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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 19 — Jul. 1, 2008
  • pp: DH1; D1–D189
  • Feat. pp: DH1; D1–D189

Optics InfoBase > Applied Optics > Volume 47 > Issue 19 > Table of Contents

Topics in this Issue

 
  • Atmospheric and oceanic optics
  • Detectors
  • Fiber Optics and Optical Communications
  • Fourier optics and signal processing
  • Holography
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Materials
  • Optical Design and Fabrication
  • Optical Devices
  • Thin Films
  • Wave-front Sensing
  • X-ray Optics
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DIGITAL HOLOGRAPHY

Introduction

  • Applied Optics Vol. 47, Iss. 19, pp. DH1–DH1 (2008)
  • Ting-Chung Poon, Byoungho Lee, Hiroshi Yoshikawa, and Wolfgang Osten

Information Processing

  • Applied Optics Vol. 47, Iss. 19, pp. D1–D5 (2008)
  • Nils H. Abramson

  • Applied Optics Vol. 47, Iss. 19, pp. D6–D11 (2008)
  • Yasuhiro Takaki and Yuki Hayashi

  • Applied Optics Vol. 47, Iss. 19, pp. D12–D20 (2008)
  • Dayong Wang, Jie Zhao, Fucai Zhang, Giancarlo Pedrini, and Wolfgang Osten

  • Applied Optics Vol. 47, Iss. 19, pp. D21–D27 (2008)
  • Natan T. Shaked and Joseph Rosen

  • Applied Optics Vol. 47, Iss. 19, pp. D28–D37 (2008)
  • Nicholas Sgouros, Ioannis Kontaxakis, and Manolis Sangriotis

  • Applied Optics Vol. 47, Iss. 19, pp. D38–D43 (2008)
  • Takanori Nomura, Mitsukiyo Okamura, Eiji Nitanai, and Takuhisa Numata

  • Applied Optics Vol. 47, Iss. 19, pp. D44–D54 (2008)
  • Hoonjong Kang, Takeshi Yamaguchi, and Hiroshi Yoshikawa

  • Applied Optics Vol. 47, Iss. 19, pp. D55–D62 (2008)
  • Seung-Cheol Kim and Eun-Soo Kim

  • Applied Optics Vol. 47, Iss. 19, pp. D71–D79 (2008)
  • Conor P. McElhinney, Bryan M. Hennelly, and Thomas J. Naughton

  • Applied Optics Vol. 47, Iss. 19, pp. D80–D86 (2008)
  • Joohwan Kim, Sung-Wook Min, Youngmin Kim, and Byoungho Lee

  • Applied Optics Vol. 47, Iss. 19, pp. D87–D95 (2008)
  • Joonku Hahn, Hwi Kim, and Byoungho Lee

  • Applied Optics Vol. 47, Iss. 19, pp. D96–D109 (2008)
  • Remy Tumbar

  • Applied Optics Vol. 47, Iss. 19, pp. D128–D135 (2008)
  • Dong-Choon Hwang, Dong-Hak Shin, Seung-Cheol Kim, and Eun-Soo Kim

  • Applied Optics Vol. 47, Iss. 19, pp. D144–D153 (2008)
  • Mark L. Tachiki, Masahide Itoh, and Toyohiko Yatagai

  • Applied Optics Vol. 47, Iss. 19, pp. D154–D163 (2008)
  • Zeev Zalevsky, Ofer Margalit, Emanuel Vexberg, Roy Pearl, and Javier Garcia

  • Applied Optics Vol. 47, Iss. 19, pp. D164–D175 (2008)
  • Hwi Kim, Sung-Wook Min, Byoungho Lee, and Ting-Chung Poon

  • Applied Optics Vol. 47, Iss. 19, pp. D176–D182 (2008)
  • Patrik Langehanenberg, Björn Kemper, Dieter Dirksen, and Gert von Bally

  • Applied Optics Vol. 47, Iss. 19, pp. D183–D189 (2008)
  • Yasuhiro Awatsuji, Tatsuki Tahara, Atsushi Kaneko, Takamasa Koyama, Kenzo Nishio, Shogo Ura, Toshihiro Kubota, and Osamu Matoba

Holography

  • Applied Optics Vol. 47, Iss. 19, pp. D63–D70 (2008)
  • Takeshi Yamaguchi, Tomohiko Fujii, and Hiroshi Yoshikawa

