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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 36 — Dec. 20, 2013
  • pp: 8627–8863

Optics InfoBase > Applied Optics > Volume 52 > Issue 36 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Geometric Optics
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Remote Sensing and Sensors
  • Scattering
  • Spectroscopy
  • Thin Films
  • Vision, Color, and Visual Optics
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Atmospheric and Oceanic Optics

  • Applied Optics Vol. 52, Iss. 36, pp. 8650–8660 (2013)
  • Haiyang Gao, Yuanhe Tang, Dengxin Hua, Hanchen Liu, Xiangang Cao, Xiaodong Duan, Qijie Jia, Ouyang Qu, and Yong Wu

  • Applied Optics Vol. 52, Iss. 36, pp. 8685–8705 (2013)
  • Alexander A. Gilerson, Jan Stepinski, Amir I. Ibrahim, Yu You, James M. Sullivan, Michael S. Twardowski, Heidi M. Dierssen, Brandon Russell, Molly E. Cummings, Parrish Brady, Samir A. Ahmed, and George W. Kattawar

Diffraction and Gratings

  • Applied Optics Vol. 52, Iss. 36, pp. 8802–8808 (2013)
  • Jinan Xia, Andrea M. Giovannozzi, Sheila J. Sadeghi, Gianfranco Gilardi, and Andrea M. Rossi

Fiber Optics and Optical Communications

  • Applied Optics Vol. 52, Iss. 36, pp. 8771–8778 (2013)
  • Huilian Ma, Xiao Lu, and Zhonghe Jin

  • Applied Optics Vol. 52, Iss. 36, pp. 8834–8839 (2013)
  • Ping Zhao, Lei Shi, Yang Liu, Zheqi Wang, and Xinliang Zhang

Fourier Optics and Signal Processing

  • Applied Optics Vol. 52, Iss. 36, pp. 8854–8863 (2013)
  • Qu Wang, Qing Guo, and Jinyun Zhou

Geometric Optics

  • Applied Optics Vol. 52, Iss. 36, pp. 8789–8794 (2013)
  • Meng-Che Tsai, Allen Jong-Woei Whang, and Tsung-Xian Lee

Image Processing

  • Applied Optics Vol. 52, Iss. 36, pp. 8627–8633 (2013)
  • Russell Trahan and David Hyland

  • Applied Optics Vol. 52, Iss. 36, pp. 8723–8731 (2013)
  • Pengcheng Yang, Suping Fang, Xindong Zhu, Masaharu Komori, and Aizoh Kubo

Imaging Systems

  • Applied Optics Vol. 52, Iss. 36, pp. 8634–8643 (2013)
  • Shay Elmalem, Naim Konforti, and Emanuel Marom

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 52, Iss. 36, pp. 8644–8649 (2013)
  • Ki-Nam Joo

  • Applied Optics Vol. 52, Iss. 36, pp. 8676–8684 (2013)
  • Alix Preston and Stephen Merkowitz

  • Applied Optics Vol. 52, Iss. 36, pp. 8714–8722 (2013)
  • V. K. Chhaniwal, J. M. Kihiko, S. Dubey, G. Shearon, B. Javidi, and A. Anand

  • Applied Optics Vol. 52, Iss. 36, pp. 8765–8770 (2013)
  • Timothy Cook

Lasers and Laser Optics

  • Applied Optics Vol. 52, Iss. 36, pp. 8732–8746 (2013)
  • Reinald Kallenbach, Eamonn Murphy, Bodo Gramkow, Markus Rech, Kai Weidlich, Thomas Leikert, Reiner Henkelmann, Boris Trefzger, Bodo Metz, Harald Michaelis, Kay Lingenauber, Simone DelTogno, Thomas Behnke, Nicolas Thomas, Daniele Piazza, and Karsten Seiferlin

  • Applied Optics Vol. 52, Iss. 36, pp. 8795–8801 (2013)
  • C. Evangelatos, P. Bakopoulos, G. Tsaknakis, D. Papadopoulos, G. Avdikos, A. Papayannis, and G. Tzeremes

Materials

  • Applied Optics Vol. 52, Iss. 36, pp. 8840–8844 (2013)
  • Jin Yan, Daming Xu, Hui-Chuan Cheng, Shin-Tson Wu, Yi-Fen Lan, and Cheng-Yeh Tsai

Nonlinear Optics

  • Applied Optics Vol. 52, Iss. 36, pp. 8817–8826 (2013)
  • Chi Zhang, P. C. Chui, and Kenneth K. Y. Wong

Optical Design and Fabrication

  • Applied Optics Vol. 52, Iss. 36, pp. 8827–8833 (2013)
  • Qian Zhang, Zhenjie Liu, Wenzi Zhang, and Feihong Yu

Optical Devices

  • Applied Optics Vol. 52, Iss. 36, pp. 8845–8853 (2013)
  • Yijing Chen, Seng-Tiong Ho, and Vivek Krishnamurthy

Optics at Surfaces

  • Applied Optics Vol. 52, Iss. 36, pp. 8809–8816 (2013)
  • Pascal Delange, Ya-Lun Ho, and Jean-Jacques Delaunay

Remote Sensing and Sensors

  • Applied Optics Vol. 52, Iss. 36, pp. 8661–8669 (2013)
  • Erik A. Moro, Matthew E. Briggs, and Lawrence M. Hull

  • Applied Optics Vol. 52, Iss. 36, pp. 8706–8713 (2013)
  • Lijing Li, Wenhui Zhang, Hui Li, and Rui Pan

Scattering

  • Applied Optics Vol. 52, Iss. 36, pp. 8759–8764 (2013)
  • L. Li, T. L. Dong, and Q. X. Li

Spectroscopy

  • Applied Optics Vol. 52, Iss. 36, pp. 8670–8675 (2013)
  • Daehoon Han, Kanghee Lee, Jongseok Lim, Sei Sun Hong, Young Kie Kim, and Jaewook Ahn

Thin Films

  • Applied Optics Vol. 52, Iss. 36, pp. 8747–8758 (2013)
  • R. Datta, C. D. Munson, M. D. Niemack, J. J. McMahon, J. Britton, E. J. Wollack, J. Beall, M. J. Devlin, J. Fowler, P. Gallardo, J. Hubmayr, K. Irwin, L. Newburgh, J. P. Nibarger, L. Page, M. A. Quijada, B. L. Schmitt, S. T. Staggs, R. Thornton, and L. Zhang

Vision, Color, and Visual Optics

  • Applied Optics Vol. 52, Iss. 36, pp. 8779–8788 (2013)
  • Felix Kimme, Peter Brick, Sangam Chatterjee, and Tran Quoc Khanh
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