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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 16 — Jun. 1, 2010
  • pp: 2969–3238
  • Feat. pp: YOI1; D1–D176

Optics InfoBase > Applied Optics > Volume 49 > Issue 16 > Table of Contents

Topics in this Issue

 
  • Astronomical Optics and Telesccopes
  • Atmospheric and Oceanic Optics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • General Optical Instrumentation
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Microscopy
  • Nonlinear Optics
  • Optical Aberrations
  • Optical Devices
  • Optics at Surfaces
  • Remote Sensing and Sensors
  • Thin Films
  • Vision Optics
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400 YEARS OF OPTICAL INSTRUMENTATION

  • Applied Optics Vol. 49, Iss. 16, pp. YOI1–YOI1 (2010)
  • Daniel Malacara, Joanna Schmit, Małgorzata Kujawińska, and Mitsuo Takeda

Astronomical Optics and Telesccopes

  • Applied Optics Vol. 49, Iss. 16, pp. D1–D5 (2010)
  • Giuseppe Molesini

  • Applied Optics Vol. 49, Iss. 16, pp. D17–D29 (2010)
  • Michael Hart

  • Applied Optics Vol. 49, Iss. 16, pp. D115–D122 (2010)
  • John M. Hill

  • Applied Optics Vol. 49, Iss. 16, pp. D106–D114 (2010)
  • Naoshi Murakami, Kaito Yokochi, Jun Nishikawa, Motohide Tamura, Takashi Kurokawa, Mitsuo Takeda, and Naoshi Baba

  • Applied Optics Vol. 49, Iss. 16, pp. D131–D144 (2010)
  • Tobias Schmid, Kevin P. Thompson, and Jannick P. Rolland

Vision Optics

  • Applied Optics Vol. 49, Iss. 16, pp. D62–D68 (2010)
  • Jim Schwiegerling and Edward DeHoog

  • Applied Optics Vol. 49, Iss. 16, pp. D123–D130 (2010)
  • Pablo Artal and Juan Tabernero

Optical Aberrations

  • Applied Optics Vol. 49, Iss. 16, pp. D69–D95 (2010)
  • José Sasián

Microscopy

  • Applied Optics Vol. 49, Iss. 16, pp. D96–D105 (2010)
  • Rachid Hammoum, Sidi Ould Saad Hamady, and Marc D. Fontana

  • Applied Optics Vol. 49, Iss. 16, pp. D145–D156 (2010)
  • Supraja Murali, Panomsak Meemon, Kye-Sung Lee, William P. Kuhn, Kevin P. Thompson, and Jannick P. Rolland

General Optical Instrumentation

  • Applied Optics Vol. 49, Iss. 16, pp. D6–D11 (2010)
  • Mumtaz Sheikh and Nabeel A. Riza

  • Applied Optics Vol. 49, Iss. 16, pp. D12–D16 (2010)
  • Zhiqiang Liu, Takashi Gemma, Joseph Rosen, and Mitsuo Takeda

  • Applied Optics Vol. 49, Iss. 16, pp. D30–D61 (2010)
  • Maciej Wojtkowski

  • Applied Optics Vol. 49, Iss. 16, pp. D157–D176 (2010)
  • Peter Hartmann, Ralf Jedamzik, Steffen Reichel, and Bianca Schreder

REGULAR PAPERS

Optical Technology

Detectors

  • Applied Optics Vol. 49, Iss. 16, pp. 2985–2993 (2010)
  • Go Murakami, Kazuo Yoshioka, and Ichiro Yoshikawa

Fiber Optics and Optical Communications

  • Applied Optics Vol. 49, Iss. 16, pp. 3042–3048 (2010)
  • Ming-Yang Chen, Bing Sun, Yong-Kang Zhang, and Xiao-Xia Fu

Imaging Systems

  • Applied Optics Vol. 49, Iss. 16, pp. 3000–3005 (2010)
  • Mohammad Sohail and Asloob A. Mudassar

  • Applied Optics Vol. 49, Iss. 16, pp. 3199–3207 (2010)
  • Pietro Schipani, Sergio D’Orsi, Davide Fierro, and Laurent Marty

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 49, Iss. 16, pp. 3049–3052 (2010)
  • Duo Shao, Linghao Tian, Jingfei Chen, and Xianfeng Chen

  • Applied Optics Vol. 49, Iss. 16, pp. 3182–3186 (2010)
  • Wang-Tsung Wu, Yen-Liang Chen, Hung-Chih Hsieh, Wei-Yao Chang, and Der-Chin Su

  • Applied Optics Vol. 49, Iss. 16, pp. 3231–3234 (2010)
  • Lionel R. Watkins and Sophie S. Shamailov

Integrated Optics

  • Applied Optics Vol. 49, Iss. 16, pp. 3127–3139 (2010)
  • Chu-Ming Cheng and Jyh-Long Chern

Materials

  • Applied Optics Vol. 49, Iss. 16, pp. 3014–3024 (2010)
  • Maria Lucia Protopapa

