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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 12 — Apr. 20, 2010
  • pp: 2220–2402

Optics InfoBase > Applied Optics > Volume 49 > Issue 12 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Image Processing
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Medical Optics and Biotechnology
  • Optical Data Storage
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Optics in Computing
  • Physical Optics
  • Remote Sensing and Sensors
  • Spectroscopy
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Optical Technology

  • Applied Optics Vol. 49, Iss. 12, pp. 2277–2287 (2010)
  • Kexin Chen, Huaidong Yang, Liqun Sun, and Guofan Jin

  • Applied Optics Vol. 49, Iss. 12, pp. 2302–2308 (2010)
  • Daniel Malacara-Doblado, Zacarias Malacara-Hernández, and Armando Gómez-Vieyra

  • Applied Optics Vol. 49, Iss. 12, pp. 2339–2346 (2010)
  • Fabian Duerr, Youri Meuret, and Hugo Thienpont

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 49, Iss. 12, pp. 2288–2301 (2010)
  • Zsolt T. Kosztyán, George P. Eppeldauer, and János D. Schanda

  • Applied Optics Vol. 49, Iss. 12, pp. 2371–2375 (2010)
  • Florin Munteanu

  • Applied Optics Vol. 49, Iss. 12, pp. 2376–2381 (2010)
  • Annette Koo, John F. Clare, Kathryn M. Nield, Andrew Deadman, and Eric Usadi

Medical Optics and Biotechnology

  • Applied Optics Vol. 49, Iss. 12, pp. 2220–2231 (2010)
  • Jessica Eisenstein, Peter Y. Wong, and Caroline G. L. Cao

Optical Design and Fabrication

  • Applied Optics Vol. 49, Iss. 12, pp. 2382–2390 (2010)
  • Norbert Lindlein, Andreas Bich, Martin Eisner, Irina Harder, Maik Lano, Reinhard Voelkel, Ken Weible, and Maik Zimmermann

Optical Devices

  • Applied Optics Vol. 49, Iss. 12, pp. 2250–2261 (2010)
  • Christopher R. Dennison and Peter M. Wild

Optics at Surfaces

  • Applied Optics Vol. 49, Iss. 12, pp. 2397–2402 (2010)
  • Triranjita Srivastava and Arun Kumar

Remote Sensing and Sensors

  • Applied Optics Vol. 49, Iss. 12, pp. 2326–2333 (2010)
  • J. Scott Tyo, Zhipeng Wang, Sergio J. Johnson, and Brian G. Hoover

Information Processing

Image Processing

  • Applied Optics Vol. 49, Iss. 12, pp. 2271–2276 (2010)
  • Martin Laurenzis

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 49, Iss. 12, pp. 2334–2338 (2010)
  • David López and Susana Ríos

Optical Data Storage

  • Applied Optics Vol. 49, Iss. 12, pp. 2309–2315 (2010)
  • Tatsuro Ide, Shigeharu Kimura, Eriko Tatsu, Takahiro Kurokawa, Koichi Watanabe, Yumiko Anzai, and Toshimichi Shintani

Optics in Computing

  • Applied Optics Vol. 49, Iss. 12, pp. 2352–2362 (2010)
  • Xianchao Wang, Junjie Peng, Mei Li, Zhangyi Shen, and Ouyang Shan

Physical Optics

  • Applied Optics Vol. 49, Iss. 12, pp. 2347–2351 (2010)
  • Hua Lu, Xueming Liu, Renlong Zhou, Yongkang Gong, and Dong Mao

Lasers, Photonics, and Environmental Optics

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 49, Iss. 12, pp. 2232–2243 (2010)
  • Juan Cuesta and Pierre H. Flamant

Integrated Optics

  • Applied Optics Vol. 49, Iss. 12, pp. 2391–2396 (2010)
  • Pengfei Qu, Jingran Zhou, Weiyou Chen, Fumin Li, Haibin Li, Caixia Liu, Shengping Ruan, and Wei Dong

Lasers and Laser Optics

  • Applied Optics Vol. 49, Iss. 12, pp. 2316–2325 (2010)
  • Brahma N. Upadhyaya, Antony Kuruvilla, Usha Chakravarty, Mangalpady R. Shenoy, Krishna Thyagarajan, and Shrikant M. Oak

Physical Optics

  • Applied Optics Vol. 49, Iss. 12, pp. 2363–2370 (2010)
  • Bruno Frackowiak and Cameron Tropea

Remote Sensing and Sensors

  • Applied Optics Vol. 49, Iss. 12, pp. 2262–2270 (2010)
  • Jason W. Stafford, Bradley D. Duncan, and Matthew P. Dierking

Spectroscopy

  • Applied Optics Vol. 49, Iss. 12, pp. 2244–2249 (2010)
  • Fernanda Ferretti de Oliveira, Amando Siuiti Ito, and Luciano Bachmann
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