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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 22 — Aug. 1, 2006
  • pp: 5451–5782

Optics InfoBase > Applied Optics > Volume 45 > Issue 22 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Environmental Effect and Signatures
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Imaging Polarimeters
  • Imaging Systems
  • Integrated Optics
  • Interferometry
  • Introduction and Review
  • Lasers and Laser Optics
  • Materials
  • Optical Design and Fabrication
  • Physical Optics
  • System Modeling and Optimization
  • Thin Films
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Polarization Imaging and Remote Sensing

Introduction and Review

  • Applied Optics Vol. 45, Iss. 22, pp. 5451–5452 (2006)
  • J. Scott Tyo, Dennis H. Goldstein, David B. Chenault, and Joseph A. Shaw

  • Applied Optics Vol. 45, Iss. 22, pp. 5453–5469 (2006)
  • J. Scott Tyo, Dennis L. Goldstein, David B. Chenault, and Joseph A. Shaw

Imaging Polarimeters

  • Applied Optics Vol. 45, Iss. 22, pp. 5470–5478 (2006)
  • Nathan J. Pust and Joseph A. Shaw

  • Applied Optics Vol. 45, Iss. 22, pp. 5479–5488 (2006)
  • Gerald E. Jellison Jr., John D. Hunn, and Christopher M. Rouleau

  • Applied Optics Vol. 45, Iss. 22, pp. 5489–5496 (2006)
  • Slawomir Drobczynski, Juan M. Bueno, Pablo Artal, and Henryk Kasprzak

System Modeling and Optimization

  • Applied Optics Vol. 45, Iss. 22, pp. 5497–5503 (2006)
  • J. Scott Tyo and Hua Wei

  • Applied Optics Vol. 45, Iss. 22, pp. 5504–5520 (2006)
  • Konstantin M. Yemelyanov, Shih-Schön Lin, Edward N. Pugh, Jr., and Nader Engheta

  • Applied Optics Vol. 45, Iss. 22, pp. 5521–5531 (2006)
  • Yasser Y. Hassebo, Barry Gross, Min Oo, Fred Moshary, and Samir Ahmed

Environmental Effect and Signatures

  • Applied Optics Vol. 45, Iss. 22, pp. 5532–5541 (2006)
  • Ralph E. Nothdurft and Gang Yao

  • Applied Optics Vol. 45, Iss. 22, pp. 5542–5567 (2006)
  • Jacek Chowdhary, Brian Cairns, and Larry D. Travis

  • Applied Optics Vol. 45, Iss. 22, pp. 5568–5581 (2006)
  • Alexander Gilerson, Jing Zhou, Min Oo, Jacek Chowdhary, Barry M. Gross, Fred Moshary, and Samir Ahmed

  • Applied Optics Vol. 45, Iss. 22, pp. 5582–5589 (2006)
  • Thomas W. Cronin, Eric J. Warrant, and Birgit Greiner

Contributed Papers

Optical Technology

Fiber Optics and Optical Communications

  • Applied Optics Vol. 45, Iss. 22, pp. 5590–5596 (2006)
  • Stuart Watson, Matthew J. Gander, William N. MacPherson, James S. Barton, Julian D. C. Jones, Thomas Klotzbuecher, Torsten Braune, Johannes Ott, and Felix Schmitz

  • Applied Optics Vol. 45, Iss. 22, pp. 5597–5606 (2006)
  • Tatsuya Sugita, Kouki Hirano, Tomiya Abe, and Yuzo Itoh

Interferometry

  • Applied Optics Vol. 45, Iss. 22, pp. 5607–5613 (2006)
  • Michael O'Hora, Brian Bowe, and Vincent Toal

  • Applied Optics Vol. 45, Iss. 22, pp. 5614–5620 (2006)
  • Akiko Hirai and Hirokazu Matsumoto

Materials

  • Applied Optics Vol. 45, Iss. 22, pp. 5621–5628 (2006)
  • Jue Wang and Robert L. Maier

Optical Design and Fabrication

  • Applied Optics Vol. 45, Iss. 22, pp. 5629–5635 (2006)
  • Lizbeth A. Castañeda-Escobar and Daniel Malacara-Hernández

