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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 19 — Jul. 1, 2013
  • pp: 4419–4762

Optics InfoBase > Applied Optics > Volume 52 > Issue 19 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Detectors
  • Fiber Optics and Optical Communications
  • Holography
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Machine Vision
  • Materials
  • Medical Optics and Biotechnology
  • Optoelectronics
  • Physical Optics
  • Remote Sensing and Sensors
  • Scattering
  • Solar Energy
  • Spectroscopy
  • Thin Films
  • X-ray Optics
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Editorial

  • Applied Optics Vol. 52, Iss. 19, pp. ED7–ED7 (2013)
  • Joseph N. Mait

Detectors

  • Applied Optics Vol. 52, Iss. 19, pp. 4468–4476 (2013)
  • Idzi Merta, Zbigniew Hołdyński, and Leszek R. Jaroszewicz

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 19, pp. 4462–4467 (2013)
  • Chunning Huang, Yun Liu, and Alexander Aleksandrov

Holography

  • Applied Optics Vol. 52, Iss. 19, pp. 4728–4737 (2013)
  • Chen Yang, Xiaorui Wang, Yin Xu, Xin Wu, Yujiao Chen, and Jianqi Zhang

Imaging Systems

  • Applied Optics Vol. 52, Iss. 19, pp. 4494–4504 (2013)
  • Xuan Hung Nguyen, Soo-Hong Lee, and Han Seo Ko

  • Applied Optics Vol. 52, Iss. 19, pp. 4515–4526 (2013)
  • Stephen J. Olivas, Yaron Rachlin, Lydia Gu, Brian Gardiner, Robin Dawson, Juha-Pekka Laine, and Joseph E. Ford

  • Applied Optics Vol. 52, Iss. 19, pp. 4724–4727 (2013)
  • Sedigheh Najafi and Khosro Madanipour

  • Applied Optics Vol. 52, Iss. 19, pp. 4755–4762 (2013)
  • H. Ruan, M. L. Mather, and S. P. Morgan

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 19, pp. 4556–4565 (2013)
  • Allar Saviauk, Stefano Minardi, Felix Dreisow, Stefan Nolte, and Thomas Pertsch

  • Applied Optics Vol. 52, Iss. 19, pp. 4652–4662 (2013)
  • Wee Keat Chong, Xiang Li, and Yeng Chai Soh

  • Applied Optics Vol. 52, Iss. 19, pp. 4738–4742 (2013)
  • Xing Zhong and Guang Jin

Integrated Optics

  • Applied Optics Vol. 52, Iss. 19, pp. 4438–4445 (2013)
  • Md. Sohel Mahmud Sher, Paolo Pintus, and Fabrizio Di Pasquale

  • Applied Optics Vol. 52, Iss. 19, pp. 4510–4514 (2013)
  • R. Bruck, P. Muellner, N. Kataeva, A. Koeck, S. Trassl, V. Rinnerbauer, K. Schmidegg, and R. Hainberger

  • Applied Optics Vol. 52, Iss. 19, pp. 4631–4639 (2013)
  • Ji-an Chen, Di Huang, Hai-tao Zhao, Quan-bao Wang, Ye Qiu, and Deng-ping Duan

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 19, pp. 4566–4575 (2013)
  • Lei Gong, Yu-Xuan Ren, Guo-Sheng Xue, Qian-Chang Wang, Jin-Hua Zhou, Min-Cheng Zhong, Zi-Qiang Wang, and Yin-Mei Li

  • Applied Optics Vol. 52, Iss. 19, pp. 4608–4612 (2013)
  • Wen Cheng, Wei Han, and Qiwen Zhan

Materials

  • Applied Optics Vol. 52, Iss. 19, pp. 4536–4540 (2013)
  • Yongzheng Wen, Wei Ma, Joe Bailey, Guy Matmon, Xiaomei Yu, and Gabriel Aeppli

Medical Optics and Biotechnology

  • Applied Optics Vol. 52, Iss. 19, pp. 4663–4671 (2013)
  • Keigo Iizuka

Optoelectronics

  • Applied Optics Vol. 52, Iss. 19, pp. 4576–4581 (2013)
  • Ming Lei, Lishuang Feng, Yinzhou Zhi, and Huilan Liu

Physical Optics

  • Applied Optics Vol. 52, Iss. 19, pp. 4527–4535 (2013)
  • Wenjun He, Yuegang Fu, Yang Zheng, Lei Zhang, Jiake Wang, Zhiying Liu, and Jianping Zheng

