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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 20 — Jul. 10, 2010
  • pp: 3831–4023

Optics InfoBase > Applied Optics > Volume 49 > Issue 20 > Table of Contents

Topics in this Issue

 
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Holography
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Materials
  • Microscopy
  • Optical Design and Fabrication
  • Photocurrent Switching
  • Remote Sensing and Sensors
  • Scattering
  • Thin Films
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Optical Technology

Diffraction and Gratings

  • Applied Optics Vol. 49, Iss. 20, pp. 3860–3863 (2010)
  • Peter R. T. Munro, Konstantin Ignatyev, Robert D. Speller, and Alessandro Olivo

Fiber Optics and Optical Communications

  • Applied Optics Vol. 49, Iss. 20, pp. 3841–3845 (2010)
  • Hyun-Min Kim, Tae-Hun Kim, Bongkyun Kim, and Youngjoo Chung

  • Applied Optics Vol. 49, Iss. 20, pp. 3846–3853 (2010)
  • Alexander Lorenz, Rolf Schuhmann, and Heinz-Siegfried Kitzerow

  • Applied Optics Vol. 49, Iss. 20, pp. 3854–3859 (2010)
  • Charlotte I. Falk, Jan Hald, Jan C. Petersen, and Jens K. Lyngsø

  • Applied Optics Vol. 49, Iss. 20, pp. 3869–3874 (2010)
  • Pandian Chelliah, Kasinathan Murgesan, Sosamma Samvel, Babu Rao Chelamchala, Jayakumar Tammana, Murali Nagarajan, and Baldev Raj

Holography

  • Applied Optics Vol. 49, Iss. 20, pp. 3949–3955 (2010)
  • Colin Dankwart, Claas Falldorf, Ralf Gläbe, Axel Meier, Christoph v. Kopylow, and Ralf B. Bergmann

Imaging Systems

  • Applied Optics Vol. 49, Iss. 20, pp. 3926–3929 (2010)
  • Yossi Ben-Aderet, Er’el Granot, Shmuel Sternklar, Tzachi Tal, and Natan S. Kopeika

  • Applied Optics Vol. 49, Iss. 20, pp. 3997–4003 (2010)
  • Xiaorui Wang and Qiang Guo

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 49, Iss. 20, pp. 3831–3839 (2010)
  • Seongchong Park, Seung-Nam Park, and Dong-Hoon Lee

  • Applied Optics Vol. 49, Iss. 20, pp. 3883–3893 (2010)
  • Amiya Biswas and Jeremy Coupland

  • Applied Optics Vol. 49, Iss. 20, pp. 3941–3948 (2010)
  • Hidehiro Kaneda, Masataka Naitoh, Tadashi Imai, Yoshio Tange, Keigo Enya, Haruyoshi Katayama, Kenta Maruyama, Takao Nakagawa, Takashi Onaka, Masahiro Suganuma, Ryoko Kano, Yuichi Kiriyama, Tatsuya Mori, and Ai Takahashi

  • Applied Optics Vol. 49, Iss. 20, pp. 3960–3966 (2010)
  • Tarek A. Al-Saeed and Diaa A. Khalil

  • Applied Optics Vol. 49, Iss. 20, pp. 4004–4009 (2010)
  • Christian Kohler, Matias R. Viotti, and G. Armando Albertazzi, Jr.

Microscopy

  • Applied Optics Vol. 49, Iss. 20, pp. 3905–3908 (2010)
  • Rui Wang, Jia Wang, Fenghuan Hao, and Qian Tian

Optical Design and Fabrication

  • Applied Optics Vol. 49, Iss. 20, pp. 3875–3882 (2010)
  • Je-Wook Moon, Wan-Seok Kang, Hag yong Han, Sung Min Kim, Seung Hee Lee, Yong gyu Jang, Chul Heon Lee, and Gi-Dong Lee

Remote Sensing and Sensors

  • Applied Optics Vol. 49, Iss. 20, pp. 3980–3985 (2010)
  • Miguel Hernáez, Ignacio Del Villar, Carlos R. Zamarreño, Francisco J. Arregui, and Ignacio R. Matias

Scattering

  • Applied Optics Vol. 49, Iss. 20, pp. 4010–4017 (2010)
  • Yusuf Z. Umul and Uğur Yalçın

Thin Films

  • Applied Optics Vol. 49, Iss. 20, pp. 3922–3925 (2010)
  • Jingtao Zhu, Sika Zhou, Haochuan Li, Qiushi Huang, Zhanshan Wang, Karine Le Guen, Min-Hui Hu, Jean-Michel André, and Philippe Jonnard

Information Processing

Imaging Systems

  • Applied Optics Vol. 49, Iss. 20, pp. 3909–3915 (2010)
  • Kenji Yamazoe

Photocurrent Switching

  • Applied Optics Vol. 49, Iss. 20, pp. 3894–3899 (2010)
  • Tsuyoshi Tsujioka, Itaru Onishi, and Daisuke Natsume

Lasers, Photonics, and Environmental Optics

Detectors

  • Applied Optics Vol. 49, Iss. 20, pp. 4018–4023 (2010)
  • Yan Bai, Deming Ren, Weijiang Zhao, Liming Qian, Zhenlei Chen, and Yan Liu

Fiber Optics and Optical Communications

  • Applied Optics Vol. 49, Iss. 20, pp. 3956–3959 (2010)
  • Yu Gang Shee, Mohammed Hayder Al-Mansoori, Alyani Ismail, Salasiah Hitam, and Mohd Adzir Mahdi

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 49, Iss. 20, pp. 3900–3904 (2010)
  • Elena Nicolescu and Michael J. Escuti

Integrated Optics

  • Applied Optics Vol. 49, Iss. 20, pp. 3930–3934 (2010)
  • Shuyuan Lü, Jianlin Zhao, and Dong Zhang

Lasers and Laser Optics

  • Applied Optics Vol. 49, Iss. 20, pp. 3864–3868 (2010)
  • Nils-Owe Hansen, Aude-Reine Bellancourt, Ulrich Weichmann, and Günter Huber

  • Applied Optics Vol. 49, Iss. 20, pp. 3986–3989 (2010)
  • Yanfei Lü, Xihe Zhang, Jing Xia, and Xinhua Fu

Materials

  • Applied Optics Vol. 49, Iss. 20, pp. 3935–3940 (2010)
  • Yijun Zhang, Jun Niu, Jijun Zou, Benkang Chang, and Yajuan Xiong

Remote Sensing and Sensors

  • Applied Optics Vol. 49, Iss. 20, pp. 3967–3979 (2010)
  • Julien Totems, Véronique Jolivet, Jean-Philippe Ovarlez, and Nadine Martin

Scattering

  • Applied Optics Vol. 49, Iss. 20, pp. 3990–3996 (2010)
  • Yoshihide Takano and Kuo-Nan Liou

Biomedical Optics

Microscopy

  • Applied Optics Vol. 49, Iss. 20, pp. 3916–3921 (2010)
  • Chang Su Jun, Byoung Yoon Kim, Ju Hyun Park, Jae Yong Lee, Eun Seong Lee, and Dong-Il Yeom
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