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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 32 — Nov. 10, 2013
  • pp: 7669–7850

Optics InfoBase > Applied Optics > Volume 52 > Issue 32 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Detectors
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Holography
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Microscopy
  • Optical Devices
  • Remote Sensing and Sensors
  • Thin Films
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Atmospheric and Oceanic Optics

  • Applied Optics Vol. 52, Iss. 32, pp. 7732–7744 (2013)
  • Minsu Kim, Joong Yong Park, Yuri Kopilevich, Grady Tuell, and William Philpot

Detectors

  • Applied Optics Vol. 52, Iss. 32, pp. 7675–7681 (2013)
  • Mahdi Zavvari and Vahid Ahmadi

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 32, pp. 7706–7711 (2013)
  • Ting Feng, Micah H. Jenkins, Fengping Yan, and Thomas K. Gaylord

  • Applied Optics Vol. 52, Iss. 32, pp. 7712–7717 (2013)
  • Junjie Wang, Lishuang Feng, Yinzhou Zhi, Huilan Liu, Wei Wang, and Ming Lei

  • Applied Optics Vol. 52, Iss. 32, pp. 7755–7758 (2013)
  • Aram Zeytunyan, Garegin Yesayan, and Levon Mouradian

  • Applied Optics Vol. 52, Iss. 32, pp. 7759–7768 (2013)
  • Jue-Ling Li, Chun-Can Wang, and Wei-Qiang Wang

  • Applied Optics Vol. 52, Iss. 32, pp. 7821–7825 (2013)
  • Huilan Liu, Wei Wang, Junjie Wang, Lishuang Feng, and Yinzhou Zhi

Fourier Optics and Signal Processing

  • Applied Optics Vol. 52, Iss. 32, pp. 7812–7820 (2013)
  • N. Manivannan, M. A. A. Neil, and W. Balachandran

Holography

  • Applied Optics Vol. 52, Iss. 32, pp. 7826–7831 (2013)
  • Marc SeGall, Daniel Ott, Ivan Divliansky, and Leonid B. Glebov

Imaging Systems

  • Applied Optics Vol. 52, Iss. 32, pp. 7745–7754 (2013)
  • David J. Brady, Daniel L. Marks, Kenneth P. MacCabe, and Joseph A. O’Sullivan

  • Applied Optics Vol. 52, Iss. 32, pp. 7778–7784 (2013)
  • Piotr Piatrou and Gary Chanan

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 32, pp. 7669–7674 (2013)
  • Eduardo Fontana and Gustavo Oliveira Cavalcanti

  • Applied Optics Vol. 52, Iss. 32, pp. 7718–7723 (2013)
  • Feipeng Zhu, Hongjian Shi, Pengxiang Bai, Dong Lei, and Xiaoyuan He

  • Applied Optics Vol. 52, Iss. 32, pp. 7724–7731 (2013)
  • Fang Liu, Wei Wang, Lei Wang, and Peide Feng

  • Applied Optics Vol. 52, Iss. 32, pp. 7791–7796 (2013)
  • Geoffrey A. Cranch, Robert Lunsford, Jacob Grün, James Weaver, Steve Compton, Mark May, and Natalie Kostinski

  • Applied Optics Vol. 52, Iss. 32, pp. 7797–7805 (2013)
  • Yueyi Zhang, Zhiwei Xiong, and Feng Wu

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 32, pp. 7769–7777 (2013)
  • Robert Brüning, Philipp Gelszinnis, Christian Schulze, Daniel Flamm, and Michael Duparré

Microscopy

  • Applied Optics Vol. 52, Iss. 32, pp. 7806–7811 (2013)
  • Mary Sajini Devadas, Zhongming Li, Todd A. Major, Shun Shang Lo, Nicolas Havard, Kuai Yu, Paul Johns, and Gregory V. Hartland

Optical Devices

  • Applied Optics Vol. 52, Iss. 32, pp. 7699–7705 (2013)
  • I. A. Grimaldi, S. Coppola, F. Loffredo, F. Villani, G. Nenna, C. Minarini, V. Vespini, L. Miccio, S. Grilli, and P. Ferraro

  • Applied Optics Vol. 52, Iss. 32, pp. 7785–7790 (2013)
  • Seung-Won Oh, Byung Wok Park, Ji-Hoon Lee, and Tae-Hoon Yoon

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 32, pp. 7682–7688 (2013)
  • Tingdong Cai, Guangzhen Gao, and Ying Liu

  • Applied Optics Vol. 52, Iss. 32, pp. 7838–7850 (2013)
  • Zhongtao Cheng, Dong Liu, Yongying Yang, Liming Yang, and Hanlu Huang

Thin Films

  • Applied Optics Vol. 52, Iss. 32, pp. 7689–7698 (2013)
  • H. P. H. Liddell, K. Mehrotra, J. C. Lambropoulos, and S. D. Jacobs

  • Applied Optics Vol. 52, Iss. 32, pp. 7832–7837 (2013)
  • Jeppe S. Clausen, Alexander B. Christiansen, Anders Kristensen, and N. Asger Mortensen
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