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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 6 — Feb. 20, 2006
  • pp: 1093–1288

Optics InfoBase > Applied Optics > Volume 45 > Issue 6 > Table of Contents

Topics in this Issue

 
  • Detectors
  • Diffraction and Gratings
  • Ellipsometry and Polarimetry
  • Errata
  • Image Processing
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Medical Optics and Biotechnology
  • Microscopy
  • Optical Data Storage
  • Optical Design and Fabrication
  • Optics at Surfaces
  • Physical Optics
  • Scattering
  • Spectroscopy
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Optical Technology and Biomedical Optics

Detectors

  • Applied Optics Vol. 45, Iss. 6, pp. 1093–1097 (2006)
  • E. Theocharous, R. Deshpande, A. C. Dillon, and J. Lehman

  • Applied Optics Vol. 45, Iss. 6, pp. 1098–1101 (2006)
  • Igor Vayshenker, Shao Yang, and Ralph Swafford

Diffraction and Gratings

  • Applied Optics Vol. 45, Iss. 6, pp. 1102–1110 (2006)
  • Fabin Shen and Anbo Wang

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 6, pp. 1111–1119 (2006)
  • Yuqin Zong, Steven W. Brown, B. Carol Johnson, Keith R. Lykke, and Yoshi Ohno

  • Applied Optics Vol. 45, Iss. 6, pp. 1120–1123 (2006)
  • Petre C. Logofatu, Dan Apostol, Victor Damian, Iuliana M. Iordache, Mihaela M. Bojan, and Raluca Müller

  • Applied Optics Vol. 45, Iss. 6, pp. 1124–1133 (2006)
  • Changwoon Han and Bongtae Han

Ellipsometry and Polarimetry

  • Applied Optics Vol. 45, Iss. 6, pp. 1134–1141 (2006)
  • Yu-Tsan Jeng and Yu-Lung Lo

Medical Optics and Biotechnology

  • Applied Optics Vol. 45, Iss. 6, pp. 1142–1147 (2006)
  • Shuichi Makita, Yoshiaki Yasuno, Takashi Endo, Masahide Itoh, and Toyohiko Yatagai

Microscopy

  • Applied Optics Vol. 45, Iss. 6, pp. 1148–1152 (2006)
  • C. Wang, P. Shumyatsky, F. Zeng, M. Zevallos, and R. R. Alfano

Optical Design and Fabrication

  • Applied Optics Vol. 45, Iss. 6, pp. 1153–1161 (2006)
  • K. J. Moh, X.-C. Yuan, W. C. Cheong, L. S. Zhang, J. Lin, B. P. S. Ahluwalia, and H. Wang

Physical Optics

  • Applied Optics Vol. 45, Iss. 6, pp. 1162–1168 (2006)
  • Chun Ye

  • Applied Optics Vol. 45, Iss. 6, pp. 1169–1176 (2006)
  • Anne H. Webster, Michele A. Mossman, and Lorne A. Whitehead

Spectroscopy

  • Applied Optics Vol. 45, Iss. 6, pp. 1177–1186 (2006)
  • Mikael Afzelius, Per-Erik Bengtsson, Joakim Bood, Christian Brackmann, and Alfred Kurtz

Information Processing

Diffraction and Gratings

  • Applied Optics Vol. 45, Iss. 6, pp. 1187–1192 (2006)
  • Jeffrey A. Davis, Sean P. Sigarlaki, Julia M. Craven, and María Luisa Calvo

Image Processing

  • Applied Optics Vol. 45, Iss. 6, pp. 1193–1202 (2006)
  • Lu-Zhong Cai, Qing Liu, Yu-Rong Wang, Xiang-Feng Meng, and Ming-Zhao He

  • Applied Optics Vol. 45, Iss. 6, pp. 1203–1214 (2006)
  • Jiazheng Shi, Stephen E. Reichenbach, and James D. Howe

Optical Data Storage

  • Applied Optics Vol. 45, Iss. 6, pp. 1215–1218 (2006)
  • Tobias Kresse

Scattering

  • Applied Optics Vol. 45, Iss. 6, pp. 1219–1224 (2006)
  • Stefan P. Hau-Riege

Spectroscopy

  • Applied Optics Vol. 45, Iss. 6, pp. 1225–1235 (2006)
  • Rodolphe Jaffiol, Yoann Blancquaert, Antoine Delon, and Jacques Derouard

Lasers, Photonics, and Environmental Optics

Integrated Optics

  • Applied Optics Vol. 45, Iss. 6, pp. 1236–1243 (2006)
  • Jose M. Castro, David F. Geraghty, Seppo Honkanen, Christoph M. Greiner, Dmitri Iazikov, and Thomas W. Mossberg

Optics at Surfaces

  • Applied Optics Vol. 45, Iss. 6, pp. 1244–1248 (2006)
  • Ding Rong Ou, Jing Zhu, Jia Hao Zhao, Ruo Jian Zhu, and Jia Wang

  • Applied Optics Vol. 45, Iss. 6, pp. 1249–1253 (2006)
  • Ding Rong Ou, Jing Zhu, and Jia Hao Zhao

Physical Optics

  • Applied Optics Vol. 45, Iss. 6, pp. 1254–1259 (2006)
  • Yugo Kanaya and Hajime Akimoto

Scattering

  • Applied Optics Vol. 45, Iss. 6, pp. 1260–1270 (2006)
  • Renxian Li, Xiang'e Han, Huifen Jiang, and Kuan Fang Ren

Spectroscopy

  • Applied Optics Vol. 45, Iss. 6, pp. 1271–1274 (2006)
  • Andrei Stalmashonak, Nickolai Zhavoronkov, Ingolf Volker Hertel, Sergei Vetrov, and Karl Schmid

  • Applied Optics Vol. 45, Iss. 6, pp. 1275–1287 (2006)
  • Chuan Peng, Han Q. Le, Rui Q. Yang, and Cory J. Hill

Errata

  • Applied Optics Vol. 45, Iss. 6, pp. 1288–1288 (2006)
  • Gang Yao and Lihong V. Wang
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