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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 33 — Nov. 20, 2013
  • pp: 7851–8183

Optics InfoBase > Applied Optics > Volume 52 > Issue 33 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Coherence and Statistical Optics
  • Detectors
  • Fiber Optics and Optical Communications
  • Geometric Optics
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Optoelectronics
  • Physical Optics
  • Remote Sensing and Sensors
  • Spectroscopy
  • Thin Films
  • X-ray Optics
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Atmospheric and Oceanic Optics

  • Applied Optics Vol. 52, Iss. 33, pp. 7867–7873 (2013)
  • Laura J. Johnson, Roger J. Green, and Mark S. Leeson

  • Applied Optics Vol. 52, Iss. 33, pp. 7987–8000 (2013)
  • Alessandro Beghi, Angelo Cenedese, and Andrea Masiero

  • Applied Optics Vol. 52, Iss. 33, pp. 8032–8039 (2013)
  • Halil T. Eyyuboğlu, David Voelz, and Xifeng Xiao

Coherence and Statistical Optics

  • Applied Optics Vol. 52, Iss. 33, pp. 8176–8183 (2013)
  • Zhiyuan Qin, Rumao Tao, Pu Zhou, Xiaojun Xu, and Zejin Liu

Detectors

  • Applied Optics Vol. 52, Iss. 33, pp. 7934–7941 (2013)
  • Gang Li, Longfei Zhao, Mei Zhou, Mengjun Wang, and Ling Lin

  • Applied Optics Vol. 52, Iss. 33, pp. 8054–8059 (2013)
  • E. Theocharous, S. P. Theocharous, and J. H. Lehman

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 33, pp. 7882–7888 (2013)
  • Wen-Kai Yu, Shen Li, Xu-Ri Yao, Xue-Feng Liu, Ling-An Wu, and Guang-Jie Zhai

  • Applied Optics Vol. 52, Iss. 33, pp. 8013–8023 (2013)
  • Jianxin Zhu and Jia Zheng

Geometric Optics

  • Applied Optics Vol. 52, Iss. 33, pp. 7889–7898 (2013)
  • Chenglong Hao, Shouqian Chen, Wang Zhang, Jinhan Ren, Chong Li, Hongjun Pang, Honghao Wang, Qian Liu, Chao Wang, Huiying Zou, and Zhigang Fan

Holography

  • Applied Optics Vol. 52, Iss. 33, pp. 8142–8145 (2013)
  • A. Yu. Betin, V. I. Bobrinev, S. B. Odinokov, N. N. Evtikhiev, R. S. Starikov, S. N. Starikov, and E. Yu. Zlokazov

Image Processing

  • Applied Optics Vol. 52, Iss. 33, pp. 8106–8116 (2013)
  • Weiwei Cai, Xuesong Li, and Lin Ma

Imaging Systems

  • Applied Optics Vol. 52, Iss. 33, pp. 7899–7903 (2013)
  • Yang Liu, Xiaobing Zhong, Ning Zhong, Changsheng Zheng, and Lizhan Wen

  • Applied Optics Vol. 52, Iss. 33, pp. 7919–7926 (2013)
  • Gang Li, Li Li, Hongbin Shen, Yongqiang He, Jingxia Huang, Shaojuan Mao, and Yuanbo Wang

  • Applied Optics Vol. 52, Iss. 33, pp. 8060–8066 (2013)
  • Manuela Roman, Jean Gonzalez, Jennifer Carrasquilla, Sarah J. Erickson, Rad Akhter, and Anuradha Godavarty

  • Applied Optics Vol. 52, Iss. 33, pp. 8146–8153 (2013)
  • Tomoya Nakamura, David S. Kittle, Seo Ho Youn, Steven D. Feller, Jun Tanida, and David J. Brady

  • Applied Optics Vol. 52, Iss. 33, pp. 8161–8168 (2013)
  • Hiroyuki Suzuki, Masamichi Suzuki, Takuya Urabe, Takashi Obi, Masahiro Yamaguchi, and Nagaaki Ohyama

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 33, pp. 7874–7881 (2013)
  • Hong Zhao, Hubing Du, Jing Li, and Yuwei Qin

  • Applied Optics Vol. 52, Iss. 33, pp. 7950–7962 (2013)
  • Christopher S. Goldenstein, Ian A. Schultz, Jay B. Jeffries, and Ronald K. Hanson

  • Applied Optics Vol. 52, Iss. 33, pp. 7963–7980 (2013)
  • B. Carol Johnson, Maritoni Litorja, Joel B. Fowler, Eric L. Shirley, Robert A. Barnes, and James J. Butler

  • Applied Optics Vol. 52, Iss. 33, pp. 8040–8047 (2013)
  • Haiqing Guo, Jose A. Castillo, and Peter B. Sunderland

