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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 18 — Jun. 20, 2013
  • pp: 4083–4418

Optics InfoBase > Applied Optics > Volume 52 > Issue 18 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Detectors
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Microscopy
  • Optical Design and Fabrication
  • Optical Devices
  • Physical Optics
  • Quantum Optics
  • Remote Sensing and Sensors
  • Scattering
  • Spectroscopy
  • Thin Films
  • Ultrafast Optics
  • X-ray Optics
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Detectors

  • Applied Optics Vol. 52, Iss. 18, pp. 4334–4342 (2013)
  • Daniel L. Marks, Nathan Hagen, Mark Durham, and David J. Brady

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 18, pp. 4223–4227 (2013)
  • Zhenbin Qi, Hui Huang, Tun Cao, Pengbo Liu, Zhenan Tang, and Bo Qu

  • Applied Optics Vol. 52, Iss. 18, pp. 4323–4328 (2013)
  • Xin Wang, Shuqin Lou, and Wenliang Lu

  • Applied Optics Vol. 52, Iss. 18, pp. 4137–4150 (2013)
  • Psang Dain Lin

  • Applied Optics Vol. 52, Iss. 18, pp. 4151–4162 (2013)
  • Psang Dain Lin

Imaging Systems

  • Applied Optics Vol. 52, Iss. 18, pp. 4111–4122 (2013)
  • Byoung-Joon Seo, Carl Nissly, Mitchell Troy, George Angeli, Robert Bernier, Larry Stepp, and Eric Williams

  • Applied Optics Vol. 52, Iss. 18, pp. 4360–4369 (2013)
  • Thomas Travaillot, Søren Dohn, Anja Boisen, and Fabien Amiot

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 18, pp. 4237–4241 (2013)
  • Juanning Zhao, Xiaona Dong, Limin Gao, and Hongguang Li

  • Applied Optics Vol. 52, Iss. 18, pp. 4370–4376 (2013)
  • Hua Chen, Huaijiang Yang, Xinfeng Yu, and Zhenguang Shi

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 18, pp. 4404–4411 (2013)
  • V. K. Saini

Medical Optics and Biotechnology

  • Applied Optics Vol. 52, Iss. 18, pp. 4400–4403 (2013)
  • Sheng-Hua Lu, Chia-Jung Chang, and Ching-Fen Kao

Microscopy

  • Applied Optics Vol. 52, Iss. 18, pp. 4131–4136 (2013)
  • Victor V. Kotlyar, Sergey S. Stafeev, and Alexey A. Kovalev

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 18, pp. 4186–4191 (2013)
  • M. Wichmann, A. S. Mondol, N. Kocic, S. Lippert, T. Probst, M. Schwerdtfeger, S. Schumann, T. Hochrein, P. Heidemeyer, M. Bastian, G. Bastian, and M. Koch

  • Applied Optics Vol. 52, Iss. 18, pp. 4273–4278 (2013)
  • Linling Qin, Lin Qian, and Jingchi Yu

  • Applied Optics Vol. 52, Iss. 18, pp. 4279–4286 (2013)
  • Alexis Speck, Benedikt Zelzer, Marc Kannengießer, Achim Langenbucher, and Timo Eppig

  • Applied Optics Vol. 52, Iss. 18, pp. 4412–4418 (2013)
  • Weiwei Zhu, Lei Zhang, Yangyang Lu, Ping Zhou, and Lin Yang

Optical Devices

  • Applied Optics Vol. 52, Iss. 18, pp. 4103–4110 (2013)
  • S. Höll, M. Haupt, and U. H. P. Fischer

  • Applied Optics Vol. 52, Iss. 18, pp. 4353–4359 (2013)
  • Hongxia Zhang, Yaguang Ren, Tiegen Liu, Dagong Jia, and Yimo Zhang

Physical Optics

  • Applied Optics Vol. 52, Iss. 18, pp. 4311–4322 (2013)
  • Andrew F. Kurtz and Joseph R. Bietry

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 18, pp. 4242–4248 (2013)
  • Chunmin Zhang, Lin Lu, and Jingjing Ai

Scattering

  • Applied Optics Vol. 52, Iss. 18, pp. 4083–4090 (2013)
  • Sven Leyre, Frédéric B. Leloup, Jan Audenaert, Guy Durinck, Johan Hofkens, Geert Deconinck, and Peter Hanselaer

