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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 29 — Oct. 10, 2008
  • pp: 5235–5549

Optics InfoBase > Applied Optics > Volume 47 > Issue 29 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Coherence and Statistical Optics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Medical Optics and Biotechnology
  • Microscopy
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Optoelectronics
  • Physical Optics
  • Remote Sensing and Sensors
  • Spectroscopy
  • Thin Films
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Optical Technology

  • Applied Optics Vol. 47, Iss. 29, pp. 5354–5357 (2008)
  • Haim Abitan, Henrik Bohr, and Preben Buchhave

Coherence and Statistical Optics

  • Applied Optics Vol. 47, Iss. 29, pp. 5492–5499 (2008)
  • Oleg V. Angelsky, Sergij B. Yermolenko, Claudia Yu. Zenkova, and Alla O. Angelskaya

Detectors

  • Applied Optics Vol. 47, Iss. 29, pp. 5541–5549 (2008)
  • Luis Arias, Sergio Torres, Daniel Sbarbaro, and Oscar Farias

Fiber Optics and Optical Communications

  • Applied Optics Vol. 47, Iss. 29, pp. 5296–5304 (2008)
  • Yanjun Li, Tao Wei, John A. Montoya, Sandeep V. Saini, Xinwei Lan, Xiling Tang, Junhang Dong, and Hai Xiao

Image Processing

  • Applied Optics Vol. 47, Iss. 29, pp. 5394–5399 (2008)
  • Sebastián E. Godoy, Jorge E. Pezoa, and Sergio N. Torres

  • Applied Optics Vol. 47, Iss. 29, pp. 5400–5407 (2008)
  • Shien Ri, Motoharu Fujigaki, and Yoshiharu Morimoto

  • Applied Optics Vol. 47, Iss. 29, pp. 5500–5518 (2008)
  • Edwin Román-Hernández and Gilberto Silva-Ortigoza

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 47, Iss. 29, pp. 5454–5467 (2008)
  • Frédéric B. Leloup, Stefaan Forment, Philip Dutré, Michael R. Pointer, and Peter Hanselaer

  • Applied Optics Vol. 47, Iss. 29, pp. 5473–5491 (2008)
  • Rainer Wilhelm, Bruno Luong, Alain Courteville, Sébastien Estival, Frédéric Gonté, and Nicolas Schuhler

  • Applied Optics Vol. 47, Iss. 29, pp. 5527–5533 (2008)
  • Bing Pan, Huimin Xie, Jianxin Gao, and Anand Asundi

Microscopy

  • Applied Optics Vol. 47, Iss. 29, pp. 5442–5445 (2008)
  • Ming-Hung Chiu, Chih-Wen Lai, Chen-Tai Tan, and Chin-Fa Lai

Optical Design and Fabrication

  • Applied Optics Vol. 47, Iss. 29, pp. 5519–5526 (2008)
  • Zhengang Lu and Jiubin Tan

Optical Devices

  • Applied Optics Vol. 47, Iss. 29, pp. 5325–5329 (2008)
  • Kathleen A. Morse, Stuart L. McHugh, and Jeff Fixler

  • Applied Optics Vol. 47, Iss. 29, pp. 5370–5377 (2008)
  • Yonggang Wu, Hongfei Jiao, Donggong Peng, Zhenhua Wang, Lianxiao Fu, Gang Lu, Naibo Chen, and Leijie Ling

Optics at Surfaces

  • Applied Optics Vol. 47, Iss. 29, pp. 5429–5435 (2008)
  • Pierre Vernhes, Jean-Francis Bloch, Anne Blayo, and Bernard Pineaux

Optoelectronics

  • Applied Optics Vol. 47, Iss. 29, pp. 5468–5472 (2008)
  • Jed Khoury, Bahareh Haji-saeed, William D. Goodhue, Charles L. Woods, and John Kierstead

Physical Optics

  • Applied Optics Vol. 47, Iss. 29, pp. 5253–5260 (2008)
  • Juan I. Larruquert and Ritva A. M. Keski-Kuha