Remote Sensing and Sensors

  • Applied Optics Vol. 49, Iss. 16, pp. 3082–3091 (2010)
  • Petra D’Odorico, Edoardo Alberti, and Michael E. Schaepman

Thin Films

  • Applied Optics Vol. 49, Iss. 16, pp. 3071–3074 (2010)
  • Xiao Hui Tan, Sheng Lin Ye, Bin Fan, Ken Tang, and Xu Liu

  • Applied Optics Vol. 49, Iss. 16, pp. 3150–3162 (2010)
  • Karen Friedrich, Steffen Wilbrandt, Olaf Stenzel, Norbert Kaiser, and Karl Heinz Hoffmann

Information Processing

Holography

  • Applied Optics Vol. 49, Iss. 16, pp. 3187–3198 (2010)
  • Daniel Claus

Image Processing

  • Applied Optics Vol. 49, Iss. 16, pp. 2979–2984 (2010)
  • Chen Tang, Hongwei Ren, Linlin Wang, Zhifang Wang, Lin Han, and Tao Gao

  • Applied Optics Vol. 49, Iss. 16, pp. 3096–3101 (2010)
  • Jason A. Langley, Robert G. Brice, and Qun Zhao

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 49, Iss. 16, pp. 3215–3223 (2010)
  • Yulie Wu, Linyan Ding, and Xiaojun Hu

Lasers, Photonics, and Environmental Optics

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 49, Iss. 16, pp. 3224–3230 (2010)
  • Frank Hanson and Mark Lasher

Diffraction and Gratings

  • Applied Optics Vol. 49, Iss. 16, pp. 2969–2978 (2010)
  • Jianpeng Wang, Yunxia Jin, Jianyong Ma, Tianyu Sun, and Xufeng Jing

Fiber Optics and Optical Communications

  • Applied Optics Vol. 49, Iss. 16, pp. 3173–3181 (2010)
  • N. Kejalakshmy, Arti Agrawal, Yasin Aden, D. M. H. Leung, B. M. A. Rahman, and K. T. V. Grattan

  • Applied Optics Vol. 49, Iss. 16, pp. 3208–3214 (2010)
  • Ya-Ni Zhang, Li-Yong Ren, Yong-Kang Gong, Xiao-Hui Li, Lei-Ran Wang, and Chuan-Dong Sun

Lasers and Laser Optics

  • Applied Optics Vol. 49, Iss. 16, pp. 3006–3013 (2010)
  • David I. Hillier, David N. Winter, and Nicholas W. Hopps

  • Applied Optics Vol. 49, Iss. 16, pp. 3092–3095 (2010)
  • Guillaume Stern, Baptiste Allard, Martin Robert-de-Saint-Vincent, Jean-Philippe Brantut, Baptiste Battelier, Thomas Bourdel, and Philippe Bouyer.

Optical Devices

  • Applied Optics Vol. 49, Iss. 16, pp. 3025–3034 (2010)
  • Huamao Huang, Seng-Tiong Ho, Dexiu Huang, Yongming Tu, and Wen Liu

Optics at Surfaces

  • Applied Optics Vol. 49, Iss. 16, pp. 3102–3110 (2010)
  • Justin W. Cleary, Gautam Medhi, Robert E. Peale, and Walter R. Buchwald

Remote Sensing and Sensors

  • Applied Optics Vol. 49, Iss. 16, pp. 2994–2999 (2010)
  • Paulo Caldas, Gaspar Rego, Oleg V. Ivanov, and José L. Santos

Biomedical Optics

Holography

  • Applied Optics Vol. 49, Iss. 16, pp. 3053–3058 (2010)
  • Erik Olsson, Per Gren, and Mikael Sjödahl

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 49, Iss. 16, pp. 3235–3238 (2010)
  • Jian-Cheng Lai, Ying-Ying Zhang, Zhen-Hua Li, Hai-Jiao Jiang, and An-Zhi He

Medical Optics and Biotechnology

  • Applied Optics Vol. 49, Iss. 16, pp. 3035–3041 (2010)
  • Tae-hee Han, Ardian B. Gojani, and Jack J. Yoh

  • Applied Optics Vol. 49, Iss. 16, pp. 3059–3070 (2010)
  • Guan Xu, Daqing Piao, Charles F. Bunting, and Hamid Dehghani

  • Applied Optics Vol. 49, Iss. 16, pp. 3111–3126 (2010)
  • Fang Yang, Feng Gao, Pingqiao Ruan, and Huijuan Zhao

  • Applied Optics Vol. 49, Iss. 16, pp. 3140–3149 (2010)
  • Richard Villey, Lionel Carrion, Dominic Morneau, Caroline Boudoux, and Roman Maciejko

  • Applied Optics Vol. 49, Iss. 16, pp. 3163–3172 (2010)
  • Feng Gao, Jiao Li, Limin Zhang, Patrick Poulet, Huijuan Zhao, and Yukio Yamada

Nonlinear Optics

  • Applied Optics Vol. 49, Iss. 16, pp. 3075–3081 (2010)
  • Milan P. Poudel, Alexandre A. Kolomenskii, and Hans A. Schuessler
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