Spectroscopy

  • Applied Optics Vol. 52, Iss. 18, pp. 4192–4199 (2013)
  • Tarek A. Al-Saeed

Thin Films

  • Applied Optics Vol. 52, Iss. 18, pp. 4287–4293 (2013)
  • R. A. S. Ribeiro, J. F. M. Domenegueti, and S. C. Zilio

X-ray Optics

  • Applied Optics Vol. 52, Iss. 18, pp. 4294–4310 (2013)
  • M. F. Tesch, M. C. Gilbert, H.-Ch. Mertins, D. E. Bürgler, U. Berges, and C. M. Schneider

Fourier Optics and Signal Processing

  • Applied Optics Vol. 52, Iss. 18, pp. 4163–4170 (2013)
  • Vasily Ezhov, Natalya Vasilyeva, Stepan Andreev, Vladlen Korobkin, Vitaly Trofimov, Peter Ivashkin, Olga Garanina, and Ivan Randoshkin

  • Applied Optics Vol. 52, Iss. 18, pp. 4343–4352 (2013)
  • Sudheesh K. Rajput and Naveen K. Nishchal

Holography

  • Applied Optics Vol. 52, Iss. 18, pp. 4097–4102 (2013)
  • Masatoshi Imbe and Takanori Nomura

  • Applied Optics Vol. 52, Iss. 18, pp. 4391–4399 (2013)
  • Yijie Pan, Yongtian Wang, Juan Liu, Xin Li, Jia Jia, and Zhao Zhang

Image Processing

  • Applied Optics Vol. 52, Iss. 18, pp. 4385–4390 (2013)
  • Belen Ferrer, Juan C. Pomares, Ramon Irles, Julian Espinosa, and David Mas

Imaging Systems

  • Applied Optics Vol. 52, Iss. 18, pp. 4200–4211 (2013)
  • Xu Ma, Chunying Han, Yanqiu Li, Bingliang Wu, Zhiyang Song, Lisong Dong, and Gonzalo R. Arce

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 18, pp. 4091–4096 (2013)
  • Xiao Wang, Lishuang Feng, Baoyin Yao, and Xiaoyuan Ren

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 52, Iss. 18, pp. 4249–4257 (2013)
  • Junfang Lin, Wenxi Cao, Guifeng Wang, and Shuibo Hu

Detectors

  • Applied Optics Vol. 52, Iss. 18, pp. 4171–4178 (2013)
  • Cunguang Zhu, Jun Chang, Pengpeng Wang, Weijie Wang, Qiang Wang, Yongning Liu, Guangping Lv, Xiangzhi Liu, Wei Wei, Fupeng Wang, and SaSa Zhang

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 18, pp. 4258–4263 (2013)
  • David Hillier, Colin Danson, Stuart Duffield, David Egan, Stephen Elsmere, Mark Girling, Ewan Harvey, Nicholas Hopps, Michael Norman, Stefan Parker, Paul Treadwell, David Winter, and Thomas Bett

  • Applied Optics Vol. 52, Iss. 18, pp. 4329–4333 (2013)
  • Wenjuan Han, Hongying Yi, Qibiao Dai, Kui Wu, Huaijin Zhang, Linhua Xia, and Junhai Liu

Materials

  • Applied Optics Vol. 52, Iss. 18, pp. 4123–4130 (2013)
  • Viatcheslav Vanyukov, Tatyana Mogileva, Gennady Mikheev, Aleksey Puzir, Vladimir Bondar, and Yuri Svirko

  • Applied Optics Vol. 52, Iss. 18, pp. 4377–4384 (2013)
  • V. V. Filippov

Physical Optics

  • Applied Optics Vol. 52, Iss. 18, pp. 4228–4236 (2013)
  • Abbas Ghasempour Ardakani

Quantum Optics

  • Applied Optics Vol. 52, Iss. 18, pp. 4264–4272 (2013)
  • Nuo Ba, Lei Wang, Xiang-Yao Wu, Xiao-Jing Liu, Hai-Hua Wang, Cui-Li Cui, and Ai-Jun Li

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 18, pp. 4179–4185 (2013)
  • Jia Li, Hongchao Zhang, Chenyin Ni, and Zhonghua Shen

Ultrafast Optics

  • Applied Optics Vol. 52, Iss. 18, pp. 4212–4222 (2013)
  • Atoosa Sadat Arabanian and Reza Massudi
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