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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 12 — Apr. 20, 2013
  • pp: 2521–2949

Optics InfoBase > Applied Optics > Volume 52 > Issue 12 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Coherence and Statistical Optics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Machine Vision
  • Materials
  • Medical Optics and Biotechnology
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optoelectronics
  • Remote Sensing and Sensors
  • Scattering
  • Spectroscopy
  • Thin Films
  • Wave-front Sensing
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Coherence and Statistical Optics

  • Applied Optics Vol. 52, Iss. 12, pp. 2815–2827 (2013)
  • Arlene Smith and Christopher Dainty

Detectors

  • Applied Optics Vol. 52, Iss. 12, pp. 2584–2594 (2013)
  • Yong Song, Qun Hao, Jie Cao, Fan Fan, Tao Liu, and Lin Li

Diffraction and Gratings

  • Applied Optics Vol. 52, Iss. 12, pp. 2670–2675 (2013)
  • Di Wu, Tao Zhu, Guo-Yin Wang, Jian-Yu Fu, Xiao-Guang Lin, and Guang-Lei Gou

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 12, pp. 2659–2669 (2013)
  • Shoam Shwartz, Michael Golub, and Shlomo Ruschin

  • Applied Optics Vol. 52, Iss. 12, pp. 2682–2687 (2013)
  • Spencer Chadderdon, Leeland Woodard, Daniel Perry, Richard H. Selfridge, and Stephen M. Schultz

Holography

  • Applied Optics Vol. 52, Iss. 12, pp. 2610–2618 (2013)
  • Stephan Reichelt

  • Applied Optics Vol. 52, Iss. 12, pp. 2940–2949 (2013)
  • Changgeng Liu, Xiao Yu, and Myung K. Kim

Image Processing

  • Applied Optics Vol. 52, Iss. 12, pp. 2923–2931 (2013)
  • Christian Cierpka, Sven Scharnowski, and Christian J. Kähler

Imaging Systems

  • Applied Optics Vol. 52, Iss. 12, pp. 2761–2772 (2013)
  • Eric Herman, Amber Czajkowski, Daniel Stroschine, and Scott Sparrold

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 12, pp. 2527–2530 (2013)
  • Ewan D. Fitzsimons, Johanna Bogenstahl, James Hough, Christian J. Killow, Michael Perreur-Lloyd, David I. Robertson, and Henry Ward

  • Applied Optics Vol. 52, Iss. 12, pp. 2718–2728 (2013)
  • Marta Klanjšek Gunde and Nina Rogelj

  • Applied Optics Vol. 52, Iss. 12, pp. 2808–2814 (2013)
  • Yitping Kok, Michael J. Ireland, J. Gordon Robertson, Peter G. Tuthill, Benjamin A. Warrington, and William J. Tango

  • Applied Optics Vol. 52, Iss. 12, pp. 2834–2840 (2013)
  • Huiyi Natalie Luo, Heejoo Shua Kim, Monica Agarwal, and Iwao Teraoka

Integrated Optics

  • Applied Optics Vol. 52, Iss. 12, pp. 2866–2873 (2013)
  • Mahdi Bahadoran, Jalil Ali, and Preecha P. Yupapin

Medical Optics and Biotechnology

  • Applied Optics Vol. 52, Iss. 12, pp. 2711–2717 (2013)
  • Tim C. Lei, Srinivas Pendyala, Larry Scherrer, Buhong Li, Gregory F. Glazner, and Zheng Huang

  • Applied Optics Vol. 52, Iss. 12, pp. 2739–2749 (2013)
  • Mohammad Ali Ansari, Mohsen Erfanzadeh, Saeid Alikhani, and Ezeddin Mohajerani

Nonlinear Optics

  • Applied Optics Vol. 52, Iss. 12, pp. 2595–2601 (2013)
  • Meimei Lai, James D. Franson, and Todd B. Pittman

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 12, pp. 2521–2526 (2013)
  • Leonid L. Doskolovich, Anton Y. Dmitriev, Evgeni A. Bezus, and Mikhail A. Moiseev

  • Applied Optics Vol. 52, Iss. 12, pp. 2688–2693 (2013)
  • Aiming Ge, Wei Wang, Zhengqing Du, Peng Qiu, Junwei Wang, Jinlin Cai, and Xiaobo Song

Optical Devices

  • Applied Optics Vol. 52, Iss. 12, pp. 2564–2569 (2013)
  • Abdolrahman Namdar, Reza Abdi-Ghaleh, and Kazem Jamshidi-Ghaleh

  • Applied Optics Vol. 52, Iss. 12, pp. 2602–2609 (2013)
  • Willem L. Vos, Teus W. Tukker, Allard P. Mosk, Ad Lagendijk, and Wilbert L. IJzerman

Spectroscopy

  • Applied Optics Vol. 52, Iss. 12, pp. 2633–2639 (2013)
  • Huijie Zhao, Chongchong Li, Ying Zhang, and Pengwei Zhou

Thin Films

  • Applied Optics Vol. 52, Iss. 12, pp. 2780–2791 (2013)
  • Frédéric Lemarquis

Diffraction and Gratings

  • Applied Optics Vol. 52, Iss. 12, pp. 2577–2583 (2013)
  • Aymen Arfaoui and Simon Thibault

  • Applied Optics Vol. 52, Iss. 12, pp. 2800–2807 (2013)
  • Wenting Sun, Peng Lv, Changhe Zhou, Hongchao Cao, and Jun Wu

