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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 28 — Oct. 1, 2012
  • pp: 6700–6900
  • Feat. pp: ED11–ED12

Optics InfoBase > Applied Optics > Volume 51 > Issue 28 > Table of Contents

Topics in this Issue

 
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Optics at Surfaces
  • Optoelectronics
  • Physical Optics
  • Scattering
  • Solar Energy
  • Thin Films
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Editorial

  • Applied Optics Vol. 51, Iss. 28, pp. ED11–ED12 (2012)
  • James C. Wyant

Optical Technology

Diffraction and Gratings

  • Applied Optics Vol. 51, Iss. 28, pp. 6726–6731 (2012)
  • Xiao-Zhang Wang, Qi Li, and Qi Wang

  • Applied Optics Vol. 51, Iss. 28, pp. 6855–6863 (2012)
  • Zhiyun Li, M. Jamal Deen, Qiyin Fang, and P. R. Selvaganapathy

Fiber Optics and Optical Communications

  • Applied Optics Vol. 51, Iss. 28, pp. 6708–6717 (2012)
  • Huilian Ma, Zhen Chen, Zhihuai Yang, Xuhui Yu, and Zhonghe Jin

Image Processing

  • Applied Optics Vol. 51, Iss. 28, pp. 6738–6744 (2012)
  • Maryelle Bessou, Bruno Chassagne, Jean-Pascal Caumes, Christophe Pradère, Philippe Maire, Marc Tondusson, and Emmanuel Abraham

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 51, Iss. 28, pp. 6805–6817 (2012)
  • Oriol Arteaga, John Freudenthal, Baoliang Wang, and Bart Kahr

  • Applied Optics Vol. 51, Iss. 28, pp. 6886–6895 (2012)
  • Young J. Song and Kara J. Peters

Integrated Optics

  • Applied Optics Vol. 51, Iss. 28, pp. 6896–6900 (2012)
  • Jeong Kim

Lasers and Laser Optics

  • Applied Optics Vol. 51, Iss. 28, pp. 6718–6725 (2012)
  • Alexander Gatej, Johannes Wasselowski, and Peter Loosen

Optics at Surfaces

  • Applied Optics Vol. 51, Iss. 28, pp. 6700–6707 (2012)
  • Akihiro Yamashita, Masashi Sugiyama, Katsuichi Kitagawa, and Hisashi Kobayashi

  • Applied Optics Vol. 51, Iss. 28, pp. 6824–6830 (2012)
  • David T. Chuss, Edward J. Wollack, Giampaolo Pisano, Sheridan Ackiss, Kongpop U-Yen, and Ming wah Ng

Optoelectronics

  • Applied Optics Vol. 51, Iss. 28, pp. 6818–6823 (2012)
  • Zihang Zhu, Shanghong Zhao, Yongjun Li, Xingchun Chu, Wei Jiang, Xiang Wang, and Guhao Zhao

Solar Energy

  • Applied Optics Vol. 51, Iss. 28, pp. 6848–6854 (2012)
  • Sébastien Bouchard and Simon Thibault

Thin Films

  • Applied Optics Vol. 51, Iss. 28, pp. 6789–6798 (2012)
  • Jan Kischkat, Sven Peters, Bernd Gruska, Mykhaylo Semtsiv, Mikaela Chashnikova, Matthias Klinkmüller, Oliana Fedosenko, Stephan Machulik, Anna Aleksandrova, Gregorii Monastyrskyi, Yuri Flores, and W. Ted Masselink

  • Applied Optics Vol. 51, Iss. 28, pp. 6839–6843 (2012)
  • Junwu Chen, Biao Wang, Yi Yang, Yuanyuan Shi, Gaojie Xu, and Ping Cui

  • Applied Optics Vol. 51, Iss. 28, pp. 6844–6847 (2012)
  • Honggang Hao, Ao Zhou, and Min Rao

Information Processing

Diffraction and Gratings

  • Applied Optics Vol. 51, Iss. 28, pp. 6732–6737 (2012)
  • Björn Brüser, Isabelle Staude, Georg von Freymann, Martin Wegener, and Ullrich Pietsch

  • Applied Optics Vol. 51, Iss. 28, pp. 6799–6804 (2012)
  • Junjie Yu, Changhe Zhou, Wei Jia, Anduo Hu, Wugang Cao, Jun Wu, and Shaoqing Wang

Imaging Systems

  • Applied Optics Vol. 51, Iss. 28, pp. 6870–6880 (2012)
  • Hsien-Huang P. Wu, Yi-Ping Lee, and Shih-Hsin Chang

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 51, Iss. 28, pp. 6831–6838 (2012)
  • Nail Sabitov, Thomas Meinecke, Damien P. Kelly, and Stefan Sinzinger

Lasers, Photonics, and Environmental Optics

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 51, Iss. 28, pp. 6864–6869 (2012)
  • Yue Wu, Jordan Sawyer, Zhili Zhang, and Steven F. Adams

Lasers and Laser Optics

  • Applied Optics Vol. 51, Iss. 28, pp. 6781–6788 (2012)
  • Chaoyang Wei, Kui Yi, Zhengxiu Fan, and Jianda Shao

  • Applied Optics Vol. 51, Iss. 28, pp. 6881–6885 (2012)
  • Tao Chen, Kaihua Wei, Peipei Jiang, Bo Wu, and Yonghang Shen

Optics at Surfaces

  • Applied Optics Vol. 51, Iss. 28, pp. 6765–6780 (2012)
  • Arthur H. Carrieri, Tudor N. Buican, Erik S. Roese, James Sutter, and Alan C. Samuels

Physical Optics

  • Applied Optics Vol. 51, Iss. 28, pp. 6745–6752 (2012)
  • Daniela P. L. Ferreira, Rosana Motta Jafelice, and Elias O. Serqueira

Scattering

  • Applied Optics Vol. 51, Iss. 28, pp. 6753–6764 (2012)
  • Deric J. Gray
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