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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 20 — Jul. 10, 2013
  • pp: 4763–5049

Optics InfoBase > Applied Optics > Volume 52 > Issue 20 > Table of Contents

Topics in this Issue

 
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Nonlinear Optics
  • Optical Devices
  • Optics at Surfaces
  • Remote Sensing and Sensors
  • Scattering
  • Spectroscopy
  • Ultrafast Optics
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Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 20, pp. 4849–4853 (2013)
  • Chun-Hong Lee, Chih-Wei Wu, Chun-Wei Chen, Hung-Chang Jau, and Tsung-Hsien Lin

  • Applied Optics Vol. 52, Iss. 20, pp. 4991–4996 (2013)
  • M. Junaid Amin and Nabeel A. Riza

Image Processing

  • Applied Optics Vol. 52, Iss. 20, pp. 4792–4796 (2013)
  • B. D. Strycker, K. Wang, M. Springer, and A.V. Sokolov

Imaging Systems

  • Applied Optics Vol. 52, Iss. 20, pp. 4911–4914 (2013)
  • Fei Wu, Huan Deng, Cheng-Gao Luo, Da-Hai Li, and Qiong-Hua Wang

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 20, pp. 4806–4812 (2013)
  • Christopher P. Ball, Andrew P. Levick, Emma R. Woolliams, Paul D. Green, Martin R. Dury, Rainer Winkler, Andrew J. Deadman, Nigel P. Fox, and Martin D. King

  • Applied Optics Vol. 52, Iss. 20, pp. 4922–4932 (2013)
  • Tyler M. McCracken, Colby A. Jurgenson, Chris A. Haniff, David F. Buscher, John S. Young, and Michelle Creech-Eakman

Materials

  • Applied Optics Vol. 52, Iss. 20, pp. 4820–4826 (2013)
  • Sanjib Chatterjee and Y. Pavan Kumar

Medical Optics and Biotechnology

  • Applied Optics Vol. 52, Iss. 20, pp. 4933–4940 (2013)
  • Hakan Erkol and Mehmet Burcin Unlu

  • Applied Optics Vol. 52, Iss. 20, pp. 5036–5041 (2013)
  • Hao Yang and Huabei Jiang

Nonlinear Optics

  • Applied Optics Vol. 52, Iss. 20, pp. 4813–4819 (2013)
  • Matthew Marko, Andrzej Veitia, Xiujian Li, and Jiangjun Zheng

Optical Devices

  • Applied Optics Vol. 52, Iss. 20, pp. 4884–4889 (2013)
  • Kaiyang Wang, Xiaoqi Liu, Changqiu Yu, and Yundong Zhang

Optics at Surfaces

  • Applied Optics Vol. 52, Iss. 20, pp. 4797–4805 (2013)
  • Masaki Kotani, Tadashi Imai, Haruyoshi Katayama, Yukari Yui, Yoshio Tange, Hidehiro Kaneda, Takao Nakagawa, and Keigo Enya

Scattering

  • Applied Optics Vol. 52, Iss. 20, pp. 4997–5006 (2013)
  • Yang Li and Nicola Bowler

Spectroscopy

  • Applied Optics Vol. 52, Iss. 20, pp. 4877–4883 (2013)
  • Xiaojun Wu, Baogang Quan, Xuecong Pan, Xinlong Xu, Xinchao Lu, Xiaoxiang Xia, Junjie Li, Changzhi Gu, and Li Wang

Holography

  • Applied Optics Vol. 52, Iss. 20, pp. 4864–4870 (2013)
  • Xianfeng Xu, Guangcan Lu, Guoxia Han, Fei Gao, Zhiyong Jiao, and Dailin Li

  • Applied Optics Vol. 52, Iss. 20, pp. 4871–4876 (2013)
  • Yusuke Sando, Daisuke Barada, and Toyohiko Yatagai

Image Processing

  • Applied Optics Vol. 52, Iss. 20, pp. 4898–4910 (2013)
  • Suwatwong Janchaysang, Sarun Sumriddetchkajorn, and Prathan Buranasiri

  • Applied Optics Vol. 52, Iss. 20, pp. 4959–4968 (2013)
  • E. T. Koufogiannis, N. P. Sgouros, and M. S. Sangriotis

  • Applied Optics Vol. 52, Iss. 20, pp. 5022–5029 (2013)
  • Fengtao Xiang, Zhengzhi Wang, and Xingsheng Yuan

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 20, pp. 4890–4897 (2013)
  • Jinxiong Xu, Yufei Liu, Bo Dong, Yulei Bai, Linlin Hu, Cong Shi, Zhuoming Xu, and Yanzhou Zhou

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 20, pp. 4854–4857 (2013)
  • Pengfei Ma, Pu Zhou, Yanxing Ma, Rongtao Su, Xiaojun Xu, and Zejin Liu

  • Applied Optics Vol. 52, Iss. 20, pp. 4915–4921 (2013)
  • Jonas H. Osório and Cristiano M. B. Cordeiro

Fourier Optics and Signal Processing

  • Applied Optics Vol. 52, Iss. 20, pp. 5030–5035 (2013)
  • Eyal Feigenbaum, Richard A. Sacks, Kathleen P. McCandless, and Brian J. MacGowan

Imaging Systems

  • Applied Optics Vol. 52, Iss. 20, pp. 4763–4778 (2013)
  • Ove Steinvall, Magnus Elmqvist, Tomas Chevalier, and Ove Gustafsson

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 20, pp. 4779–4791 (2013)
  • Gaetano Magnotti, Andrew D. Cutler, and Paul M. Danehy

  • Applied Optics Vol. 52, Iss. 20, pp. 4827–4842 (2013)
  • Chang Liu, Lijun Xu, and Zhang Cao

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 20, pp. 4858–4863 (2013)
  • Xingkun Ma, Lei Huang, Mali Gong, Qiang Liu, Haitao Zhang, and Ping Yan

  • Applied Optics Vol. 52, Iss. 20, pp. 4950–4958 (2013)
  • Mohammad Zabetian, Mohammad Said Saidi, Mohammad Behshad Shafii, and Mohammad Hassan Saidi

Nonlinear Optics

  • Applied Optics Vol. 52, Iss. 20, pp. 4843–4848 (2013)
  • Mohammad Reza Rashidian Vaziri

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 20, pp. 4941–4949 (2013)
  • Didier Bruneau, Frédéric Blouzon, Joseph Spatazza, Franck Montmessin, Jacques Pelon, and Benoît Faure

Spectroscopy

  • Applied Optics Vol. 52, Iss. 20, pp. 4969–4980 (2013)
  • Hiroshi Suto, Jun Yoshida, Raphael Desbiens, Takahiro Kawashima, and Akihiko Kuze

  • Applied Optics Vol. 52, Iss. 20, pp. 4981–4990 (2013)
  • Quanhua Liu, Y. Xue, and C. Li

  • Applied Optics Vol. 52, Iss. 20, pp. 5007–5021 (2013)
  • K. C. Utsav and Philip L. Varghese

Ultrafast Optics

  • Applied Optics Vol. 52, Iss. 20, pp. 5042–5049 (2013)
  • Xian Jin, Christopher M. Collier, Jamieson J. A. Garbowski, Brandon Born, and Jonathan F. Holzman
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