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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 4 — Feb. 1, 2006
  • pp: 597–808

Optics InfoBase > Applied Optics > Volume 45 > Issue 4 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Diffraction and Gratings
  • Instrumentation, Measurement, and Metrology
  • Interferometry
  • Machine Vision
  • Nonlinear Optics
  • Optical Devices
  • Optics at Surfaces
  • Optoelectronics
  • Remote Sensing
  • Scattering
  • Spectroscopy
  • Thin Films
  • Vision, Color, and Visual Optics
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Optical Technology

Interferometry

  • Applied Optics Vol. 45, Iss. 4, pp. 597–604 (2006)
  • Julien Spronck, Silvania F. Pereira, and Joseph J. M. Braat

  • Applied Optics Vol. 45, Iss. 4, pp. 605–610 (2006)
  • Jie Zhang, Koichi Iwata, Atsushi Shibuya, Hisao Kikuta, and Choong Sik Park

Optical Devices

  • Applied Optics Vol. 45, Iss. 4, pp. 611–618 (2006)
  • Zhixiong Guo, Haiyong Quan, and Stanley Pau

  • Applied Optics Vol. 45, Iss. 4, pp. 619–625 (2006)
  • Piotr Mrozek, Ewa Mrozek, and Tadeusz Lukaszewicz

Optics at Surfaces

  • Applied Optics Vol. 45, Iss. 4, pp. 626–632 (2006)
  • Mary Carmen Peña-Gomar, Francisco Castillo, Augusto García-Valenzuela, Rubén G. Barrera, and Elías Pérez

Scattering

  • Applied Optics Vol. 45, Iss. 4, pp. 633–638 (2006)
  • Zhigang Chen, Xu Li, Allen Taflove, and Vadim Backman

  • Applied Optics Vol. 45, Iss. 4, pp. 639–647 (2006)
  • Ioan Turcu

Spectroscopy

  • Applied Optics Vol. 45, Iss. 4, pp. 648–652 (2006)
  • Xinlong Xu, Xiumin Wang, and Li Wang

Thin Films

  • Applied Optics Vol. 45, Iss. 4, pp. 653–661 (2006)
  • Kang Fu, Pei-feng Hsu, and Zhuomin M. Zhang

  • Applied Optics Vol. 45, Iss. 4, pp. 662–667 (2006)
  • Matthias Gruber, Thomas Seiler, and An-Chi Wei

Vision, Color, and Visual Optics

  • Applied Optics Vol. 45, Iss. 4, pp. 668–677 (2006)
  • Fujian Ding, Yud-Ren Chen, Kuanglin Chao, and Diane E. Chan

Information Processing

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 4, pp. 678–687 (2006)
  • Yingsong Hu, Jiangtao Xi, Enbang Li, Joe Chicharo, and Zongkai Yang

Machine Vision

  • Applied Optics Vol. 45, Iss. 4, pp. 688–696 (2006)
  • Chin-Hung Teng, Yung-Sheng Chen, and Wen-Hsing Hsu

Lasers, Photonics, and Environmental Optics

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 45, Iss. 4, pp. 697–704 (2006)
  • Jed Khoury, Charles L. Woods, Joseph Lorenzo, John Kierstead, Dana Pyburn, and Sandip K. Sengupta

  • Applied Optics Vol. 45, Iss. 4, pp. 705–715 (2006)
  • C. R. Vogel and Q. Yang

  • Applied Optics Vol. 45, Iss. 4, pp. 716–727 (2006)
  • Massimo Carlotti, Gabriele Brizzi, Enzo Papandrea, Marco Prevedelli, Marco Ridolfi, Bianca Maria Dinelli, and Luca Magnani

Diffraction and Gratings

  • Applied Optics Vol. 45, Iss. 4, pp. 728–735 (2006)
  • Xavier Chapeleau, Dominique Leduc, Cyril Lupi, Francisco López-Gejo, Marc Douay, Roger Le Ny, and Christian Boisrobert

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 4, pp. 736–743 (2006)
  • Arthur H. Carrieri and Erik S. Roese

  • Applied Optics Vol. 45, Iss. 4, pp. 744–747 (2006)
  • Fredrik Vestin, Mikael Afzelius, and Per-Erik Bengtsson

Nonlinear Optics

  • Applied Optics Vol. 45, Iss. 4, pp. 748–755 (2006)
  • Rashid A. Ganeev, Masayuki Suzuki, Motoyoshi Baba, Hiroto Kuroda, and Ilia A. Kulagin

Optical Devices

  • Applied Optics Vol. 45, Iss. 4, pp. 756–763 (2006)
  • Piotr Mrozek, Ewa Mrozek, and Tadeusz Lukaszewicz

Optoelectronics

  • Applied Optics Vol. 45, Iss. 4, pp. 764–769 (2006)
  • K. Geetha, M. Rajesh, V. P. N. Nampoori, C. P. G. Vallabhan, and P. Radhakrishnan

Remote Sensing

  • Applied Optics Vol. 45, Iss. 4, pp. 770–783 (2006)
  • Manfred Wendisch, Detlef Müller, Ina Mattis, and Albert Ansmann

  • Applied Optics Vol. 45, Iss. 4, pp. 784–798 (2006)
  • Bruno Pelletier and Robert Frouin

  • Applied Optics Vol. 45, Iss. 4, pp. 799–808 (2006)
  • Dennis F. Flanigan, Alan C. Samuels, Changjiang Zhu, and Francis D'Amico
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