OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 25 — Sep. 1, 2014
  • pp: 5576–5840

Optics InfoBase > Applied Optics > Volume 53 > Issue 25 > Table of Contents

Topics in this Issue

 
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Materials
  • Medical Optics and Biotechnology
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Physical Optics
  • Remote Sensing and Sensors
  • Ultrafast Optics
Click for help

Sort By: Topics | Page Range

FOCUS ON INST. RESEARCH AT GEORGIA TECH (INVITED ONLY)

  • Applied Optics Vol. 53, Iss. 25, pp. 5824–5840 (2014)
  • Andrew J. Stark, Pierre Isautier, Jie Pan, Sriharsha Kota Pavan, Mark Filer, Sorin Tibuleac, Robert Lingle, Richard de Salvo, and Stephen E. Ralph

REGULAR PAPERS

Diffraction and Gratings

  • Applied Optics Vol. 53, Iss. 25, pp. 5740–5744 (2014)
  • Nikolai I. Petrov, Vladislav G. Nikitin, Viktor A. Danilov, Vladimir V. Popov, and Boris A. Usievich

  • Applied Optics Vol. 53, Iss. 25, pp. 5769–5774 (2014)
  • Zoltán Várallyay and Péter Dombi

Fiber Optics and Optical Communications

  • Applied Optics Vol. 53, Iss. 25, pp. 5649–5653 (2014)
  • Hui Cao, Javid Atai, Yu Yu, Bangyun Xiong, Yan Zhou, Jing Cai, and Xuewen Shu

  • Applied Optics Vol. 53, Iss. 25, pp. 5660–5671 (2014)
  • P. D. Dragic, C. Kucera, J. Ballato, D. Litzkendorf, J. Dellith, and K. Schuster

Fourier Optics and Signal Processing

  • Applied Optics Vol. 53, Iss. 25, pp. 5784–5790 (2014)
  • André Junker, Tim Stenau, and Karl-Heinz Brenner

Holography

  • Applied Optics Vol. 53, Iss. 25, pp. 5733–5739 (2014)
  • Tatsuya Nishizaki, Osamu Matoba, and Kouichi Nitta

  • Applied Optics Vol. 53, Iss. 25, pp. 5815–5823 (2014)
  • Meiling Zheng, Xin Xie, Zhiying Zhang, Feng Shi, Xiuli Wang, Shencheng Fu, and Yichun Liu

Image Processing

  • Applied Optics Vol. 53, Iss. 25, pp. 5576–5584 (2014)
  • Kalyan Kumar Halder, Murat Tahtali, and Sreenatha G. Anavatti

  • Applied Optics Vol. 53, Iss. 25, pp. 5620–5631 (2014)
  • Satoshi Tomioka, Shusuke Nishiyama, and Samia Heshmat

  • Applied Optics Vol. 53, Iss. 25, pp. 5677–5684 (2014)
  • Hang Yang, Ming Zhu, Xiaotian Wu, Zhongbo Zhang, and Heyan Huang

Imaging Systems

  • Applied Optics Vol. 53, Iss. 25, pp. 5632–5639 (2014)
  • Huaidong Zhang, Afzal Muhammmad, Jun Luo, Qing Tong, Yu Lei, Xinyu Zhang, Hongshi Sang, and Changsheng Xie

  • Applied Optics Vol. 53, Iss. 25, pp. 5654–5659 (2014)
  • JianLei Zhang, XiaoRui Wang, YuJiao Chen, Shuo Yu, QiPing Zhang, and ZhaoHui Li

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 25, pp. 5598–5605 (2014)
  • Zhongming Yang, Zhishan Gao, Jiantai Dou, and Xinxing Wang

  • Applied Optics Vol. 53, Iss. 25, pp. 5694–5700 (2014)
  • Dali Liu, Yun Wang, Lirong Qiu, Xinyue Mao, and Weiqian Zhao

