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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 16 — Jun. 1, 2013
  • pp: 3645–3890

Optics InfoBase > Applied Optics > Volume 52 > Issue 16 > Table of Contents

Topics in this Issue

 
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Geometric Optics
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Scattering
  • Thin Films
  • Ultrafast Optics
  • X-ray Optics
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Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 16, pp. 3645–3654 (2013)
  • Jean Bittebierre

  • Applied Optics Vol. 52, Iss. 16, pp. 3876–3883 (2013)
  • Johan Jason, Hans-Erik Nilsson, Bertil Arvidsson, and Anders Larsson

Geometric Optics

  • Applied Optics Vol. 52, Iss. 16, pp. 3703–3712 (2013)
  • Carlos M. Bledt, Jeffrey E. Melzer, and James A. Harrington

Holography

  • Applied Optics Vol. 52, Iss. 16, pp. 3838–3844 (2013)
  • Yutaka Mori and Takanori Nomura

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 16, pp. 3655–3661 (2013)
  • Lingfeng Chen, Xiaofei Guo, and Jinjian Hao

  • Applied Optics Vol. 52, Iss. 16, pp. 3671–3679 (2013)
  • Jitao Zhang, Pei Huang, Yan Li, and Haoyun Wei

  • Applied Optics Vol. 52, Iss. 16, pp. 3726–3731 (2013)
  • Samuel Choi, Kohei Otsuki, Osami Sasaki, and Takamasa Suzuki

  • Applied Optics Vol. 52, Iss. 16, pp. 3812–3817 (2013)
  • Jiamiao Yang, Lirong Qiu, Weiqian Zhao, Rongjun Shao, and Zhigang Li

  • Applied Optics Vol. 52, Iss. 16, pp. 3856–3863 (2013)
  • Luc Lévesque

  • Applied Optics Vol. 52, Iss. 16, pp. 3864–3875 (2013)
  • Gibion Makiwa, David A. Naylor, Marc Ferlet, Carl Salji, Bruce Swinyard, Edward Polehampton, and Matthijs H. D. van der Wiel

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 16, pp. 3713–3718 (2013)
  • Ruiyun He, Qiang An, Javier R. Vázquez de Aldana, Qingming Lu, and Feng Chen

Materials

  • Applied Optics Vol. 52, Iss. 16, pp. 3757–3763 (2013)
  • Anatoliy S. Andrushchak, Oleh V. Yurkevych, Bogdan M. Strychalyuk, Mykhailo M. Klymash, Andrzej Rusek, and Andriy V. Kityk

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 16, pp. 3719–3725 (2013)
  • Wenlin Liao, Yifan Dai, Xuhui Xie, and Lin Zhou

Optics at Surfaces

  • Applied Optics Vol. 52, Iss. 16, pp. 3698–3702 (2013)
  • Hongwei Gao, Kar Hoo Patrick Tung, Jinghua Teng, Soo Jin Chua, and Ning Xiang

Scattering

  • Applied Optics Vol. 52, Iss. 16, pp. 3662–3670 (2013)
  • Jeremy Coupland, Rahul Mandal, Kanik Palodhi, and Richard Leach

Thin Films

  • Applied Optics Vol. 52, Iss. 16, pp. 3829–3832 (2013)
  • Fabian D. J. Brunner and Thomas Feurer

  • Applied Optics Vol. 52, Iss. 16, pp. 3884–3890 (2013)
  • Jinesh Mathew, Yuliya Semenova, and Gerald Farrell

X-ray Optics

  • Applied Optics Vol. 52, Iss. 16, pp. 3845–3848 (2013)
  • Sho Amano, Tomoaki Inoue, and Tetsuo Harada

Diffraction and Gratings

  • Applied Optics Vol. 52, Iss. 16, pp. 3802–3811 (2013)
  • Ryoichi Horisaki, Martin Piponnier, Guillaume Druart, Nicolas Guérineau, Jérôme Primot, François Goudail, Jean Taboury, and Jun Tanida

Holography

  • Applied Optics Vol. 52, Iss. 16, pp. 3790–3801 (2013)
  • Daniel R. Guildenbecher, Jian Gao, Phillip L. Reu, and Jun Chen

Image Processing

  • Applied Optics Vol. 52, Iss. 16, pp. 3777–3789 (2013)
  • Xiangzhi Bai

Imaging Systems

  • Applied Optics Vol. 52, Iss. 16, pp. 3680–3688 (2013)
  • In Yeop Jang, Min Ki Park, and Kwan H. Lee

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 16, pp. 3689–3697 (2013)
  • Dayong Zhou, Peter G. LoPresti, and Hazem H. Refai

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 16, pp. 3732–3736 (2013)
  • Yanchao Zhang, Zhaoshuo Tian, Zhenghe Sun, Lili Wang, and Qi Wang

  • Applied Optics Vol. 52, Iss. 16, pp. 3753–3756 (2013)
  • Mohd. Zamani Zulkifli, Harith Ahmad, Jaffar Mohamed Taib, Farah Diana Muhammad, Kaharudin Dimyati, and Sulaiman Wadi Harun

  • Applied Optics Vol. 52, Iss. 16, pp. 3764–3769 (2013)
  • A. K. Abass, M. H. Al-Mansoori, M. Z. Jamaludin, F. Abdullah, and T. F. Al-Mashhadani

  • Applied Optics Vol. 52, Iss. 16, pp. 3824–3828 (2013)
  • David E. Zelmon, Jessica M. Northridge, Nicholas D. Haynes, Dan Perlov, and Klaus Petermann

  • Applied Optics Vol. 52, Iss. 16, pp. 3833–3837 (2013)
  • Tao Deng, Zheng-Mao Wu, Yi-Yuan Xie, Jia-Gui Wu, Xi Tang, Li Fan, Krassimir Panajotov, and Guang-Qiong Xia

  • Applied Optics Vol. 52, Iss. 16, pp. 3849–3855 (2013)
  • Mario González-Cardel, Pedro Arguijo, and Rufino Díaz-Uribe

Materials

  • Applied Optics Vol. 52, Iss. 16, pp. 3745–3752 (2013)
  • T. Fathollahi Khalkhali, B. Rezaei, A. Soltani Vala, and M. Kalafi

Optical Devices

  • Applied Optics Vol. 52, Iss. 16, pp. 3737–3744 (2013)
  • Yin Xu, Jiayuan Wang, Jinbiao Xiao, and Xiaohan Sun

Scattering

  • Applied Optics Vol. 52, Iss. 16, pp. 3770–3776 (2013)
  • Aldo Minardo, Giuseppe Porcaro, Daniele Giannetta, Romeo Bernini, and Luigi Zeni

Ultrafast Optics

  • Applied Optics Vol. 52, Iss. 16, pp. 3818–3823 (2013)
  • Dinghuan Deng, Weiqing Gao, Meisong Liao, Zhongchao Duan, Tonglei Cheng, Takenobu Suzuki, and Yasutake Ohishi
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