OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 28 — Oct. 1, 2006
  • pp: 7195–7542

Optics InfoBase > Applied Optics > Volume 45 > Issue 28 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Diffraction and Gratings
  • Fourier Optics and Optical Signal Processing
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Medical Optics and Biotechnology
  • Optical Data Storage
  • Optical Devices
  • Optics at Surfaces
  • Scattering
  • Spectroscopy
  • Thin Films
  • Ultrafast Optics
Click for help

Sort By: Topics | Page Range

Optical Technology

Diffraction and Gratings

  • Applied Optics Vol. 45, Iss. 28, pp. 7195–7204 (2006)
  • David Engström, Gabriel Milewski, Jörgen Bengtsson, and Sheila Galt

  • Applied Optics Vol. 45, Iss. 28, pp. 7205–7210 (2006)
  • R. Andrew Hicks, Marc Millstone, and Kostas Daniilidiis

Holography

  • Applied Optics Vol. 45, Iss. 28, pp. 7211–7223 (2006)
  • Mark T. Gruneisen, Matthew B. Garvin, Raymond C. Dymale, and James R. Rotgé

  • Applied Optics Vol. 45, Iss. 28, pp. 7224–7234 (2006)
  • Ünal Sakoglu, Majeed M. Hayat, J. Scott Tyo, Philip Dowd, Senthil Annamalai, Kalyan T. Posani, and Sanjay Krishna

  • Applied Optics Vol. 45, Iss. 28, pp. 7235–7238 (2006)
  • Ali Bozbey, Mehdi Fardmanesh, Juergen Schubert, and Marko Banzet

Imaging Systems

  • Applied Optics Vol. 45, Iss. 28, pp. 7239–7247 (2006)
  • Hansol Cho, Young Mok Son, Mu Gyeom Kim, Byoung Joo Ra, Joon-Yong Park, Seung Hui Lee, Jin Sung Choi, Min Young Song, O. Ok Park, Youn Cheol Kim, and Jin Taek Hwang

  • Applied Optics Vol. 45, Iss. 28, pp. 7248–7254 (2006)
  • Ofer David, Norman S. Kopeika, and Boaz Weizer

  • Applied Optics Vol. 45, Iss. 28, pp. 7255–7263 (2006)
  • Hua Lei, Huajun Feng, Xiaoping Tao, and Zhihai Xu

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 28, pp. 7264–7268 (2006)
  • Silvano Donati, Michele Norgia, and Guido Giuliani

  • Applied Optics Vol. 45, Iss. 28, pp. 7269–7272 (2006)
  • Stefan Hild, Harald Lück, Walter Winkler, Ken Strain, Hartmut Grote, Joshua Smith, Michaela Malec, Martin Hewitson, Benno Willke, James Hough, and Karsten Danzmann

Optical Devices

  • Applied Optics Vol. 45, Iss. 28, pp. 7273–7278 (2006)
  • Shigeru Aoyama, Akihiro Funamoto, and Koichi Imanaka

  • Applied Optics Vol. 45, Iss. 28, pp. 7279–7285 (2006)
  • Joun-Ho Lee, Hyunchul Choi, Seung Hee Lee, Jae Chang Kim, and Gi-Dong Lee

  • Applied Optics Vol. 45, Iss. 28, pp. 7286–7293 (2006)
  • Dennis W. Dobbs and Brian T. Cunningham

Optics at Surfaces

  • Applied Optics Vol. 45, Iss. 28, pp. 7294–7298 (2006)
  • Óscar Esteban, Natalia Díaz-Herrera, María-Cruz Navarrete, and Agustín González-Cano

  • Applied Optics Vol. 45, Iss. 28, pp. 7299–7308 (2006)
  • Laurent Helden, Elena Eremina, Norbert Riefler, Christopher Hertlein, Clemens Bechinger, Yuri Eremin, and Thomas Wriedt

Scattering

  • Applied Optics Vol. 45, Iss. 28, pp. 7309–7315 (2006)
  • Peter C. Seitz, Ernst H. K. Stelzer, and Alexander Rohrbach

Thin Films

  • Applied Optics Vol. 45, Iss. 28, pp. 7316–7318 (2006)
  • Alexandre Gatto, Minghong Yang, Norbert Kaiser, Stefan Günster, Detlev Ristau, Mauro' Trovo, and Miltcho Danailov

  • Applied Optics Vol. 45, Iss. 28, pp. 7319–7324 (2006)
  • Ming-Chung Liu, Cheng-Chung Lee, Masaaki Kaneko, Kazuhide Nakahira, and Yuuichi Takano