Thin Films

  • Applied Optics Vol. 45, Iss. 22, pp. 5636–5641 (2006)
  • Pierre G. Verly

  • Applied Optics Vol. 45, Iss. 22, pp. 5642–5650 (2006)
  • Denis Garoli, F. Frassetto, G. Monaco, P. Nicolosi, M.-G. Pelizzo, F. Rigato, V. Rigato, A. Giglia, and S. Nannarone

Information Processing

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 45, Iss. 22, pp. 5651–5656 (2006)
  • Ende Li, Yun Dai, Haiying Wang, and Yudong Zhang

  • Applied Optics Vol. 45, Iss. 22, pp. 5657–5668 (2006)
  • Byron Formwalt and Stephen Cain

Holography

  • Applied Optics Vol. 45, Iss. 22, pp. 5669–5676 (2006)
  • Seung-Cheol Kim, Dong-Choon Hwang, Dong-Hwi Lee, and Eun-Soo Kim

Image Processing

  • Applied Optics Vol. 45, Iss. 22, pp. 5677–5685 (2006)
  • Firooz A. Sadjadi

Imaging Systems

  • Applied Optics Vol. 45, Iss. 22, pp. 5686–5692 (2006)
  • Todd W. Du Bosq, Jose Manuel Lopez-Alonso, and Glenn D. Boreman

Physical Optics

  • Applied Optics Vol. 45, Iss. 22, pp. 5693–5700 (2006)
  • Unnikrishnan Gopinathan, Thomas J. Naughton, and John T. Sheridan

Lasers, Photonics, and Environmental Optics

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 45, Iss. 22, pp. 5701–5708 (2006)
  • Guido Di Donfrancesco, Francesco Cairo, Carlo Buontempo, Alberto Adriani, Maurizio Viterbini, Marcel Snels, Roberto Morbidini, Francesco Piccolo, Francesco Cardillo, Jean-Pierre Pommereau, and Anne Garnier

  • Applied Optics Vol. 45, Iss. 22, pp. 5709–5715 (2006)
  • Aglae Kellerer, Marc Sarazin, Vincent Coudé du Foresto, Karim Agabi, Eric Aristidi, and Tatyana Sadibekova

  • Applied Optics Vol. 45, Iss. 22, pp. 5716–5724 (2006)
  • Brian Barkey and Kuo Nan Liou

Holography

  • Applied Optics Vol. 45, Iss. 22, pp. 5725–5732 (2006)
  • Tadashi Konishi, Akihiko Ito, Yuji Kudo, Akira Narumi, Kozo Saito, John Baker, and Peter M. Struk

Interferometry

  • Applied Optics Vol. 45, Iss. 22, pp. 5733–5739 (2006)
  • A. Ping Zhang, Zu-Guang Guan, and Sailing He

Integrated Optics

  • Applied Optics Vol. 45, Iss. 22, pp. 5740–5747 (2006)
  • Sakoolkan Boonruang, Andrew Greenwell, and M. G. Moharam

Lasers and Laser Optics

  • Applied Optics Vol. 45, Iss. 22, pp. 5748–5751 (2006)
  • Naoto Tsutsumi, Arata Fujihara, and Daisuke Hayashi

  • Applied Optics Vol. 45, Iss. 22, pp. 5752–5757 (2006)
  • Yannig Durand, Alain Culoma, Roland Meynart, Jean-Luc Pinsard, and Gerard Volluet

  • Applied Optics Vol. 45, Iss. 22, pp. 5758–5766 (2006)
  • Yangjian Cai and Lei Zhang

  • Applied Optics Vol. 45, Iss. 22, pp. 5767–5776 (2006)
  • Dechun Li, Shengzhi Zhao, Guiqiu Li, and Kejian Yang

Optical Design and Fabrication

  • Applied Optics Vol. 45, Iss. 22, pp. 5777–5782 (2006)
  • Ngoc Diep Lai, Jian Hung Lin, Wen Ping Liang, Chia Chen Hsu, and Cheng Hsiung Lin
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