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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 14 — May. 10, 2013
  • pp: 3116–3443

Optics InfoBase > Applied Optics > Volume 52 > Issue 14 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Coherence and Statistical Optics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optics in Computing
  • Physical Optics
  • Quantum Optics
  • Remote Sensing and Sensors
  • Scattering
  • Surface Plasmons
  • X-ray Optics
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Detectors

  • Applied Optics Vol. 52, Iss. 14, pp. 3241–3245 (2013)
  • Sijing Chen, Dengkuan Liu, Wenxing Zhang, Lixing You, Yuhao He, Weijun Zhang, Xiaoyan Yang, Guang Wu, Min Ren, Heping Zeng, Zhen Wang, Xiaoming Xie, and Mianheng Jiang

Diffraction and Gratings

  • Applied Optics Vol. 52, Iss. 14, pp. 3229–3233 (2013)
  • Sun-Goo Lee and Chul-Sik Kee

  • Applied Optics Vol. 52, Iss. 14, pp. 3246–3252 (2013)
  • Hong-yue Liu, Da-kai Liang, Xiao-lin Han, and Jie Zeng

  • Applied Optics Vol. 52, Iss. 14, pp. 3288–3297 (2013)
  • Konstantinos Falaggis, Tomasz Kozacki, and Malgorzata Kujawinska

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 14, pp. 3166–3171 (2013)
  • Shuangxia Wang, Yan-ge Liu, Zhi Wang, Tingting Han, Weicai Xu, Yunkun Wang, and Shangcheng Wang

  • Applied Optics Vol. 52, Iss. 14, pp. 3234–3240 (2013)
  • Tin Komljenovic, Dubravko Babić, and Zvonimir Sipus

  • Applied Optics Vol. 52, Iss. 14, pp. 3305–3310 (2013)
  • Shanshan Li, Hao Zhang, Yu Hou, Jinjun Bai, Weiwei Liu, and Shengjiang Chang

Image Processing

  • Applied Optics Vol. 52, Iss. 14, pp. 3338–3344 (2013)
  • Betty P. Kouskousis, Daniel J. Kitcher, Stephen F. Collins, and Greg W. Baxter

Imaging Systems

  • Applied Optics Vol. 52, Iss. 14, pp. 3216–3220 (2013)
  • Yifan Liu, Yan Li, and Shin-Tson Wu

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 14, pp. 3134–3146 (2013)
  • Susanne Zwick, Stefan Heist, Ralf Steinkopf, Sandra Huber, Sylvio Krause, Christian Bräuer-Burchardt, Peter Kühmstedt, and Gunther Notni

  • Applied Optics Vol. 52, Iss. 14, pp. 3381–3386 (2013)
  • Yi-Chun Chen, Po-Chih Lin, Chung-Min Lee, and Chao-Wen Liang

Materials

  • Applied Optics Vol. 52, Iss. 14, pp. 3203–3215 (2013)
  • Peter Liebetraut, Philipp Waibel, Phuong Ha Cu Nguyen, Patrick Reith, Bernd Aatz, and Hans Zappe

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 14, pp. 3172–3177 (2013)
  • Robert D. Niederriter, Alexander M. Watson, Ramzi N. Zahreddine, Carol J. Cogswell, Robert H. Cormack, Victor M. Bright, and Juliet T. Gopinath

Optical Devices

  • Applied Optics Vol. 52, Iss. 14, pp. 3318–3323 (2013)
  • Chao Liu, Li Pei, Zhuoxuan Li, Tigang Ning, Shaowei Yu, and Zexin Kang

  • Applied Optics Vol. 52, Iss. 14, pp. 3368–3380 (2013)
  • Christophe Dorrer

Optics in Computing

  • Applied Optics Vol. 52, Iss. 14, pp. 3260–3268 (2013)
  • Afsana Khatoon, William G. Cowley, Nick Letzepis, and Dirk Giggenbach

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 14, pp. 3253–3259 (2013)
  • Yunfang Zhang, Hui Li, Jingyuan Duan, Ancun Shi, and Yuliang Liu

  • Applied Optics Vol. 52, Iss. 14, pp. 3433–3443 (2013)
  • Sebastian Arnold Kaiser, Victor Manuel Salazar, and Alexandra A. Hoops

