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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 1 — Jan. 1, 2008
  • pp: 1–98

Optics InfoBase > Applied Optics > Volume 47 > Issue 1 > Table of Contents

Topics in this Issue

 
  • Diffraction and Gratings
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Interferometry
  • Materials
  • Microscopy
  • Optical Data Storage
  • Optoelectronics
  • Remote Sensing and Sensors
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Optical Technology

Diffraction and Gratings

  • Applied Optics Vol. 47, Iss. 1, pp. 45–51 (2008)
  • Weiqing Pan

Imaging Systems

  • Applied Optics Vol. 47, Iss. 1, pp. 25–29 (2008)
  • S. Madhusudana Rao

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 47, Iss. 1, pp. 72–78 (2008)
  • Yew Li Hor, John F. Federici, and Robert L. Wample

Interferometry

  • Applied Optics Vol. 47, Iss. 1, pp. 1–8 (2008)
  • Eva-Lena Johansson, Lars Benckert, and Mikael Sjödahl

Microscopy

  • Applied Optics Vol. 47, Iss. 1, pp. 15–24 (2008)
  • Sri Rama Prasanna Pavani, Ariel R. Libertun, Sharon V. King, and Carol J. Cogswell

Remote Sensing and Sensors

  • Applied Optics Vol. 47, Iss. 1, pp. 79–87 (2008)
  • Visa Korkiakoski, Christophe Vérinaud, and Miska Le Louarn

Information Processing

Imaging Systems

  • Applied Optics Vol. 47, Iss. 1, pp. 56–63 (2008)
  • Christopher N. Anderson and Patrick P. Naulleau

Optical Data Storage

  • Applied Optics Vol. 47, Iss. 1, pp. 9–14 (2008)
  • Ilya Sh. Steinberg and Yuri A. Shepetkin

  • Applied Optics Vol. 47, Iss. 1, pp. 93–98 (2008)
  • Xu Pan, Changshun Wang, Chuanyu Wang, and Xiaoqiang Zhang

Laser, Photonics, and Environmental Optics

Integrated Optics

  • Applied Optics Vol. 47, Iss. 1, pp. 30–37 (2008)
  • Nakeeran Ponnampalam and Ray G. DeCorby

  • Applied Optics Vol. 47, Iss. 1, pp. 38–44 (2008)
  • Daoxin Dai and Sailing He

Materials

  • Applied Optics Vol. 47, Iss. 1, pp. 52–55 (2008)
  • I. Yu. Martynyuk-Lototska, O. G. Mys, A. A. Grabar, I. M. Stoika, Yu. M. Vysochanskii, and R. O. Vlokh

Optoelectronics

  • Applied Optics Vol. 47, Iss. 1, pp. 88–92 (2008)
  • Hisashi Masui, Shuji Nakamura, and Steven P. DenBaars

Remote Sensing and Sensors

  • Applied Optics Vol. 47, Iss. 1, pp. 64–71 (2008)
  • Naibo Jiang, Walter R. Lempert, Gary L. Switzer, Terrence R. Meyer, and James R. Gord
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