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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 4 — Feb. 1, 2009
  • pp: 658–809
  • Feat. pp: B1–B189

Optics InfoBase > Applied Optics > Volume 48 > Issue 4 > Table of Contents

Topics in this Issue

 
  • Diffraction and Gratings
  • Fiber Optics
  • Fiber Optics and Optical Communications
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optoelectronics
  • Remote Sensing and Sensors
  • Spectroscopy
  • Thin Films
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Laser Applications to Chemical, Security, and Environmental Analysis

  • Applied Optics Vol. 48, Iss. 4, pp. LACSEA1–LACSEA2 (2009)
  • Volker Ebert, Thomas B. Settersten, and Dennis K. Killinger

Combustion and Plasma Diagnostics

  • Applied Optics Vol. 48, Iss. 4, pp. B137–B144 (2009)
  • Jacob B. Schmidt, Zane D. Schaefer, Terrence R. Meyer, Sukesh Roy, Stephen A. Danczyk, and James R. Gord

  • Applied Optics Vol. 48, Iss. 4, pp. B94–B104 (2009)
  • Michael Cundy, Torsten Schucht, Olaf Thiele, and Volker Sick

  • Applied Optics Vol. 48, Iss. 4, pp. B57–B64 (2009)
  • Andreas Braeuer and Alfred Leipertz

  • Applied Optics Vol. 48, Iss. 4, pp. B65–B72 (2009)
  • Billy Kaldvee, Andreas Ehn, Joakim Bood, and Marcus Aldén

  • Applied Optics Vol. 48, Iss. 4, pp. B43–B50 (2009)
  • Markus C. Weikl, Yifang Cong, Thomas Seeger, and Alfred Leipertz

  • Applied Optics Vol. 48, Iss. 4, pp. B23–B31 (2009)
  • Naibo Jiang, Matthew C. Webster, and Walter R. Lempert

  • Applied Optics Vol. 48, Iss. 4, pp. B105–B110 (2009)
  • Yu Li, Changhong Hu, Hanzhuang Zhang, Zhankui Jiang, and Zhongshan Li

Laser-Based Chemical and Security Sensing

  • Applied Optics Vol. 48, Iss. 4, pp. B51–B56 (2009)
  • W. Zeller, M. Legge, J. Seufert, R. Werner, M. Fischer, and J. Koeth

  • Applied Optics Vol. 48, Iss. 4, pp. B80–B86 (2009)
  • Markus Germer and Marcus Wolff

  • Applied Optics Vol. 48, Iss. 4, pp. B87–B93 (2009)
  • Cosimo D'Andrea, Austin Nevin, Andrea Farina, Andrea Bassi, and Rinaldo Cubeddu

  • Applied Optics Vol. 48, Iss. 4, pp. B145–B150 (2009)
  • Avishekh Pal, C. Douglas Clark, Michael Sigman, and Dennis K. Killinger

Environmental and Medical Trace Analysis

  • Applied Optics Vol. 48, Iss. 4, pp. B172–B182 (2009)
  • Karl Wunderle, Steven Wagner, Igor Pasti, Roland Pieruschka, Uwe Rascher, Ulrich Schurr, and Volkert Ebert

  • Applied Optics Vol. 48, Iss. 4, pp. B159–B171 (2009)
  • Ravi M. Varma, Dean S. Venables, Albert A. Ruth, Uwe Heitmann, Eric Schlosser, and Sophie Dixneuf

  • Applied Optics Vol. 48, Iss. 4, pp. B32–B42 (2009)
  • Alexandra A. Hoops and Thomas A. Reichardt

  • Applied Optics Vol. 48, Iss. 4, pp. B8–B16 (2009)
  • Anna K. Jagodnicka, Tadeusz Stacewicz, Grzegorz Karasinski, Michal Posyniak, and Szymon P. Malinowski

  • Applied Optics Vol. 48, Iss. 4, pp. B111–B118 (2009)
  • Anali Makoui and Dennis K. Killinger

  • Applied Optics Vol. 48, Iss. 4, pp. B126–B136 (2009)
  • Vasanthi Sivaprakasam, Timothy Pletcher, John E. Tucker, Alan L. Huston, Joseph McGinn, David Keller, and Jay D. Eversole

  • Applied Optics Vol. 48, Iss. 4, pp. B151–B158 (2009)
  • András Székács, Nóra Adányi, Inna Székács, Krisztina Majer-Baranyi, and István Szendro

  • Applied Optics Vol. 48, Iss. 4, pp. B73–B79 (2009)
  • Krishnan R. Parameswaran, David I. Rosen, Mark G. Allen, Alan M. Ganz, and Terence H. Risby

Optical and Laser Spectroscopic Sensing Techniques

  • Applied Optics Vol. 48, Iss. 4, pp. B17–B22 (2009)
  • Haowen Li, D. Ahmasi Harris, Bingwei Xu, Paul J. Wrzesinski, Vadim V. Lozovoy, and Marcos Dantus

  • Applied Optics Vol. 48, Iss. 4, pp. B119–B125 (2009)
  • Andreas Pohlkötter, Ulrike Willer, Christoph Bauer, and Wolfgang Schade

