1 June 2013, Volume 52, Issue 16, pp. 3645-3890
33 articles
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Atomic force microscopy enables investigation of the topography evolution of high-slope optical surfaces, suggesting that five-axis ion beam figuring is an excellent method for the final ultra-precision and ultra-smooth machining of high-slope optical components. For information, see Liao et al., pp. 3719-3725.
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