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 12, pp. 2917–2922 (2013)
  • Xinzhi Sheng, Zhen Feng, and Bing Li

Fourier Optics and Signal Processing

  • Applied Optics Vol. 52, Iss. 12, pp. 2619–2625 (2013)
  • Dezhao Kong, Xueju Shen, Qinzu Xu, Wang Xin, and Haiqiong Guo

  • Applied Optics Vol. 52, Iss. 12, pp. 2858–2865 (2013)
  • Nickolaos Savidis, Gholam Peyman, Nasser Peyghambarian, and Jim Schwiegerling

Holography

  • Applied Optics Vol. 52, Iss. 12, pp. 2694–2705 (2013)
  • Hirotaka Hadachi and Takashi Saito

  • Applied Optics Vol. 52, Iss. 12, pp. 2841–2848 (2013)
  • Tianxiang Zheng, Liangcai Cao, Qingsheng He, and Guofan Jin

Image Processing

  • Applied Optics Vol. 52, Iss. 12, pp. 2570–2576 (2013)
  • Kaveh Heidary

Imaging Systems

  • Applied Optics Vol. 52, Iss. 12, pp. 2531–2545 (2013)
  • Jonathan M. Nichols, Kyle P. Judd, Colin C. Olson, James R. Waterman, and James D. Nichols

  • Applied Optics Vol. 52, Iss. 12, pp. 2653–2658 (2013)
  • Yun-yun Chen, Ying-ying Zhang, Cheng-yi Zhang, and Zhen-hua Li

Integrated Optics

  • Applied Optics Vol. 52, Iss. 12, pp. 2932–2939 (2013)
  • Giorgia Parca, Pedro Teixeira, and Antonio Teixeira

Scattering

  • Applied Optics Vol. 52, Iss. 12, pp. 2792–2799 (2013)
  • Yajing Wang, Jin Shen, Liu Wei, Zhenhai Dou, and Shanshan Gao

Wave-front Sensing

  • Applied Optics Vol. 52, Iss. 12, pp. 2640–2652 (2013)
  • Iuliia Shatokhina, Andreas Obereder, Matthias Rosensteiner, and Ronny Ramlau

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 52, Iss. 12, pp. 2874–2892 (2013)
  • Jeremy T. Dobler, F. Wallace Harrison, Edward V. Browell, Bing Lin, Doug McGregor, Susan Kooi, Yonghoon Choi, and Syed Ismail

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 12, pp. 2706–2710 (2013)
  • Minwan Jung and Ju Han Lee

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 12, pp. 2546–2554 (2013)
  • Avnish Kumar Sharma, Rajesh Kumar Patidar, Deepak Daiya, Anandverdhan Joshi, Prasad Anant Naik, and Parshotam Dass Gupta

  • Applied Optics Vol. 52, Iss. 12, pp. 2676–2681 (2013)
  • Junhai Liu, Yong Wan, Qibiao Dai, Xueping Tian, Wenjuan Han, and Huaijin Zhang

  • Applied Optics Vol. 52, Iss. 12, pp. 2735–2738 (2013)
  • Zilong Zhang, Qiang Liu, and Mali Gong

  • Applied Optics Vol. 52, Iss. 12, pp. 2773–2779 (2013)
  • Jia Zhao, Shengzhi Zhao, Kejian Yang, and Gang Zhang

  • Applied Optics Vol. 52, Iss. 12, pp. 2905–2908 (2013)
  • Haibin Lü, Pu Zhou, Xiaolin Wang, and Zongfu Jiang

  • Applied Optics Vol. 52, Iss. 12, pp. 2909–2916 (2013)
  • Marie Kasprzack, Benjamin Canuel, Fabien Cavalier, Richard Day, Eric Genin, Julien Marque, Daniel Sentenac, and Gabriele Vajente

Machine Vision

  • Applied Optics Vol. 52, Iss. 12, pp. 2750–2760 (2013)
  • Klemen Žbontar, Matjaž Mihelj, Boštjan Podobnik, Franc Povše, and Marko Munih

Materials

  • Applied Optics Vol. 52, Iss. 12, pp. 2729–2734 (2013)
  • Konstantin Shcherbin, Volodymyr Danylyuk, and Marvin Klein

Optical Devices

  • Applied Optics Vol. 52, Iss. 12, pp. 2849–2857 (2013)
  • Yuan Zhou, Yafei Lu, Mo Hei, Guangcan Liu, and Dapeng Fan

Optoelectronics

  • Applied Optics Vol. 52, Iss. 12, pp. 2828–2833 (2013)
  • Baktash Hekmat, Vahid Ahmadi, and Elham Darabi

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 12, pp. 2626–2632 (2013)
  • Xing Chen, Dingkai Guo, Fow-Sen Choa, Chen-Chia Wang, Sudhir Trivedi, A. Peter Snyder, Guoyun Ru, and Jenyu Fan

Spectroscopy

  • Applied Optics Vol. 52, Iss. 12, pp. 2555–2563 (2013)
  • Kazumasa Takada, Mitsuyoshi Seino, Akito Chiba, and Katsunari Okamoto

  • Applied Optics Vol. 52, Iss. 12, pp. 2893–2904 (2013)
  • Andrew W. Caswell, Sukesh Roy, Xinliang An, Scott T. Sanders, Frederick R. Schauer, and James R. Gord
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