  • Applied Optics Vol. 53, Iss. 25, pp. 5755–5762 (2014)
  • Lei Zhang, Chao Tian, Dong Liu, Tu Shi, Yongying Yang, Hanshuo Wu, and Yibing Shen

  • Applied Optics Vol. 53, Iss. 25, pp. 5800–5806 (2014)
  • Matthew S. Warden

Integrated Optics

  • Applied Optics Vol. 53, Iss. 25, pp. 5615–5619 (2014)
  • C. Ozanam, M. Savanier, A. Lemaître, G. Almuneau, M. Carras, I. Favero, S. Ducci, and G. Leo

Materials

  • Applied Optics Vol. 53, Iss. 25, pp. 5593–5597 (2014)
  • Shing-Trong Wu and Andy Ying-Guey Fuh

  • Applied Optics Vol. 53, Iss. 25, pp. 5763–5768 (2014)
  • Yongzhi Cheng, Rongzhou Gong, Zhengze Cheng, and Yan Nie

  • Applied Optics Vol. 53, Iss. 25, pp. 5791–5799 (2014)
  • Mikala Johnson, Patrick Bowen, Nathan Kundtz, and Adam Bily

Medical Optics and Biotechnology

  • Applied Optics Vol. 53, Iss. 25, pp. 5672–5676 (2014)
  • Wenxiang Cong, Chao Wang, and Ge Wang

Nonlinear Optics

  • Applied Optics Vol. 53, Iss. 25, pp. 5641–5648 (2014)
  • Yuri E. Geints and Alexander A. Zemlyanov

  • Applied Optics Vol. 53, Iss. 25, pp. 5726–5732 (2014)
  • Nobuhiro Umemura, Daisuke Matsuda, Takuma Mizuno, and Kiyoshi Kato

Optical Design and Fabrication

  • Applied Optics Vol. 53, Iss. 25, pp. 5720–5725 (2014)
  • Yuan Wen-quan, Shang Hong-bo, and Zhang Wei

  • Applied Optics Vol. 53, Iss. 25, pp. 5745–5749 (2014)
  • Surya Cheemalapati, Mikhail Ladanov, John Winskas, and Anna Pyayt

  • Applied Optics Vol. 53, Iss. 25, pp. 5750–5754 (2014)
  • Aiming Ge, Jinlin Cai, Dehua Chen, Hongyun Shu, Peng Qiu, Junwei Wang, and Ling Zhu

  • Applied Optics Vol. 53, Iss. 25, pp. 5775–5783 (2014)
  • Yuan Zhou, Yafei Lu, Mo Hei, Guangcan Liu, and Dapeng Fan

Optical Devices

  • Applied Optics Vol. 53, Iss. 25, pp. 5685–5693 (2014)
  • Jianxin Zhu and Yufang Wang

  • Applied Optics Vol. 53, Iss. 25, pp. 5712–5719 (2014)
  • Rabin Dhakal and Jaeyoun Kim

Optics at Surfaces

  • Applied Optics Vol. 53, Iss. 25, pp. 5606–5614 (2014)
  • David Nečas, Ivan Ohlídal, Daniel Franta, Miloslav Ohlídal, Vladimír Čudek, and Jiří Vodák

Physical Optics

  • Applied Optics Vol. 53, Iss. 25, pp. 5585–5592 (2014)
  • Asticio Vargas, Fabián A. Torres-Ruiz, Juan Campos, Ramiro Donoso, José Luis Martínez, and Ignacio Moreno

Remote Sensing and Sensors

  • Applied Optics Vol. 53, Iss. 25, pp. 5807–5814 (2014)
  • Nabeel A. Riza and M. Junaid Amin

Ultrafast Optics

  • Applied Optics Vol. 53, Iss. 25, pp. 5701–5711 (2014)
  • Ronan J. Mahon and J. Anthony Murphy

Errata

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 25, pp. 5640–5640 (2014)
  • Yia-Chung Chang, Li-Chuan Tang, and Chun-Yi Yin
Click for help

Sort By: Topics | Page Range





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings