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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 13 — May. 1, 2014
  • pp: 2754–2948
  • Feat. pp: ISA1–C90

Optics InfoBase > Applied Optics > Volume 53 > Issue 13 > Table of Contents

Topics in this Issue

 
  • Diffraction and Gratings
  • Geometric Optics
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Nonlinear Optics
  • Optical Devices
  • Optics in Computing
  • Physical Optics
  • Remote Sensing and Sensors
  • Scattering
  • Thin Films
  • Ultrafast Optics
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IMAGING SYSTEMS AND APPLICATIONS 2014

  • Applied Optics Vol. 53, Iss. 13, pp. ISA1–ISA2 (2014)
  • Francisco H. Imai, Dale C. Linne von Berg, Torbjørn Skauli, Shoji Tominaga, and Zeev Zalevsky

  • Applied Optics Vol. 53, Iss. 13, pp. C1–C13 (2014)
  • Michael Rucci, Russell C. Hardie, and Kenneth J. Barnard

  • Applied Optics Vol. 53, Iss. 13, pp. C14–C24 (2014)
  • Miguel A. Martínez, Eva M. Valero, Javier Hernández-Andrés, Javier Romero, and Giacomo Langfelder

  • Applied Optics Vol. 53, Iss. 13, pp. C25–C31 (2014)
  • Alan Schaum

  • Applied Optics Vol. 53, Iss. 13, pp. C32–C44 (2014)
  • Andrey V. Kanaev, Christopher W. Miller, Collin J. Seanor, and Jeremy Murray-Krezan

  • Applied Optics Vol. 53, Iss. 13, pp. C45–C53 (2014)
  • Mary R. Kutteruf, Michael K. Yetzbacher, Michael J. DePrenger, Kyle M. Novak, Corey A. Miller, Trijntje Valerie Downes, and Andrey V. Kanaev

  • Applied Optics Vol. 53, Iss. 13, pp. C54–C63 (2014)
  • D. L. Marks, P. R. Llull, Z. Phillips, J. G. Anderson, S. D. Feller, E. M. Vera, H. S. Son, S.-H. Youn, J. Kim, M. E. Gehm, D. J. Brady, J. M. Nichols, K. P. Judd, M. D. Duncan, J. R. Waterman, R. A. Stack, A. Johnson, R. Tennill, and C. C. Olson

  • Applied Optics Vol. 53, Iss. 13, pp. C64–C71 (2014)
  • Torbjørn Skauli, Hans Erling Torkildsen, Stephane Nicolas, Thomas Opsahl, Trym Haavardsholm, Ingebjørg Kåsen, and Atle Rognmo

  • Applied Optics Vol. 53, Iss. 13, pp. C72–C82 (2014)
  • Susan P. Farnand and Mark D. Fairchild

  • Applied Optics Vol. 53, Iss. 13, pp. C83–C90 (2014)
  • Qi Peng, Xinghui Wang, Ge Ren, Hongbin Chen, Lei Cao, and Jihong Wang

REGULAR PAPERS

Diffraction and Gratings

  • Applied Optics Vol. 53, Iss. 13, pp. 2787–2792 (2014)
  • Jianyong Ma, Hongchao Cao, and Changhe Zhou

  • Applied Optics Vol. 53, Iss. 13, pp. 2802–2805 (2014)
  • Hongchao Cao, Changhe Zhou, Jianyong Ma, Jun Wu, and Shubin Li

  • Applied Optics Vol. 53, Iss. 13, pp. 2942–2948 (2014)
  • Kosuke Asano, Satoshi Yokoyama, Atsushi Kemmochi, and Toyohiko Yatagai

Geometric Optics

  • Applied Optics Vol. 53, Iss. 13, pp. 2822–2827 (2014)
  • Anne-Sophie Poulin-Girard, Xavier Dallaire, Simon Thibault, and Denis Laurendeau

Holography

  • Applied Optics Vol. 53, Iss. 13, pp. 2870–2880 (2014)
  • Rosario Porras-Aguilar, Malgorzata Kujawinska, and Weronika Zaperty

Image Processing

  • Applied Optics Vol. 53, Iss. 13, pp. 2839–2846 (2014)
  • Bin Qi, Chunhui Zhao, and Guisheng Yin

Imaging Systems

  • Applied Optics Vol. 53, Iss. 13, pp. 2881–2885 (2014)
  • Ji Qi and Wei-Chuan Shih

  • Applied Optics Vol. 53, Iss. 13, pp. 2924–2928 (2014)
  • Mingliang Chen, Enrong Li, and Shensheng Han

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 13, pp. 2793–2801 (2014)
  • Yasuaki Hori, Akiko Hirai, and Kaoru Minoshima

  • Applied Optics Vol. 53, Iss. 13, pp. 2806–2814 (2014)
  • Helin Lu, Chaohong Huang, Cheng Wang, Xiaozhong Wang, Hongyan Fu, and Ziyi Chen

  • Applied Optics Vol. 53, Iss. 13, pp. 2815–2821 (2014)
  • Michaela Schuster, Saulius Nevas, and Armin Sperling

  • Applied Optics Vol. 53, Iss. 13, pp. 2860–2865 (2014)
  • Jiamiao Yang, Lirong Qiu, Weiqian Zhao, Xin Zhang, and Xu Wang

  • Applied Optics Vol. 53, Iss. 13, pp. 2906–2916 (2014)
  • B. Canuel, E. Genin, M. Mantovani, J. Marque, P. Ruggi, and M. Tacca

  • Applied Optics Vol. 53, Iss. 13, pp. 2929–2935 (2014)
  • Ping Zhou, Xinran Liu, and Tongjing Zhu

Integrated Optics

  • Applied Optics Vol. 53, Iss. 13, pp. 2766–2772 (2014)
  • D. Cheneler, M. Vervaeke, and H. Thienpont

Lasers and Laser Optics

  • Applied Optics Vol. 53, Iss. 13, pp. 2886–2891 (2014)
  • A. Brahm, S. Döring, A. Wilms, G. Notni, S. Nolte, and A. Tünnermann

Materials

  • Applied Optics Vol. 53, Iss. 13, pp. 2853–2859 (2014)
  • Thiago Menegotto and Flavio Horowitz

Medical Optics and Biotechnology

  • Applied Optics Vol. 53, Iss. 13, pp. 2754–2765 (2014)
  • Xi Yi, Xin Wang, Weiting Chen, Wenbo Wan, Huijuan Zhao, and Feng Gao

Nonlinear Optics

  • Applied Optics Vol. 53, Iss. 13, pp. 2899–2905 (2014)
  • Ritapa Bhattacharjee, K. Senthilnathan, S. Sivabalan, and P. Ramesh Babu

Optical Devices

  • Applied Optics Vol. 53, Iss. 13, pp. 2936–2941 (2014)
  • Jianjun Pan, Weilai Li, and Jie Liu

Optics in Computing

  • Applied Optics Vol. 53, Iss. 13, pp. 2777–2786 (2014)
  • Faliu Yi, Jieun Lee, and Inkyu Moon

Physical Optics

  • Applied Optics Vol. 53, Iss. 13, pp. 2773–2776 (2014)
  • Radhakrishnan Ranjini, Murukeshan Vadakke Matham, and Nam-Trung Nguyen

Remote Sensing and Sensors

  • Applied Optics Vol. 53, Iss. 13, pp. 2833–2838 (2014)
  • Ali Masoudi and Trevor P. Newson

Scattering

  • Applied Optics Vol. 53, Iss. 13, pp. 2847–2852 (2014)
  • Pinghui S. Yeh, Chien-Wei Chen, Bing-Ru Yang, and Lu-Sheng Hong

  • Applied Optics Vol. 53, Iss. 13, pp. 2892–2898 (2014)
  • Harshavardhan Ashok Gaonkar, Dinesh Kumar, Rajagopal Ramasubramaniam, and Arindam Roy

Thin Films

  • Applied Optics Vol. 53, Iss. 13, pp. 2917–2923 (2014)
  • Zhongqi Tan, Kaiyong Yang, Xingwu Long, Yibo Zhang, and Hans-Peter Loock

Ultrafast Optics

  • Applied Optics Vol. 53, Iss. 13, pp. 2828–2832 (2014)
  • Tao Chen, Changrui Liao, D. N. Wang, and Yiping Wang

  • Applied Optics Vol. 53, Iss. 13, pp. 2866–2869 (2014)
  • Kai Wang, Miaochan Zhi, Xia Hua, James Strohaber, and Alexei V. Sokolov
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