Information Processing

Fourier Optics and Optical Signal Processing

  • Applied Optics Vol. 45, Iss. 28, pp. 7325–7333 (2006)
  • Zeev Zalevsky, Avi Rubner, Javier García, Pascuala Garcia-Martinez, Carlos Ferreira, and Emanuel Marom

Holography

  • Applied Optics Vol. 45, Iss. 28, pp. 7334–7341 (2006)
  • Edward Buckley, Adrian Cable, Nic Lawrence, and Tim Wilkinson

Image Processing

  • Applied Optics Vol. 45, Iss. 28, pp. 7342–7352 (2006)
  • Yulia V. Zhulina

  • Applied Optics Vol. 45, Iss. 28, pp. 7353–7364 (2006)
  • Joseph C. Dagher, Michael W. Marcellin, and Mark A. Neifeld

  • Applied Optics Vol. 45, Iss. 28, pp. 7365–7374 (2006)
  • Abhijit Mahalanobis and Alan Van Nevel

Imaging Systems

  • Applied Optics Vol. 45, Iss. 28, pp. 7375–7381 (2006)
  • Dong-Hak Shin, Byoungho Lee, and Eun-Soo Kim

  • Applied Optics Vol. 45, Iss. 28, pp. 7382–7391 (2006)
  • Pawan K. Baheti and Mark A. Neifeld

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 28, pp. 7392–7400 (2006)
  • Chen Tang, Fang Zhang, Botao Li, and Haiqing Yan

Optical Data Storage

  • Applied Optics Vol. 45, Iss. 28, pp. 7401–7409 (2006)
  • Mehmet Keskinoz

Lasers, Photonics, and Environmental Optics

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 45, Iss. 28, pp. 7410–7428 (2006)
  • Eurico J. D'Sa, Richard L. Miller, and Carlos Del Castillo

  • Applied Optics Vol. 45, Iss. 28, pp. 7429–7442 (2006)
  • Markus Pahlow, Detlef Müller, Matthias Tesche, Heike Eichler, Graham Feingold, Wynn L. Eberhard, and Ya-Fang Cheng

  • Applied Optics Vol. 45, Iss. 28, pp. 7443–7455 (2006)
  • Zhonghai Jin, Thomas P. Charlock, Ken Rutledge, Knut Stamnes, and Yingjian Wang

  • Applied Optics Vol. 45, Iss. 28, pp. 7456–7467 (2006)
  • Yanfei Wang, Shufang Fan, Xue Feng, Guangjian Yan, and Yanning Guan

  • Applied Optics Vol. 45, Iss. 28, pp. 7468–7474 (2006)
  • Nobuo Sugimoto and Choo Hie Lee

  • Applied Optics Vol. 45, Iss. 28, pp. 7475–7479 (2006)
  • Quanhua Liu and Fuzhong Weng

Integrated Optics

  • Applied Optics Vol. 45, Iss. 28, pp. 7480–7487 (2006)
  • Yinghua Qi, Jia Jiang, Claire L. Callender, Michael Day, and Jianfu Ding

Lasers and Laser Optics

  • Applied Optics Vol. 45, Iss. 28, pp. 7488–7497 (2006)
  • Maya Brumer, Marina Sirota, Ariel Kigel, Aldona Sashchiuk, Ehud Galun, Zeev Burshtein, and Efrat Lifshitz

Optical Devices

  • Applied Optics Vol. 45, Iss. 28, pp. 7498–7503 (2006)
  • Jose Luis Pau, Javier Anduaga, Carlos Rivera, Álvaro Navarro, Isabel Álava, Marcos Redondo, and Elías Muñoz

Spectroscopy

  • Applied Optics Vol. 45, Iss. 28, pp. 7504–7518 (2006)
  • Roland J. Leigh, Gary K. Corlett, Udo Friess, and Paul S. Monks

Ultrafast Optics

  • Applied Optics Vol. 45, Iss. 28, pp. 7519–7523 (2006)
  • Yuri Sikorski, Corneliu Rablau, Mark Dugan, Ali A. Said, Philippe Bado, and Lars Guenter Beholz

  • Applied Optics Vol. 45, Iss. 28, pp. 7524–7528 (2006)
  • Yanfu Yang, Caiyun Lou, Hongbo Zhou, Jiajun Wang, and Yizhi Gao

Biomedical Optics

Medical Optics and Biotechnology

  • Applied Optics Vol. 45, Iss. 28, pp. 7529–7537 (2006)
  • Sharad Gupta, V. L. N. Sridhar Raja, and Asima Pradhan

  • Applied Optics Vol. 45, Iss. 28, pp. 7538–7542 (2006)
  • Kanchan Garai, Mohan Muralidhar, and Sudipta Maiti
Click for help

Sort By: Topics | Page Range





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Announcements

More News