Spectroscopy

  • Applied Optics Vol. 47, Iss. 29, pp. 5390–5393 (2008)

Thin Films

  • Applied Optics Vol. 47, Iss. 29, pp. 5272–5280 (2008)
  • Jérémie Capoulade, Laurent Gallais, Jean-Yves Natoli, and Mireille Commandré

  • Applied Optics Vol. 47, Iss. 29, pp. 5330–5336 (2008)
  • J. Fekete, Z. Várallyay, and R. Szipocs

Information Processing

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 47, Iss. 29, pp. 5378–5389 (2008)
  • Colin N. Reinhardt, Sermsak Jaruwatanadilok, Yasuo Kuga, Akira Ishimaru, and James A. Ritcey

Holography

  • Applied Optics Vol. 47, Iss. 29, pp. 5305–5314 (2008)
  • Christophe Minetti, Natacha Callens, Gwennou Coupier, Thomas Podgorski, and Frank Dubois

Image Processing

  • Applied Optics Vol. 47, Iss. 29, pp. 5341–5347 (2008)
  • Vincent Nourrit, Juan M. Bueno, Brian Vohnsen, and Pablo Artal

  • Applied Optics Vol. 47, Iss. 29, pp. 5358–5369 (2008)
  • Jose Bioucas-Dias, Vladimir Katkovnik, Jaakko Astola, and Karen Egiazarian

  • Applied Optics Vol. 47, Iss. 29, pp. 5408–5419 (2008)
  • Qian Kemao, Haixia Wang, and Wenjing Gao

  • Applied Optics Vol. 47, Iss. 29, pp. 5420–5428 (2008)
  • Qian Kemao, Wenjing Gao, and Haixia Wang

  • Applied Optics Vol. 47, Iss. 29, pp. 5534–5540 (2008)
  • Guojing He, Jianqi Zhang, Delian Liu, and Honghua Chang

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 47, Iss. 29, pp. 5446–5453 (2008)
  • Jiancheng Xu, Qiao Xu, and Hansheng Peng

Lasers, Photonics, and Environmental Optics

Diffraction and Gratings

  • Applied Optics Vol. 47, Iss. 29, pp. 5315–5320 (2008)
  • Jan P. von Bassewitz, Ivan de Oliveira, and Jaime Frejlich

Fiber Optics and Optical Communications

  • Applied Optics Vol. 47, Iss. 29, pp. 5242–5252 (2008)
  • Mohammad Aleem Mirza and George Stewart

  • Applied Optics Vol. 47, Iss. 29, pp. 5321–5324 (2008)
  • Jiangbing Du, Yange Liu, Zhi Wang, Bing Zou, Bo Liu, and Xiaoyi Dong

Integrated Optics

  • Applied Optics Vol. 47, Iss. 29, pp. 5348–5353 (2008)
  • Samit Barai and Anurag Sharma

Lasers and Laser Optics

  • Applied Optics Vol. 47, Iss. 29, pp. 5436–5441 (2008)
  • Junhai Liu, Hongwei Yang, Huaijin Zhang, Jiyang Wang, and Valentin Petrov

Remote Sensing and Sensors

  • Applied Optics Vol. 47, Iss. 29, pp. 5281–5295 (2008)
  • Tamer F. Refaat, Syed Ismail, M. Nurul Abedin, Scott M. Spuler, Shane D. Mayor, and Upendra N. Singh

Spectroscopy

  • Applied Optics Vol. 47, Iss. 29, pp. 5235–5241 (2008)
  • Stephen G. Bosi, Jacqueline Hayes, Maryanne C. J. Large, and Leon Poladian

  • Applied Optics Vol. 47, Iss. 29, pp. 5337–5340 (2008)
  • Feng Xu, Zhe Lv, Xiutao Lou, Yungang Zhang, and Zhiguo Zhang

Biomedical Optics

Medical Optics and Biotechnology

  • Applied Optics Vol. 47, Iss. 29, pp. 5261–5271 (2008)
  • George Alexandrakis, Dharmendra Nadkar, Nimit L. Patel, Hanli Liu, and Edward H. Livingston
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