Topics in this Issue
Differential interference contrast (DIC) images obtained for a liquid phase epitaxy-grown GaAs sample surface using a Sagnac interferometer-based DIC microscope for different biased phase difference between the laterally sheared interfering white light beams. For details, see Chatterjee and Kumar, pp. 296-300.
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- Optical properties of metallic films for vertical-cavity...
- Phase retrieval algorithms: a comparison
- Laser Beams and Resonators
- Recent advances in digital holography [Invited]
- Measuring very low optical powers with a common camera
- Exact analytic solutions of Maxwell’s equations...
- Simplifying numerical ray tracing for characterization of...
- Optical Constants of Water in the 200-nm to 200-?m...
- Multimode interference devices with...