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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 23 — Aug. 10, 2013
  • pp: 5577–5868

Optics InfoBase > Applied Optics > Volume 52 > Issue 23 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Atomic and Molecular Physics
  • Coherence and Statistical Optics
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Geometric Optics
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Machine Vision
  • Materials
  • Microscopy
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Optoelectronics
  • Physical Optics
  • Scattering
  • Spectroscopy
  • Thin Films
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Coherence and Statistical Optics

  • Applied Optics Vol. 52, Iss. 23, pp. 5619–5630 (2013)
  • Guangzhi Zhu, Xiao Zhu, and Changhong Zhu

Diffraction and Gratings

  • Applied Optics Vol. 52, Iss. 23, pp. 5822–5829 (2013)
  • Alejandro Calabuig, Sergio Sánchez-Ruiz, Lluís Martínez-León, Enrique Tajahuerce, Mercedes Fernández-Alonso, Walter D. Furlan, Juan A. Monsoriu, and Amparo Pons-Martí

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 23, pp. 5659–5662 (2013)
  • Mable P. Fok

  • Applied Optics Vol. 52, Iss. 23, pp. 5701–5706 (2013)
  • Zhigang Zang

  • Applied Optics Vol. 52, Iss. 23, pp. 5742–5747 (2013)
  • Spencer Chadderdon, Leeland Woodard, Daniel Perry, Richard H. Selfridge, and Stephen M. Schultz

  • Applied Optics Vol. 52, Iss. 23, pp. 5856–5861 (2013)
  • Zhen Lin, Guobin Ren, Siwen Zheng, Wei Jian, Jingjing Zheng, and Shuisheng Jian

Geometric Optics

  • Applied Optics Vol. 52, Iss. 23, pp. 5577–5584 (2013)
  • Yobani Mejía

  • Applied Optics Vol. 52, Iss. 23, pp. 5591–5599 (2013)
  • Sung-Min Jung and In-Byeong Kang

Imaging Systems

  • Applied Optics Vol. 52, Iss. 23, pp. 5663–5670 (2013)
  • S. A. Hojjatoleslami, M. R. N. Avanaki, and A. Gh. Podoleanu

  • Applied Optics Vol. 52, Iss. 23, pp. 5862–5868 (2013)
  • Dong Won Kang, Minwook Kang, and Jae W. Hahn

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 23, pp. 5640–5644 (2013)
  • Irmantas Kašalynas, Rimvydas Venckevičius, Laurynas Tumonis, Bogdan Voisiat, Dalius Seliuta, Gintaras Valušis, and Gediminas Račiukaitis

  • Applied Optics Vol. 52, Iss. 23, pp. 5748–5757 (2013)
  • Alba Peinado, Angel Lizana, and Juan Campos

  • Applied Optics Vol. 52, Iss. 23, pp. 5773–5780 (2013)
  • Kuo-Chen Lang, Hung-Jin Teng, and Hui-Kang Teng

Machine Vision

  • Applied Optics Vol. 52, Iss. 23, pp. 5676–5685 (2013)
  • Junhua Sun, Jie Zhang, Zhen Liu, and Guangjun Zhang

Microscopy

  • Applied Optics Vol. 52, Iss. 23, pp. 5718–5723 (2013)
  • Michael A. Taylor and Warwick P. Bowen

  • Applied Optics Vol. 52, Iss. 23, pp. 5835–5842 (2013)
  • S. Hoda Moosavi, Cristian Gohn-Kreuz, and Alexander Rohrbach

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 23, pp. 5611–5618 (2013)
  • Sourav Pal and Lakshminarayan Hazra

  • Applied Optics Vol. 52, Iss. 23, pp. 5686–5694 (2013)
  • Yongfu Wen, Haobo Cheng, Hon-Yuen Tam, and Dongmei Zhou

  • Applied Optics Vol. 52, Iss. 23, pp. 5724–5732 (2013)
  • Sourav Pal

  • Applied Optics Vol. 52, Iss. 23, pp. 5781–5787 (2013)
  • Hongyu Li, David Walker, Guoyu Yu, and Wei Zhang