  • Applied Optics Vol. 47, Iss. 19, pp. D110–D116 (2008)
  • Kyoji Matsushima

  • Applied Optics Vol. 47, Iss. 19, pp. D117–D127 (2008)
  • Hwi Kim, Joonku Hahn, and Byoungho Lee

  • Applied Optics Vol. 47, Iss. 19, pp. D136–D143 (2008)
  • Tatsuya Nakatsuji and Kyoji Matsushima

REGULAR PAPERS

Optical Technology

Detectors

  • Applied Optics Vol. 47, Iss. 19, pp. 3463–3466 (2008)
  • Zhao-Fei Zhou and Yu-hua Cheng

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 47, Iss. 19, pp. 3524–3529 (2008)
  • Zefeng Wang, Yongming Hu, Zhou Meng, and Ming Ni

Integrated Optics

  • Applied Optics Vol. 47, Iss. 19, pp. 3500–3512 (2008)
  • Roberto Barbieri, Philippe Benabes, Thomas Bierhoff, Josh J. Caswell, Alain Gauthier, Jürgen Jahns, Manfred Jarczynski, Paul Lukowicz, Jacques Oksman, Gordon A. Russell, Jürgen Schrage, John F. Snowdon, Oliver Stübbe, Gerhard Troster, and Marco Wirz

Optical Design and Fabrication

  • Applied Optics Vol. 47, Iss. 19, pp. 3406–3414 (2008)
  • Jui-Wen Pan, Sheng-Han Tu, Chih-Ming Wang, and Jenq-Yang Chang

Optical Devices

  • Applied Optics Vol. 47, Iss. 19, pp. 3423–3432 (2008)
  • Neng-Chung Hu, Chin-Chuan Wu, Shih-Feng Chen, and Horng-Ching Hsiao

Thin Films

  • Applied Optics Vol. 47, Iss. 19, pp. 3455–3462 (2008)
  • Nicolas Benoit, Sven Schröder, Sergiy Yulin, Torsten Feigl, Angela Duparré, Norbert Kaiser, and Andreas Tünnermann

X-ray Optics

  • Applied Optics Vol. 47, Iss. 19, pp. 3513–3523 (2008)
  • Immacolata Donnarumma, Luigi Pacciani, Igor Lapshov, and Yuri Evangelista

Information Processing

Fourier optics and signal processing

  • Applied Optics Vol. 47, Iss. 19, pp. 3481–3493 (2008)
  • Vladimir Katkovnik, Jaakko Astola, and Karen Egiazarian

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 47, Iss. 19, pp. 3535–3542 (2008)
  • Jérôme Molimard, Raul Cordero, and Alain Vautrin

Wave-front Sensing

  • Applied Optics Vol. 47, Iss. 19, pp. 3433–3445 (2008)
  • Guang-ming Dai and Virendra N. Mahajan

Lasers, Photonics, and Environmental Optics

Atmospheric and oceanic optics

  • Applied Optics Vol. 47, Iss. 19, pp. 3467–3480 (2008)
  • Eyk Boesche, Piet Stammes, Réne Preusker, Ralf Bennartz, Wouter Knap, and Juergen Fischer

Fiber Optics and Optical Communications

  • Applied Optics Vol. 47, Iss. 19, pp. 3530–3534 (2008)
  • Hairun Guo, Fufei Pang, Xianglong Zeng, Na Chen, Zhenyi Chen, and Tingyun Wang

Lasers and Laser Optics

  • Applied Optics Vol. 47, Iss. 19, pp. 3415–3422 (2008)
  • Eldar Musa

  • Applied Optics Vol. 47, Iss. 19, pp. 3494–3499 (2008)
  • G. M. Heestand, C. A. Haynam, P. J. Wegner, M. W. Bowers, S. N. Dixit, G. V. Erbert, M. A. Henesian, M. R. Hermann, K. S. Jancaitis, K. Knittel, T. Kohut, J. D. Lindl, K. R. Manes, C. D. Marshall, N. C. Mehta, J. Menapace, E. Moses, J. R. Murray, M. C. Nostrand, C. D. Orth, R. Patterson, R. A. Sacks, R. Saunders, M. J. Shaw, M. Spaeth, S. B. Sutton, W. H. Williams, C. C. Widmayer, R. K. White, P. K. Whitman, S. T. Yang, and B. M. Van Wonterghem

Materials

  • Applied Optics Vol. 47, Iss. 19, pp. 3446–3454 (2008)
  • Irina Martynyuk-Lototska, Oksana Mys, Taras Dudok, Volodymyr Adamiv, Yevgen Smirnov, and Rostyslav Vlokh
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