Scattering

  • Applied Optics Vol. 52, Iss. 19, pp. 4749–4754 (2013)
  • Niklas Johansson, Magnus Neuman, Mattias Andersson, and Per Edström

Solar Energy

  • Applied Optics Vol. 52, Iss. 19, pp. 4596–4600 (2013)
  • Naum Fraidenraich, Manoel Henrique de Oliveira Pedrosa Filho, Olga C. Vilela, and Jeffrey M. Gordon

Spectroscopy

  • Applied Optics Vol. 52, Iss. 19, pp. 4433–4437 (2013)
  • M. Naftaly, J. F. Molloy, G. V. Lanskii, K. A. Kokh, and Yu. M. Andreev

  • Applied Optics Vol. 52, Iss. 19, pp. 4477–4482 (2013)
  • Milan Milosevic and Sean W. King

  • Applied Optics Vol. 52, Iss. 19, pp. 4613–4619 (2013)
  • Jana Jágerská, Béla Tuzson, Herbert Looser, Alfredo Bismuto, Jérôme Faist, Heino Prinz, and Lukas Emmenegger

Thin Films

  • Applied Optics Vol. 52, Iss. 19, pp. 4590–4595 (2013)
  • Tatiana V. Amotchkina

X-ray Optics

  • Applied Optics Vol. 52, Iss. 19, pp. 4582–4589 (2013)
  • Kenneth P. MacCabe, Andrew D. Holmgren, Martin P. Tornai, and David J. Brady

Detectors

  • Applied Optics Vol. 52, Iss. 19, pp. 4715–4723 (2013)
  • M. Stanislas, D. G. Abdelsalam, and S. Coudert

Holography

  • Applied Optics Vol. 52, Iss. 19, pp. 4743–4748 (2013)
  • Adam Kowalczyk, Marcin Bieda, Michal Makowski, Maciej Sypek, and Andrzej Kolodziejczyk

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 19, pp. 4419–4425 (2013)
  • Qing Zhong, Yifan Peng, Haifeng Li, Chen Su, Weidong Shen, and Xu Liu

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 19, pp. 4601–4607 (2013)
  • W. J. Peng, F. P. Yan, Q. Li, S. Liu, T. Feng, S. Y. Tan, and S. C. Feng

Machine Vision

  • Applied Optics Vol. 52, Iss. 19, pp. 4483–4493 (2013)
  • Hui-Liang Shen and Zhi-Huan Zheng

  • Applied Optics Vol. 52, Iss. 19, pp. 4681–4692 (2013)
  • Marcin Malesa and Malgorzata Kujawinska

Spectroscopy

  • Applied Optics Vol. 52, Iss. 19, pp. 4620–4630 (2013)
  • Naum K. Berger

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 52, Iss. 19, pp. 4672–4680 (2013)
  • William P. Burckel and Ryan N. Gray

  • Applied Optics Vol. 52, Iss. 19, pp. 4706–4714 (2013)
  • Yahui Yan, Bingqi Liu, Bing Zhou, and Dongsheng Wu

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 19, pp. 4505–4509 (2013)
  • Gautam Prabhakar, Akshit Peer, Vipul Rastogi, and Ajeet Kumar

  • Applied Optics Vol. 52, Iss. 19, pp. 4541–4548 (2013)
  • Siwen Zheng, Guobin Ren, Zhen Lin, and Shuisheng Jian

Holography

  • Applied Optics Vol. 52, Iss. 19, pp. 4426–4432 (2013)
  • Benjamin P. Thiesing, Christopher J. Mann, and Sebastien Dryepondt

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 19, pp. 4549–4555 (2013)
  • Guochen Wang, Guyin Rao, Songlai Han, Mei Zhang, and Baolun Yuan

  • Applied Optics Vol. 52, Iss. 19, pp. 4693–4697 (2013)
  • Chunhua Wang, Xiang Zhang, Zhibin Ye, Chong Liu, and Jun Chen

Physical Optics

  • Applied Optics Vol. 52, Iss. 19, pp. 4698–4705 (2013)
  • Cristina Sánchez López de Pablo, Julio Alberto Ramos Ávila, Tamara Fernández Cabada, Francisco del Pozo Guerrero, and José Javier Serrano Olmedo

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 19, pp. 4446–4461 (2013)
  • James B. Abshire, Haris Riris, Clark J. Weaver, Jianping Mao, Graham R. Allan, William E. Hasselbrack, and Edward V. Browell

Scattering

  • Applied Optics Vol. 52, Iss. 19, pp. 4640–4651 (2013)
  • Ziyu Gu, Benjamin Witschas, Willem van de Water, and Wim Ubachs
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