Editor's Picks

Nondestructive Testing

The editors of Applied Optics have selected articles from a variety of topic areas that reflect the progression of each area over Applied Optics' history.

These collections and the articles within them are not meant to be comprehensive but authoritative, showing that significant contributions were made and continue to be made in these areas.

For this collection, we are focusing on nondestructive testing and have provided a selection of 20 articles for your reading pleasure.

Moiré Topography
  • Applied Optics, Vol. 9 Issue 6, pp.1467-1472 (1970)
  • Takasaki, H
Time-Lapse Interferometry and Contouring Using Television Systems
  • Applied Optics, Vol. 10 Issue 12, pp.2722-2727 (1971)
  • Macovski, A; Ramsey, S D; Schaefer, L F
Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses
  • Applied Optics, Vol. 13 Issue 11, pp.2693-2703 (1974)
  • Bruning, J H; Herriott, D R; Gallagher, J E; Rosenfeld, D P; White, A D; Brangaccio, D J
Image-shearing camera for direct measurement of surface strains
  • Applied Optics, Vol. 18 Issue 7, pp.1046-1051 (1979)
  • Hung, Y Y; Liang, C Y
Digital wave-front measuring interferometry: some systematic error sources
  • Applied Optics, Vol. 22 Issue 21, pp.3421-3432 (1983)
  • Schwider, J; Burow, R; Elssner, K -E; Grzanna, J; Spolaczyk, R; Merkel, K
Fourier transform profilometry for the automatic measurement of 3-D object shapes
  • Applied Optics, Vol. 22 Issue 24, pp.3977-3982 (1983)
  • Takeda, Mitsuo; Mutoh, Kazuhiro
Automated phase-measuring profilometry of 3-D diffuse objects
  • Applied Optics, Vol. 23 Issue 18, pp.3105-3108 (1984)
  • Srinivasan, V; Liu, H C; Halioua, M
Phase-shifting speckle interferometry
  • Applied Optics, Vol. 24 Issue 18, pp.3053-3058 (1985)
  • Creath, Katherine
Electrooptic holography and its application to hologram interferometry
  • Applied Optics, Vol. 24 Issue 21, pp.3631-3637 (1985)
  • Stetson, Karl A; Brohinsky, William R
Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm
  • Applied Optics, Vol. 26 Issue 13, pp.2504-2506 (1987)
  • Hariharan, P; Oreb, B F; Eiju, T
New measurement system for fault location in optical waveguide devices based on an interferometric technique
  • Applied Optics, Vol. 26 Issue 9, pp.1603-1606 (1987)
  • Takada, Kazumasa; Yokohama, Itaru; Chida, Kazumori; Noda, Juichi
Three-dimensional sensing of rough surfaces by coherence radar
  • Applied Optics, Vol. 31 Issue 7, pp.919-925 (1992)
  • Dresel, Thomas; Häusler, Gerd; Venzke, Holger
Temporal phase-unwrapping algorithm for automated interferogram analysis
  • Applied Optics, Vol. 32 Issue 17, pp.3047-3052 (1993)
  • Huntley, J M; Saldner, H
Fourier-transform speckle profilometry: three-dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces
  • Applied Optics, Vol. 33 Issue 34, pp.7829-7837 (1994)
  • Takeda, Mitsuo; Yamamoto, Hirokazu
Extended averaging technique for derivation of error-compensating algorithms in phase-shifting interferometry
  • Applied Optics, Vol. 34 Issue 19, pp.3610-3619 (1995)
  • Schmit, Joanna; Creath, Katherine
Simultaneous three-dimensional dynamic deformation measurements with pulsed digital holography
  • Applied Optics, Vol. 38 Issue 34, pp.7056-7062 (1999)
  • Schedin, Staffan; Pedrini, Giancarlo; Tiziani, Hans J; Santoyo, Fernando Mendoza
Improved Vertical-Scanning Interferometry
  • Applied Optics, Vol. 39 Issue 13, pp.2107-2115 (2000)
  • Harasaki, Akiko; Schmit, Joanna; Wyant, James C
Studies of Digital Microscopic Holography with Applications to Microstructure Testing
  • Applied Optics, Vol. 40 Issue 28, pp.5046-5051 (2001)
  • Xu, Lei; Peng, Xiaoyuan; Miao, Jianmin; Asundi, Anand K
Common-Path Interferometer for Frequency-Domain Optical Coherence Tomography
  • Applied Optics, Vol. 42 Issue 34, pp.6953-6958 (2003)
  • Vakhtin, Andrei B; Kane, Daniel J; Wood, William R; Peterson, Kristen A
Terahertz imaging: applications and perspectives
  • Applied Optics, Vol. 49 Issue 19, pp.E48-E57 (2010)
  • Jansen, Christian; Wietzke, Steffen; Peters, Ole; Scheller, Maik; Vieweg, Nico; Salhi, Mohammed; Krumbholz, Norman; Jördens, Christian; Hochrein, Thomas; Koch, Martin