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Applied Optics

Applied Optics

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Instrumentation, measurement, and metrology : Metrology


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  • Optics Letters, Vol. 34, Issue 24, pp. 3854-3856 (December 2009)
  • Eleonora Rubino, Daniele Faccio, Luca Tartara, Philip K. Bates, Olivier Chalus, Matteo Clerici, Fabio Bonaretti, Jens Biegert, Paolo Di Trapani

  • Optics Letters, Vol. 35, Issue 5, pp. 790-792 (March 2010)
  • Yajun Wang, Sheng Yang, Xuyan Gou

  • Optics Express, Vol. 18, Issue 2, pp. 1159-1165 (January 2010)
  • Ki-Nam Joo, Jonathan D. Ellis, Eric S. Buice, Jo W. Spronck, Robert H. Munnig Schmidt

  • Optics Express, Vol. 18, Issue 2, pp. 1310-1315 (January 2010)
  • Shih-Hsin Hsu, Yia-Chung Chang, Yi-Chun Chen, Pei-Kuen Wei, Y. D. Kim

  • Optics Express, Vol. 18, Issue 2, pp. 1667-1676 (January 2010)
  • Yoshiaki Nakajima, Hajime Inaba, Kazumoto Hosaka, Kaoru Minoshima, Atsushi Onae, Masami Yasuda, Takuya Kohno, Sakae Kawato, Takao Kobayashi, Toshio Katsuyama, Feng-Lei Hong

  • Optics Express, Vol. 18, Issue 2, pp. 624-631 (January 2010)
  • Sangyoun Gee, Peter J. Delfyett

  • Optics Express, Vol. 18, Issue 3, pp. 1794-1800 (February 2010)
  • Shyh-Tsong Lin, Sheng-Lih Yeh, Zhi-Feng Lin

  • Optics Express, Vol. 18, Issue 3, pp. 1927-1936 (February 2010)
  • B. Ergun, T. Kavzoglu, I Colkesen, C. Sahin

  • Optics Express, Vol. 18, Issue 3, pp. 2036-2048 (February 2010)
  • Hongwei Jing, Christopher King, David Walker

  • Optics Express, Vol. 18, Issue 3, pp. 2632-2638 (February 2010)
  • Julio C. Estrada, Manuel Servin, Juan A. Quiroga

  • Optics Express, Vol. 18, Issue 3, pp. 2668-2681 (February 2010)
  • C. Leahy, C. Leroux, C. Dainty, L. Diaz-Santana

  • Optics Express, Vol. 18, Issue 5, pp. 5114-5123 (March 2010)
  • Maurizio Vannoni, Andrea Sordini, Giuseppe Molesini

  • Optics Express, Vol. 18, Issue 5, pp. 5271-5281 (March 2010)
  • Hongwei Jing, Christopher King, David Walker

  • Applied Optics, Vol. 49, Issue 1, pp. 21-31 (January 2010)
  • Peng Su, James H. Burge, Robert E. Parks

  • Applied Optics, Vol. 49, Issue 1, pp. 32-36 (January 2010)
  • I. Vayshenker, S. Yang, K. Amemiya, S. Mukai, T. Zama

  • Applied Optics, Vol. 49, Issue 1, pp. 56-60 (January 2010)
  • Kai Li, Bing Pan

  • Applied Optics, Vol. 49, Issue 2, pp. 170-179 (January 2010)
  • Chao Tian, Yongying Yang, Dong Liu, Yongjie Luo, Yongmo Zhuo

  • Applied Optics, Vol. 49, Issue 4, pp. 668-672 (February 2010)
  • King Ung Hii, Kuan Hiang Kwek

  • Applied Optics, Vol. 49, Issue 5, pp. 880-886 (February 2010)
  • Maija Ojanen, Petri Kärhä, Erkki Ikonen

  • Applied Optics, Vol. 49, Issue 6, pp. 1025-1031 (February 2010)
  • Ghazanfar Hussain, Masroor Ikram
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