre Dubois, and Eric Villard

Information Processing

Holography

  • Applied Optics Vol. 45, Iss. 21, pp. 5207–5211 (2006)
  • Cristina Solano, Geminiano Martinez-Ponce, and Carlos Castañeda

  • Applied Optics Vol. 45, Iss. 21, pp. 5212–5222 (2006)
  • Joseph Shamir

Image Processing

  • Applied Optics Vol. 45, Iss. 21, pp. 5223–5236 (2006)
  • François Goudail, Nicolas Roux, Ivar Baarstad, Trond Løke, Peter Kaspersen, Mehdi Alouini, and Xavier Normandin

  • Applied Optics Vol. 45, Iss. 21, pp. 5237–5247 (2006)
  • José J. Vallés, Javier García, Pascuala García-Martínez, and Henri H. Arsenault

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 21, pp. 5248–5257 (2006)
  • Dzena Hidovic-Rowe, Jonathan E. Rowe, and Manuela Lualdi

Optical Devices

  • Applied Optics Vol. 45, Iss. 21, pp. 5258–5269 (2006)
  • David Engström, Per Rudquist, Jörgen Bengtsson, Koen D'havé, and Sheila Galt

Spectroscopy

  • Applied Optics Vol. 45, Iss. 21, pp. 5270–5280 (2006)
  • Raphaël Desbiens, Jérôme Genest, Pierre Tremblay, and Jean-Pierre Bouchard

Lasers, Photonics, and Environmental Optics

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 45, Iss. 21, pp. 5281–5293 (2006)
  • Qiang Yang, Curtis R. Vogel, and Brent L. Ellerbroek

  • Applied Optics Vol. 45, Iss. 21, pp. 5294–5309 (2006)
  • James M. Sullivan, Michael S. Twardowski, J. Ronald V. Zaneveld, Casey M. Moore, Andrew H. Barnard, Percy L. Donaghay, and Bruce Rhoades

  • Applied Optics Vol. 45, Iss. 21, pp. 5310–5319 (2006)
  • Tomonori Tanikawa, Teruo Aoki, Masahiro Hori, Akihiro Hachikubo, Osamu Abe, and Masamu Aniya

  • Applied Optics Vol. 45, Iss. 21, pp. 5320–5334 (2006)
  • Stephen G. Warren, Richard E. Brandt, and Thomas C. Grenfell

Fourier Optics and Optical Signal Processing

  • Applied Optics Vol. 45, Iss. 21, pp. 5335–5345 (2006)
  • S. R. Seshadri

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 21, pp. 5346–5357 (2006)
  • O. Meinander, S. Kazadzis, M. Blumthaler, L. Ylianttila, B. Johnsen, K. Lakkala, T. Koskela, and W. Josefsson

Lasers and Laser Optics

  • Applied Optics Vol. 45, Iss. 21, pp. 5358–5367 (2006)
  • E. Mendez, K. M. Nowak, H. J. Baker, F. J. Villarreal, and D. R. Hall

  • Applied Optics Vol. 45, Iss. 21, pp. 5368–5376 (2006)
  • Martin Ostermeyer, Damien Mudge, Peter J. Veitch, and Jesper Munch

  • Applied Optics Vol. 45, Iss. 21, pp. 5377–5384 (2006)
  • Jianlang Li, Ken-ichi Ueda, Jun Dong, Mitsuru Musha, and Akira Shirakawa

Materials

  • Applied Optics Vol. 45, Iss. 21, pp. 5385–5390 (2006)
  • Wade N. Sisk and Nobuaki Tanaka

Nonlinear Optics

  • Applied Optics Vol. 45, Iss. 21, pp. 5391–5403 (2006)
  • Yong Wang, Jorge Fonseca-Campos, Chang-Qing Xu, Shiquan Yang, Evgueni A. Ponomarev, and Xiaoyi Bao

Optical Devices

  • Applied Optics Vol. 45, Iss. 21, pp. 5404–5413 (2006)
  • Roshan Thapliya, Shigetoshi Nakamura, and Takashi Kikuchi

Remote Sensing

  • Applied Optics Vol. 45, Iss. 21, pp. 5414–5425 (2006)
  • Susanne E. Craig, Steven E. Lohrenz, Zhongping Lee, Kevin L. Mahoney, Gary J. Kirkpatrick, Oscar M. Schofield, and Robert G. Steward

Biomedical Optics

Optical Design and Fabrication

  • Applied Optics Vol. 45, Iss. 21, pp. 5426–5431 (2006)
  • Linbo Liu and Nan Guang Chen
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