  • Applied Optics Vol. 52, Iss. 33, pp. 8067–8072 (2013)
  • M. Inam, V. Srivastava, and D. S. Mehta

  • Applied Optics Vol. 52, Iss. 33, pp. 8082–8088 (2013)
  • Kenneth D. Marr, Christoph R. Englert, John M. Harlander, and Kenneth W. Miller

  • Applied Optics Vol. 52, Iss. 33, pp. 8154–8160 (2013)
  • Robert D. Reasenberg

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 33, pp. 7942–7949 (2013)
  • Qiang Liu, Hailong Hong, Xing Fu, Zhan Sui, Lei Huang, and Mali Gong

  • Applied Optics Vol. 52, Iss. 33, pp. 8008–8012 (2013)
  • Hanwei Zhang, Hu Xiao, Pu Zhou, Xiaolin Wang, and Xiaojun Xu

  • Applied Optics Vol. 52, Iss. 33, pp. 8024–8031 (2013)
  • Yinzhou Zhi, Lishuang Feng, Ming Lei, and Kunbo Wang

Materials

  • Applied Optics Vol. 52, Iss. 33, pp. 8134–8141 (2013)
  • Anthony Dieulangard, Jean-Claude Kastelik, Samuel Dupont, and Joseph Gazalet

Medical Optics and Biotechnology

  • Applied Optics Vol. 52, Iss. 33, pp. 7904–7911 (2013)
  • Keigo Iizuka

Nonlinear Optics

  • Applied Optics Vol. 52, Iss. 33, pp. 8095–8101 (2013)
  • Zhaolu Wang, Hongjun Liu, Nan Huang, Qibing Sun, and Xuefeng Li

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 33, pp. 7851–7858 (2013)
  • Tan Wang, Haobo Cheng, Yong Chen, Yunpeng Feng, Zhichao Dong, and Honyuen Tam

  • Applied Optics Vol. 52, Iss. 33, pp. 7927–7933 (2013)
  • Wenqiang Peng, Chaoliang Guan, and Shengyi Li

Optical Devices

  • Applied Optics Vol. 52, Iss. 33, pp. 7912–7918 (2013)
  • Shengwu Kang, Tong Qing, Hongshi Sang, Xinyu Zhang, and Changsheng Xie

  • Applied Optics Vol. 52, Iss. 33, pp. 7981–7986 (2013)
  • Ping Wang, Guanghua Cheng, Ruimin Yi, Xin Liu, Tao Shang, Zhansheng Wang, and Lixin Guo

Optics at Surfaces

  • Applied Optics Vol. 52, Iss. 33, pp. 8117–8121 (2013)
  • Yikai Chen, Douguo Zhang, Lu Han, Xiangxian Wang, Liangfu Zhu, Pei Wang, and Hai Ming

Optoelectronics

  • Applied Optics Vol. 52, Iss. 33, pp. 8089–8094 (2013)
  • Leila Ahmadi, Jani Tervo, Jyrki Saarinen, and Seppo Honkanen

Physical Optics

  • Applied Optics Vol. 52, Iss. 33, pp. 7859–7866 (2013)
  • Arezoo Zakeri, Mohammad Hossein Miran Baygi, and Khosro Madanipour

  • Applied Optics Vol. 52, Iss. 33, pp. 8169–8175 (2013)
  • Stanislav L. Kuzmin, Michal J. Wesolowski, and Walter W. Duley

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 33, pp. 8073–8081 (2013)
  • Dan Lv, Jian-Feng Sun, Qi Li, and Qi Wang

  • Applied Optics Vol. 52, Iss. 33, pp. 8128–8133 (2013)
  • Milan Nikolić, Elaine Hicks, Yah Leng Lim, Karl Bertling, and Aleksandar D. Rakić

Spectroscopy

  • Applied Optics Vol. 52, Iss. 33, pp. 8001–8007 (2013)
  • Johannes Trost, Lars Zigan, Alfred Leipertz, Dipankar Sahoo, and Paul C. Miles

  • Applied Optics Vol. 52, Iss. 33, pp. 8048–8053 (2013)
  • Paul D. Kunz, Thomas P. Heavner, and Steven R. Jefferts

Thin Films

  • Applied Optics Vol. 52, Iss. 33, pp. 8102–8105 (2013)
  • Darin Rosen, Aritoki Suzuki, Brian Keating, William Krantz, Adrian T. Lee, Erin Quealy, Paul L. Richards, Praween Siritanasak, and William Walker

X-ray Optics

  • Applied Optics Vol. 52, Iss. 33, pp. 8122–8127 (2013)
  • Alexander Rack, Francisco García-Moreno, Lukas Helfen, Manas Mukherjee, Catalina Jiménez, Tatjana Rack, Peter Cloetens, and John Banhart
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