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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 15 — May. 20, 2013
  • pp: 3444–3644

Optics InfoBase > Applied Optics > Volume 52 > Issue 15 > Table of Contents

Topics in this Issue

 
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Machine Vision
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Remote Sensing and Sensors
  • Thin Films
  • X-ray Optics
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Editorial

  • Applied Optics Vol. 52, Iss. 15, pp. ED5–ED6 (2013)
  • Joseph N. Mait

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 15, pp. 3591–3596 (2013)
  • Yanying Du, Xueguang Qiao, Qiangzhou Rong, Jing Zhang, Dingyi Feng, Ruohui Wang, Hao Sun, Manli Hu, and Zhongyao Feng

Image Processing

  • Applied Optics Vol. 52, Iss. 15, pp. 3510–3515 (2013)
  • Wenlin Gong, Zunwang Bo, Enrong Li, and Shensheng Han

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 15, pp. 3461–3472 (2013)
  • Asloob Ahmad Mudassar and Saira Butt

Machine Vision

  • Applied Optics Vol. 52, Iss. 15, pp. 3526–3537 (2013)
  • Jaka Katrašnik, Franjo Pernuš, and Boštjan Likar

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 15, pp. 3617–3623 (2013)
  • Chun-Wei Liu, Chi-Hung Lee, Tzu-Chun Yang, Chia-Jen Ting, Tsung-Hsin Lin, and Shih-Chieh Lin

Optical Devices

  • Applied Optics Vol. 52, Iss. 15, pp. 3490–3494 (2013)
  • Ying Wang, Yundong Zhang, Yulong Gai, Xuenan Zhang, and Ping Yuan

Optics at Surfaces

  • Applied Optics Vol. 52, Iss. 15, pp. 3624–3636 (2013)
  • Hon-Yuen Tam, Haobo Cheng, and Zhichao Dong

Thin Films

  • Applied Optics Vol. 52, Iss. 15, pp. 3444–3450 (2013)
  • Hamed Reza Modayemzadeh, Mohsen Ghasemi Varnamkhasti, and Hosein Zabolian

Diffraction and Gratings

  • Applied Optics Vol. 52, Iss. 15, pp. 3637–3644 (2013)
  • Jorge Albero, Jeffrey A. Davis, Don M. Cottrell, Charles E. Granger, Kyle R. McCormick, and Ignacio Moreno

Holography

  • Applied Optics Vol. 52, Iss. 15, pp. 3567–3575 (2013)
  • Gang Li, Anh-Hoang Phan, Nam Kim, and Jae-Hyeung Park

Image Processing

  • Applied Optics Vol. 52, Iss. 15, pp. 3608–3616 (2013)
  • A. Alkan Gülses and B. Keith Jenkins

Imaging Systems

  • Applied Optics Vol. 52, Iss. 15, pp. 3477–3483 (2013)
  • Xueyan Liu, Dong Peng, Xibo Ma, Wei Guo, Zhenyu Liu, Dong Han, Xin Yang, and Jie Tian

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 15, pp. 3484–3489 (2013)
  • Rongli Guo, Baoli Yao, Peng Gao, Junwei Min, Jun Han, Xun Yu, Ming Lei, Shaohui Yan, Yanlong Yang, Dan Dan, and Tong Ye

  • Applied Optics Vol. 52, Iss. 15, pp. 3576–3582 (2013)
  • Jorge L. Flores, García Torales, José A. Ferrari, Gastón Ayubi, Oscar Ed. Castillo, and Matías Di Martino

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 15, pp. 3500–3509 (2013)
  • Murat Muradoglu and Tuck Wah Ng

X-ray Optics

  • Applied Optics Vol. 52, Iss. 15, pp. 3538–3556 (2013)
  • Jeffrey A. Koch, Otto L. Landen, Laurence J. Suter, Laurent P. Masse, Daniel S. Clark, James S. Ross, Andrew J. Mackinnon, Nathan B. Meezan, Cliff A. Thomas, and Yuan Ping

Detectors

  • Applied Optics Vol. 52, Iss. 15, pp. 3473–3476 (2013)
  • Le Wang, Kui-juan Jin, Jie Xing, Chen Ge, Hui-bin Lu, Wen-jia Zhou, and Guo-zhen Yang

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 15, pp. 3516–3525 (2013)
  • Harald Kögel, Domenico Gerardi, Joep Pijnenburg, Martin Gohlke, Thilo Schuldt, Ulrich Johann, Claus Braxmaier, and Dennis Weise

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 15, pp. 3495–3499 (2013)
  • Tao Zhang, Jigui Zhu, Tinghang Guo, Jing Wang, and Shenghua Ye

  • Applied Optics Vol. 52, Iss. 15, pp. 3583–3590 (2013)
  • Shuanghong Ding, Wenhui Zhang, Shiwu Wang, Xichang Wang, Jun Zhang, and Meiqin Wang

  • Applied Optics Vol. 52, Iss. 15, pp. 3597–3607 (2013)
  • Nicholas Hopps, Colin Danson, Stuart Duffield, David Egan, Stephen Elsmere, Mark Girling, Ewan Harvey, David Hillier, Michael Norman, Stefan Parker, Paul Treadwell, David Winter, and Thomas Bett

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 15, pp. 3451–3460 (2013)
  • Mingquan Li, Mingjun Chen, Jian Cheng, Yong Xiao, and Wei Jiang

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 15, pp. 3557–3566 (2013)
  • Shi Kuang, Michael J. Newchurch, John Burris, and Xiong Liu
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