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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 8 — Mar. 10, 2006
  • pp: 1669–1874

Optics InfoBase > Applied Optics > Volume 45 > Issue 8 > Table of Contents

Topics in this Issue

 
  • Detectors
  • Diffraction and Gratings
  • Ellipsometry and Polarimetry
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Optical Data Storage
  • Optical Design and Fabrication
  • Optical Devices
  • Other Areas of Optics
  • Remote Sensing
  • Scattering
  • Thin Films
  • Ultrafast Optics
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Optical Technology

Diffraction and Gratings

  • Applied Optics Vol. 45, Iss. 8, pp. 1669–1675 (2006)
  • Kevin H. Smith, Benjamin L. Ipson, Tyson L. Lowder, Aaron R. Hawkins, Richard H. Selfridge, and Stephen M. Schultz

  • Applied Optics Vol. 45, Iss. 8, pp. 1676–1679 (2006)
  • Michael P. Kowalski, Ralf K. Heilmann, Mark L. Schattenburg, Chih-Hao Chang, Frederick B. Berendse, and William R. Hunter

  • Applied Optics Vol. 45, Iss. 8, pp. 1680–1687 (2006)
  • J. F. Seely, L. I. Goray, Benjawan Kjornrattanawanich, J. M. Laming, G. E. Holland, K. A. Flanagan, R. K. Heilmann, C.-H. Chang, M. L. Schattenburg, and A. P. Rasmussen

Ellipsometry and Polarimetry

  • Applied Optics Vol. 45, Iss. 8, pp. 1688–1703 (2006)
  • Justin E. Wolfe and Russell A. Chipman

Imaging Systems

  • Applied Optics Vol. 45, Iss. 8, pp. 1704–1712 (2006)
  • Jun Arai, Makoto Okui, Takayuki Yamashita, and Fumio Okano

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 45, Iss. 8, pp. 1713–1720 (2006)
  • Yoichi Ohmura, Toru Oka, Toshiro Nakashima, and Kazuhiro Hane

  • Applied Optics Vol. 45, Iss. 8, pp. 1721–1724 (2006)
  • Simon G. Kaplan and John H. Burnett

  • Applied Optics Vol. 45, Iss. 8, pp. 1725–1729 (2006)
  • Marco Pisani and Milena Astrua

Materials

  • Applied Optics Vol. 45, Iss. 8, pp. 1730–1736 (2006)
  • Kristine Rosfjord, Chang Chang, Ryan Miyakawa, Holly Barth, and David Attwood

Optical Devices

  • Applied Optics Vol. 45, Iss. 8, pp. 1737–1742 (2006)
  • Anish Saran, Don C. Abeysinghe, and Joseph T. Boyd

  • Applied Optics Vol. 45, Iss. 8, pp. 1743–1755 (2006)
  • Guangyu Li, Kim A. Winick, Henry C. Griffin, and Joseph S. Hayden

Scattering

  • Applied Optics Vol. 45, Iss. 8, pp. 1756–1764 (2006)
  • Pavel Zakharov, Suresh Bhat, Peter Schurtenberger, and Frank Scheffold

Thin Films

  • Applied Optics Vol. 45, Iss. 8, pp. 1765–1772 (2006)
  • Benjawan Kjornrattanawanich, David L. Windt, John F. Seely, and Yurii A. Uspenskii

Information Processing

Detectors

  • Applied Optics Vol. 45, Iss. 8, pp. 1773–1776 (2006)
  • Chunyuan Zhou, Guang Wu, and Heping Zeng

Optical Design and Fabrication

  • Applied Optics Vol. 45, Iss. 8, pp. 1777–1784 (2006)
  • Chia-Ho Tsai, Uriel Levy, Lin Pang, and Yeshaiahu Fainman

Optical Devices

  • Applied Optics Vol. 45, Iss. 8, pp. 1785–1793 (2006)
  • Chubing Peng, Christophe Mihalcea, Kalman Pelhos, and William A. Challener

Optical Data Storage

  • Applied Optics Vol. 45, Iss. 8, pp. 1794–1803 (2006)
  • Isao Ichimura, Kimihiro Saito, Takeshi Yamasaki, and Kiyoshi Osato

Lasers, Photonics, and Environmental Optics

Diffraction and Gratings

  • Applied Optics Vol. 45, Iss. 8, pp. 1804–1811 (2006)
  • D. R. Mason, S. J. Goodman, D. K. Gramotnev, and T. A. Nieminen

Lasers and Laser Optics

  • Applied Optics Vol. 45, Iss. 8, pp. 1812–1819 (2006)
  • Karen C. Vermeulen, Gijs J. L. Wuite, Ger J. M. Stienen, and Christoph F. Schmidt

  • Applied Optics Vol. 45, Iss. 8, pp. 1820–1824 (2006)
  • Sung-Jae An, Joongwoo Bae, Vladimir G. Minogin, and O'Dae Kwon

  • Applied Optics Vol. 45, Iss. 8, pp. 1825–1830 (2006)
  • Guiqiu Li, Shengzhi Zhao, Kejian Yang, and Dechun Li

Other Areas of Optics

  • Applied Optics Vol. 45, Iss. 8, pp. 1831–1838 (2006)
  • Dirk Michaelis, Christoph Wächter, Sven Burger, Lin Zschiedrich, and Andreas Bräuer

Remote Sensing

  • Applied Optics Vol. 45, Iss. 8, pp. 1839–1843 (2006)
  • Kevin S. Repasky, Joseph A. Shaw, Ryan Scheppele, Christopher Melton, John L. Carsten, and Lee H. Spangler

Scattering

  • Applied Optics Vol. 45, Iss. 8, pp. 1844–1856 (2006)
  • Hadas Mamane, Joel J. Ducoste, and Karl G. Linden

Ultrafast Optics

  • Applied Optics Vol. 45, Iss. 8, pp. 1857–1860 (2006)
  • N. Amer, W. C. Hurlbut, B. J. Norton, Yun-Shik Lee, S. L. Etringer, and B. K. Paul

Biomedical Optics

Medical Optics and Biotechnology

  • Applied Optics Vol. 45, Iss. 8, pp. 1861–1865 (2006)
  • Yoshiaki Yasuno, Shuichi Makita, Takashi Endo, Gouki Aoki, Masahide Itoh, and Toyohiko Yatagai

  • Applied Optics Vol. 45, Iss. 8, pp. 1866–1875 (2006)
  • Benjamin T. Cox, Simon R. Arridge, Kornel P. Köstli, and Paul C. Beard
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