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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 22 — Aug. 1, 2012
  • pp: 5340–5595

Optics InfoBase > Applied Optics > Volume 51 > Issue 22 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Detectors
  • Fourier Optics and Signal Processing
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Machine Vision
  • Materials
  • Nonlinear Optics
  • Optical Devices
  • Optical Tweezers or Optical Manipulation
  • Optoelectronics
  • Physical Optics
  • Remote Sensing and Sensors
  • Spectroscopy
  • Thin Films
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Optical Technology

Detectors

  • Applied Optics Vol. 51, Iss. 22, pp. 5419–5424 (2012)
  • Delphine Dumas, Manuel Fendler, Nicolas Baier, Jérôme Primot, and Etienne le Coarer

  • Applied Optics Vol. 51, Iss. 22, pp. 5552–5562 (2012)
  • Yu-Bin Chen and Psang Dain Lin

Imaging Systems

  • Applied Optics Vol. 51, Iss. 22, pp. 5442–5452 (2012)
  • Michael R. Hutsel and Thomas K. Gaylord

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 51, Iss. 22, pp. 5357–5368 (2012)
  • Huanhuan Shen, Sébastien Coëtmellec, Gérard Gréhan, and Marc Brunel

  • Applied Optics Vol. 51, Iss. 22, pp. 5495–5511 (2012)
  • William Sparks, Thomas A. Germer, John W. MacKenty, and Frans Snik

  • Applied Optics Vol. 51, Iss. 22, pp. 5512–5516 (2012)
  • Zhen Wang and Yi Jiang

  • Applied Optics Vol. 51, Iss. 22, pp. 5567–5572 (2012)
  • Weihong Song, Fan Wu, and Xi Hou

Lasers and Laser Optics

  • Applied Optics Vol. 51, Iss. 22, pp. 5517–5521 (2012)
  • Johannes F. S. Brachmann, Thomas Kinder, and Kai Dieckmann

Materials

  • Applied Optics Vol. 51, Iss. 22, pp. 5425–5431 (2012)
  • Oleg G. Semyonov, Arsen V. Subashiev, Alexander Shabalov, Nadia Lifshitz, Zhichao Chen, Takashi Hosoda, and Serge Luryi

Nonlinear Optics

  • Applied Optics Vol. 51, Iss. 22, pp. 5458–5463 (2012)
  • Ivan G. Kisialiou

Optoelectronics

  • Applied Optics Vol. 51, Iss. 22, pp. 5412–5418 (2012)
  • Carlos Villa, Iván Olaf Hernandez, Rafael Villa, and Eric Donkor

  • Applied Optics Vol. 51, Iss. 22, pp. 5563–5566 (2012)
  • Shuhong Hu, Guiying Yu, and Yichao Cen

Physical Optics

  • Applied Optics Vol. 51, Iss. 22, pp. 5392–5400 (2012)
  • Timothy York and Viktor Gruev

Spectroscopy

  • Applied Optics Vol. 51, Iss. 22, pp. 5438–5441 (2012)
  • Chang-Hu Yang and Zhong-Quan Ma

Thin Films

  • Applied Optics Vol. 51, Iss. 22, pp. 5543–5551 (2012)
  • Tatiana V. Amotchkina, Michael K. Trubetskov, Vladimir Pervak, Boris Romanov, and Alexander V. Tikhonravov

Information Processing

Fourier Optics and Signal Processing

  • Applied Optics Vol. 51, Iss. 22, pp. 5377–5386 (2012)
  • Sudheesh K. Rajput and Naveen K. Nishchal

Image Processing

  • Applied Optics Vol. 51, Iss. 22, pp. 5486–5494 (2012)
  • Peng Bao, Guohai Situ, Giancarlo Pedrini, and Wolfgang Osten

Imaging Systems

  • Applied Optics Vol. 51, Iss. 22, pp. 5453–5457 (2012)
  • Hee-Jin Choi, Young Min Kim, Junghun Jung, Kwang-Mo Jung, and Sung-Wook Min

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 51, Iss. 22, pp. 5340–5356 (2012)
  • Xu Zhang, Youfu Li, and Limin Zhu

Machine Vision

  • Applied Optics Vol. 51, Iss. 22, pp. 5369–5376 (2012)
  • Shen Cai, Longxiang Huang, and Yuncai Liu

Lasers, Photonics, and Environmental Optics

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 51, Iss. 22, pp. 5387–5391 (2012)
  • James T. Adams, Deric J. Gray, and Simon Rayner

  • Applied Optics Vol. 51, Iss. 22, pp. 5401–5411 (2012)
  • Tao Li, Xin Fang, Wei Liu, Sheng-Yang Gu, and Xiankang Dou

  • Applied Optics Vol. 51, Iss. 22, pp. 5477–5485 (2012)
  • Alexey F. Bunkin, Vladimir K. Klinkov, Vasily N. Lednev, Dmitry L. Lushnikov, Aleksey V. Marchenko, Eugene G. Morozov, Sergey M. Pershin, and Renat N. Yulmetov

Lasers and Laser Optics

  • Applied Optics Vol. 51, Iss. 22, pp. 5527–5530 (2012)
  • Rui Wang, Nan Wang, Hao Teng, and Zhiyi Wei

  • Applied Optics Vol. 51, Iss. 22, pp. 5591–5595 (2012)
  • Richard D. Graham, Robert B. Hurst, K-Ulrich Schreiber, and Jon-Paul R. Wells

Nonlinear Optics

  • Applied Optics Vol. 51, Iss. 22, pp. 5432–5437 (2012)
  • Yanzhi Ma, Junjie Chen, Yuanlin Zheng, and Xianfeng Chen

  • Applied Optics Vol. 51, Iss. 22, pp. 5579–5584 (2012)
  • Shaopeng Li, Hongjun Liu, Nan Huang, Qibing Sun, and Xuefeng Li

  • Applied Optics Vol. 51, Iss. 22, pp. 5585–5590 (2012)
  • Qingchun Zhao, Hongxi Yin, and Xiaolei Chen

Optical Devices

  • Applied Optics Vol. 51, Iss. 22, pp. 5573–5578 (2012)
  • G. V. Vázquez, D. Ramírez, H. Márquez, E. Flores-Romero, J. Rickards, and R. Trejo-Luna

Optical Tweezers or Optical Manipulation

  • Applied Optics Vol. 51, Iss. 22, pp. 5522–5526 (2012)
  • Ignacio A. Martínez and Dmitri Petrov

Remote Sensing and Sensors

  • Applied Optics Vol. 51, Iss. 22, pp. 5531–5542 (2012)
  • Samuel M. Venable, Bradley D. Duncan, Matthew P. Dierking, and David J. Rabb

Spectroscopy

  • Applied Optics Vol. 51, Iss. 22, pp. 5464–5476 (2012)
  • Mruthunjaya Uddi, Apurba Kumar Das, and Chih-Jen Sung
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