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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 32 — Nov. 10, 2006
  • pp: 8177–8380

Optics InfoBase > Applied Optics > Volume 45 > Issue 32 > Table of Contents

Topics in this Issue

 
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Fourier Optics and Optical Signal Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Interferometry
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Optoelectronics
  • Remote Sensing
  • Spectroscopy
  • Ultrafast Optics
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Optical Technology

Diffraction and Gratings

  • Applied Optics Vol. 45, Iss. 32, pp. 8177–8185 (2006)
  • Jed Khoury, Bahareh Haji-saeed, Christian P. Morath, Charles L. Woods, Sandip K. Sengupta, and John Kierstead

  • Applied Optics Vol. 45, Iss. 32, pp. 8186–8193 (2006)
  • V. Beugin, L. Bigot, P. Niay, M. Lancry, Y. Quiquempois, M. Douay, G. Mélin, A. Fleureau, S. Lempereur, and L. Gasca

Fiber Optics and Optical Communications

  • Applied Optics Vol. 45, Iss. 32, pp. 8194–8196 (2006)
  • T. Abrahamyan, E. Janunts, and Kh. Nerkararyan

  • Applied Optics Vol. 45, Iss. 32, pp. 8197–8199 (2006)
  • G. Veshapidze, M. L. Trachy, M. H. Shah, and B. D. DePaola

Imaging Systems

  • Applied Optics Vol. 45, Iss. 32, pp. 8200–8208 (2006)
  • Mingying Ma, Xiangzhao Wang, and Fan Wang

  • Applied Optics Vol. 45, Iss. 32, pp. 8209–8217 (2006)
  • Frédéric Montfort, Tristan Colomb, Florian Charrière, Jonas Kühn, Pierre Marquet, Etienne Cuche, Sylvain Herminjard, and Christian Depeursinge

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 32, pp. 8218–8237 (2006)
  • Steven W. Brown, George P. Eppeldauer, and Keith R. Lykke

Interferometry

  • Applied Optics Vol. 45, Iss. 32, pp. 8238–8243 (2006)
  • Tae-Jung Ahn, Sucbei Moon, Soan Kim, Kyunghwan Oh, Dug Young Kim, Jens Kobelke, Kay Schuster, and Johnnes Kirchhof

  • Applied Optics Vol. 45, Iss. 32, pp. 8244–8252 (2006)
  • Evangelos Papastathopoulos, Klaus Körner, and Wolfgang Osten

Lasers and Laser Optics

  • Applied Optics Vol. 45, Iss. 32, pp. 8253–8261 (2006)
  • ZhiLin Xia, JianDa Shao, ZhengXiu Fan, and ShiGang Wu

Materials

  • Applied Optics Vol. 45, Iss. 32, pp. 8262–8272 (2006)
  • Marek Izdebski

Optical Design and Fabrication

  • Applied Optics Vol. 45, Iss. 32, pp. 8273–8277 (2006)
  • Chih-Chao Yang, Yun-Hsun Huang, Te-Chin Peng, Meng-Chyi Wu, Chong-Long Ho, Chao-Chi Hong, I-Ming Liu, and Yao-Tsong Tsai

  • Applied Optics Vol. 45, Iss. 32, pp. 8278–8287 (2006)
  • Cheng-Wei Chien, Jyh-Chen Chen, and Ju-Yi Lee

Optical Devices

  • Applied Optics Vol. 45, Iss. 32, pp. 8288–8297 (2006)
  • Peter Kurczynski, Harold M. Dyson, and Bernard Sadoulet

Optics at Surfaces

  • Applied Optics Vol. 45, Iss. 32, pp. 8298–8303 (2006)
  • Kevin Robbie, Yan Cui, Chelsea Elliott, and Kate Kaminska

Optoelectronics

  • Applied Optics Vol. 45, Iss. 32, pp. 8304–8307 (2006)
  • Wei-Ching Chuang, Chi-Ting Ho, and Wen-Chung Chang

Spectroscopy

  • Applied Optics Vol. 45, Iss. 32, pp. 8308–8314 (2006)
  • C. H. Chuang and Y. L. Lo

Information Processing

Fourier Optics and Optical Signal Processing

  • Applied Optics Vol. 45, Iss. 32, pp. 8315–8321 (2006)
  • Caijie Yan and Weimin Jin

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 32, pp. 8322–8330 (2006)
  • T. M. Niebauer, A. Schiel, and D. van Westrum

Lasers, Photonics, and Environmental Optics

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 32, pp. 8331–8337 (2006)
  • Daniel Daugeron, Jean-Baptiste Renard, Bertrand Gaubicher, Benoît Couté, Edith Hadamcik, François Gensdarmes, Guillaume Basso, and Corinne Fournier

Lasers and Laser Optics

  • Applied Optics Vol. 45, Iss. 32, pp. 8338–8345 (2006)
  • Yujin Chen, Xinghong Gong, Yanfu Lin, Qiguang Tan, Zundu Luo, and Yidong Huang

Remote Sensing

  • Applied Optics Vol. 45, Iss. 32, pp. 8346–8349 (2006)
  • Jyi-Lai Shen and Rainer Künnemeyer

Ultrafast Optics

  • Applied Optics Vol. 45, Iss. 32, pp. 8350–8353 (2006)
  • Zenghu Chang

  • Applied Optics Vol. 45, Iss. 32, pp. 8354–8359 (2006)
  • Mateusz Plewicki, Fabian Weise, Stefan M. Weber, and Albrecht Lindinger

Biomedical Optics

Medical Optics and Biotechnology

  • Applied Optics Vol. 45, Iss. 32, pp. 8360–8365 (2006)
  • Xiaoping Liang, Qizhi Zhang, and Huabei Jiang

  • Applied Optics Vol. 45, Iss. 32, pp. 8366–8373 (2006)
  • Jianwei Qin and Renfu Lu

  • Applied Optics Vol. 45, Iss. 32, pp. 8374–8380 (2006)
  • Sangjoon Hahn and Gilwon Yoon
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