  • Applied Optics Vol. 48, Iss. 4, pp. B1–B7 (2009)
  • Ove Steinvall

  • Applied Optics Vol. 48, Iss. 4, pp. B183–B189 (2009)
  • Sandra Börner, Rozalia Orghici, Siegfried R. Waldvogel, Ulrike Willer, and Wolfgang Schade

REGULAR PAPERS

Optical Technology

Diffraction and Gratings

  • Applied Optics Vol. 48, Iss. 4, pp. 708–711 (2009)
  • Alexander G. Poleshchuk, Ruslan K. Nasyrov, Vadim V. Cherkashin, Mykhaylo V. Dubov, Vladimir M. Mezentsev, and Ian Bennion

  • Applied Optics Vol. 48, Iss. 4, pp. 730–736 (2009)
  • Yeddanapudi Pavan Kumar and Sanjib Chatterjee

Imaging Systems

  • Applied Optics Vol. 48, Iss. 4, pp. 664–671 (2009)
  • Yichun Dai, Zhong Liu, Zhenyu Jin, Jun Xu, and Jing Lin

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 48, Iss. 4, pp. 758–764 (2009)
  • Chih-Jen Yu, Chu-En Lin, Li-Ping Yu, and Chien Chou

Optical Design and Fabrication

  • Applied Optics Vol. 48, Iss. 4, pp. 712–715 (2009)
  • Angel García-Botella, Antonio Álvarez Fernández-Balbuena, Daniel Vázquez, Eusebio Bernabeu, and Agustín González-Cano

  • Applied Optics Vol. 48, Iss. 4, pp. 737–742 (2009)
  • Yaguo Li and Jian Wang

Optoelectronics

  • Applied Optics Vol. 48, Iss. 4, pp. 792–798 (2009)
  • Falko Riechert, Gordon Craggs, Youri Meuret, Bart Van Giel, Hugo Thienpont, Uli Lemmer, and Guy Verschaffelt

Thin Films

  • Applied Optics Vol. 48, Iss. 4, pp. 778–785 (2009)
  • Maria L. Protopapa

  • Applied Optics Vol. 48, Iss. 4, pp. 799–803 (2009)
  • Young-Sik Ghim and Seung-Woo Kim

Information Processing

Imaging Systems

  • Applied Optics Vol. 48, Iss. 4, pp. 725–729 (2009)
  • Khosro Madanipour and Mohammad T. Tavassoly

Lasers, Photonics, and Environmental Optics

Diffraction and Gratings

  • Applied Optics Vol. 48, Iss. 4, pp. 691–694 (2009)
  • Xihua Zou, Fei Wang, and Wei Pan

Fiber Optics

  • Applied Optics Vol. 48, Iss. 4, pp. 658–663 (2009)
  • Xiaoxiao Xue, He Wen, Xiaoping Zheng, Hanyi Zhang, Yili Guo, and Bingkun Zhou

Fiber Optics and Optical Communications

  • Applied Optics Vol. 48, Iss. 4, pp. 672–678 (2009)
  • Liu Yang, Daoxin Dai, Bo Yang, Zhen Sheng, and Sailing He

  • Applied Optics Vol. 48, Iss. 4, pp. 679–690 (2009)
  • Masaki Oiwa, Shunsuke Minami, Kenichiro Tsuji, Noriaki Onodera, and Masatoshi Saruwatari

  • Applied Optics Vol. 48, Iss. 4, pp. 704–707 (2009)
  • Wojciech Lewoczko-Adamczyk, Max Schiemangk, Holger Müller, and Achim Peters

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 48, Iss. 4, pp. 695–703 (2009)
  • Eric A. Fallows, Thomas G. Cleary, and J. Houston Miller

Lasers and Laser Optics

  • Applied Optics Vol. 48, Iss. 4, pp. 770–777 (2009)
  • Juan M. Bueno, Brian Vohnsen, Luis Roso, and Pablo Artal

  • Applied Optics Vol. 48, Iss. 4, pp. 786–791 (2009)
  • Yuqiang Yang, Liying Tan, and Jing Ma

Nonlinear Optics

  • Applied Optics Vol. 48, Iss. 4, pp. 765–769 (2009)
  • Aniruddha Ray, Susanta K. Das, Lokanath Mishra, Prasanta K. Datta, and Soloman M. Saltiel

Optical Devices

  • Applied Optics Vol. 48, Iss. 4, pp. 804–809 (2009)
  • F. Monifi, A. Ghaffari, M. Djavid, and M. S. Abrishamian

Remote Sensing and Sensors

  • Applied Optics Vol. 48, Iss. 4, pp. 748–757 (2009)
  • Daisuke Sakaizawa, Chikao Nagasawa, Tomohiro Nagai, Makoto Abo, Yasukuni Shibata, Masahisa Nakazato, and Tetsu Sakai

Spectroscopy

  • Applied Optics Vol. 48, Iss. 4, pp. 743–747 (2009)
  • Jaakko Saarela, Juha Toivonen, Albert Manninen, Tapio Sorvajärvi, and Rolf Hernberg

Biomedical Optics

Remote Sensing and Sensors

  • Applied Optics Vol. 48, Iss. 4, pp. 716–724 (2009)
  • Stephen D. Druger, Jozsef Czege, Zhaozhang Li, and Burt V. Bronk
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