Optical Devices

  • Applied Optics Vol. 52, Iss. 23, pp. 5653–5658 (2013)
  • Manish Kumar and Joby Joseph

Optics at Surfaces

  • Applied Optics Vol. 52, Iss. 23, pp. 5695–5700 (2013)
  • Guanlin Liu, Mingxia He, Zhen Tian, Jingyan Li, and Jiazheng Liu

Thin Films

  • Applied Optics Vol. 52, Iss. 23, pp. 5585–5590 (2013)
  • Bingwei Zheng, Shanshan Huang, Chenwei Zhai, Chao Wang, Mingwei Zhu, and Yanfeng Chen

  • Applied Optics Vol. 52, Iss. 23, pp. 5788–5793 (2013)
  • Jinlong Zhang, Yujiang Xie, Xinbin Cheng, Hongfei Jiao, and Zhanshan Wang

Image Processing

  • Applied Optics Vol. 52, Iss. 23, pp. 5645–5652 (2013)
  • Desheng Fan, Xiangfeng Meng, Yurong Wang, Xiulun Yang, Xiang Peng, Wenqi He, Guoyan Dong, and Hongyi Chen

Scattering

  • Applied Optics Vol. 52, Iss. 23, pp. 5707–5712 (2013)
  • Jianqi Shen and Xiaowei Jia

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 52, Iss. 23, pp. 5631–5639 (2013)
  • Susan Kay, John Hedley, and Samantha Lavender

Atomic and Molecular Physics

  • Applied Optics Vol. 52, Iss. 23, pp. 5713–5717 (2013)
  • Nathan Cooper, Jonathan Woods, James Bateman, Alexander Dunning, and Tim Freegarde

Diffraction and Gratings

  • Applied Optics Vol. 52, Iss. 23, pp. 5830–5834 (2013)
  • Pavel G. Serafimovich, Nikolay L. Kazanskiy, and Svetlana N. Khonina

  • Applied Optics Vol. 52, Iss. 23, pp. 5843–5850 (2013)
  • Grigoriy I. Greisukh, Evgeniy G. Ezhov, Zoya A. Sidyakina, and Sergei A. Stepanov

  • Applied Optics Vol. 52, Iss. 23, pp. 5851–5855 (2013)
  • Chih-Tsang Hung, Tsung-Lin Ho, and Tien-Chang Lu

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 23, pp. 5794–5802 (2013)
  • Xifeng Xiao and David Voelz

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 23, pp. 5758–5765 (2013)
  • Konstantinos Falaggis, David P. Towers, and Catherine E. Towers

Integrated Optics

  • Applied Optics Vol. 52, Iss. 23, pp. 5803–5815 (2013)
  • Murtaza Askari and Ali Adibi

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 23, pp. 5766–5772 (2013)
  • Boualem Boubaha, Darryl Naidoo, Thomas Godin, Michael Fromager, Andrew Forbes, and Kamel Aït-Ameur

Materials

  • Applied Optics Vol. 52, Iss. 23, pp. 5671–5675 (2013)
  • Guanghui Hao, Mingzhu Yang, Benkang Chang, Xinlong Chen, Junju Zhang, and Xiaoqian Fu

Optical Devices

  • Applied Optics Vol. 52, Iss. 23, pp. 5816–5821 (2013)
  • Wen Bin and Ka-Di Zhu

Optoelectronics

  • Applied Optics Vol. 52, Iss. 23, pp. 5733–5741 (2013)
  • Yusheng Bian and Qihuang Gong

Physical Optics

  • Applied Optics Vol. 52, Iss. 23, pp. 5606–5610 (2013)
  • Yin Yu, Feng Song, Chengguo Ming, Jun Zhang, and Fengxiao Wang

Spectroscopy

  • Applied Optics Vol. 52, Iss. 23, pp. 5600–5605 (2013)
  • Qi Zhou, Yuqi Chen, Feifei Peng, Xuejiao Yang, and Runhua Li
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