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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 17 — Jun. 10, 2008
  • pp: 3080–3220

Optics InfoBase > Applied Optics > Volume 47 > Issue 17 > Table of Contents

Topics in this Issue

 
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Physical Optics
  • Remote Sensing and Sensors
  • Scattering
  • Thin Films
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Optical Technology

Fiber Optics and Optical Communications

  • Applied Optics Vol. 47, Iss. 17, pp. 3092–3099 (2008)
  • G. Srikanth

Image Processing

  • Applied Optics Vol. 47, Iss. 17, pp. 3158–3167 (2008)
  • Y. Y. Hung, Y. H. Huang, L. Liu, S. P. Ng, and Y. S. Chen

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 47, Iss. 17, pp. 3134–3142 (2008)
  • Song Zhang and Shing-Tung Yau

Optical Design and Fabrication

  • Applied Optics Vol. 47, Iss. 17, pp. 3177–3184 (2008)
  • Zhou Zhou and Sing H. Lee

Optical Devices

  • Applied Optics Vol. 47, Iss. 17, pp. 3100–3108 (2008)
  • Li Ding, Richard I. Blackwell, Jay F. Künzler, and Wayne H. Knox

Physical Optics

  • Applied Optics Vol. 47, Iss. 17, pp. 3211–3215 (2008)
  • R. M. A. Azzam and A. Alsamman

Remote Sensing and Sensors

  • Applied Optics Vol. 47, Iss. 17, pp. 3114–3123 (2008)
  • Neng-Chung Hu and Chin-Chuan Wu

Scattering

  • Applied Optics Vol. 47, Iss. 17, pp. 3216–3220 (2008)
  • Mangalpady R. Shenoy and Bishnu P. Pal

Thin Films

  • Applied Optics Vol. 47, Iss. 17, pp. 3109–3113 (2008)
  • Tatiana V. Amotchkina

Information Processing

Holography

  • Applied Optics Vol. 47, Iss. 17, pp. 3203–3210 (2008)
  • Alexander Khmaladze, Alejandro Restrepo-Martínez, Myung Kim, Roman Castañeda, and Astrid Blandón

Image Processing

  • Applied Optics Vol. 47, Iss. 17, pp. 3080–3087 (2008)
  • Javier García, Vicente Micó, Dan Cojoc, and Zeev Zalevsky

Integrated Optics

  • Applied Optics Vol. 47, Iss. 17, pp. 3185–3195 (2008)
  • Issa Panahi and Govind Kannan

Lasers, Photonics, and Environmental Optics

Fiber Optics and Optical Communications

  • Applied Optics Vol. 47, Iss. 17, pp. 3168–3176 (2008)
  • Binbin Wu, Zeinab Hajjarian, and Mohsen Kavehrad

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 47, Iss. 17, pp. 3143–3151 (2008)
  • J. Zhang, Z. H. Lu, and L. J. Wang

Lasers and Laser Optics

  • Applied Optics Vol. 47, Iss. 17, pp. 3124–3128 (2008)
  • Oleg V. Palashov, Eugeny V. Katin, Grigory A. Luchinin, and Efim A. Khazanov

  • Applied Optics Vol. 47, Iss. 17, pp. 3129–3133 (2008)
  • Marc Eichhorn

  • Applied Optics Vol. 47, Iss. 17, pp. 3196–3202 (2008)
  • Astrid van der Horst, Peter D. J. van Oostrum, Alexander Moroz, Alfons van Blaaderen, and Marileen Dogterom

Scattering

  • Applied Optics Vol. 47, Iss. 17, pp. 3088–3091 (2008)
  • M. R. Shirazi, M. Biglary, S. W. Harun, K. Thambiratnam, and H. Ahmad

Biomedical Optics

Fiber Optics and Optical Communications

  • Applied Optics Vol. 47, Iss. 17, pp. 3152–3157 (2008)
  • Franck Jaillon, Wei Zheng, and Zhiwei Huang
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For a single-projector, multiple-camera 3D shape measurement system, through absolute phase, 3D data acquired by different cameras can be precisely registered. This figure shows an experimental result: (a)--(b) show two 3D geometries acquired by two cameras viewing from different angles; (c) shows these original 3D geometries rendered in the same scene. They are far apart before registration. After registration, they are close to each other, as shown in (d)--(f). This paper addressed a method that could achieve a registration error of approximately 2.3 times the measurement error. For details, see pp. 3134-3142.

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