Scattering

  • Applied Optics Vol. 52, Iss. 14, pp. 3279–3287 (2013)
  • Tobias Herffurth, Sven Schröder, Marcus Trost, Angela Duparré, and Andreas Tünnermann

Surface Plasmons

  • Applied Optics Vol. 52, Iss. 14, pp. 3324–3328 (2013)
  • Goro Terakado, Jun Ning, Koyo Watanabe, and Hiroshi Kano

X-ray Optics

  • Applied Optics Vol. 52, Iss. 14, pp. 3412–3419 (2013)
  • Rudeger H. T. Wilke, Raegan L. Johnson-Wilke, Vincenzo Cotroneo, William N. Davis, Paul B. Reid, Daniel A. Schwartz, and Susan Trolier-McKinstry

Image Processing

  • Applied Optics Vol. 52, Iss. 14, pp. 3394–3403 (2013)
  • Dmitry Savransky, Sandrine J. Thomas, Lisa A. Poyneer, and Bruce A. Macintosh

Imaging Systems

  • Applied Optics Vol. 52, Iss. 14, pp. 3351–3363 (2013)
  • Xu Ma, Zhiyang Song, Yanqiu Li, and Gonzalo R. Arce

  • Applied Optics Vol. 52, Iss. 14, pp. 3387–3393 (2013)
  • Elizabeth Bemand and Haida Liang

Quantum Optics

  • Applied Optics Vol. 52, Iss. 14, pp. 3311–3317 (2013)
  • M. J. García-Martínez, N. Denisenko, D. Soto, D. Arroyo, A. B. Orue, and V. Fernandez

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 52, Iss. 14, pp. 3147–3155 (2013)
  • Bo Tu, Lu Liu, Yihui Liu, Ye Jin, and Junxiong Tang

  • Applied Optics Vol. 52, Iss. 14, pp. 3178–3202 (2013)
  • Detlef Müller, Igor Veselovskii, Alexei Kolgotin, Matthias Tesche, Albert Ansmann, and Oleg Dubovik

Coherence and Statistical Optics

  • Applied Optics Vol. 52, Iss. 14, pp. 3221–3228 (2013)
  • Henri Partanen, Jani Tervo, and Jari Turunen

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 14, pp. 3420–3427 (2013)
  • M. Sadegh Cheri, Hamid Latifi, F. Beygi Azar Aghbolagh, O. R. Ranjbar Naeini, Majid Taghavi, and Mohammadamir Ghaderi

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 14, pp. 3116–3126 (2013)
  • M. Nurul Abedin, Arthur T. Bradley, Syed Ismail, Shiv K. Sharma, and Stephen P. Sandford

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 14, pp. 3269–3278 (2013)
  • Ramakanta Biswal, Govind Kumar Mishra, Praveen Kumar Agrawal, Shankar V. Nakhe, and Sudhir Kumar Dixit

  • Applied Optics Vol. 52, Iss. 14, pp. 3298–3304 (2013)
  • Yonggen Xu, Shijian Wang, Qunchao Fan, and Zairu Ma

  • Applied Optics Vol. 52, Iss. 14, pp. 3364–3367 (2013)
  • Sven Schwertfeger, Andreas Klehr, Thomas Hoffmann, Armin Liero, Hans Wenzel, and Götz Erbert

Materials

  • Applied Optics Vol. 52, Iss. 14, pp. 3329–3337 (2013)
  • Charles D. Boley and Alexander M. Rubenchik

Nonlinear Optics

  • Applied Optics Vol. 52, Iss. 14, pp. 3156–3165 (2013)
  • Ahmed H. Flayyih and Amin H. Al-Khursan

  • Applied Optics Vol. 52, Iss. 14, pp. 3404–3411 (2013)
  • Daisy Williams, Xiaoyi Bao, and Liang Chen

Physical Optics

  • Applied Optics Vol. 52, Iss. 14, pp. 3428–3432 (2013)
  • Li Fuquan, Wang Fang, Han Wei, Feng Bin, and Zhou Lidan

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 14, pp. 3127–3133 (2013)
  • Mustafa Sivaslıgil, Cemil Berin Erol, Özgür Murat Polat, and Hüseyin Sarı

  • Applied Optics Vol. 52, Iss. 14, pp. 3345–3350 (2013)
  • Milan Nikolić, Dejan P. Jovanović, Yah Leng Lim, Karl Bertling, Thomas Taimre, and Aleksandar D. Rakić
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