Spatiotemporal amplitude and phase retrieval of space-time coupled ultrashort pulses using the Shackled-FROG technique

• Abstract

• Optics Letters, Vol. 34, Issue 24, pp. 3854-3856 (December 2009)
• Eleonora Rubino, Daniele Faccio, Luca Tartara, Philip K. Bates, Olivier Chalus, Matteo Clerici, Fabio Bonaretti, Jens Biegert, Paolo Di Trapani

Modified Fourier transform method for 3D profile measurement without phase unwrapping

• Abstract

• Optics Letters, Vol. 35, Issue 5, pp. 790-792 (March 2010)
• Yajun Wang, Sheng Yang, Xuyan Gou

High resolution heterodyne interferometer without detectable periodic nonlinearity

• Abstract
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• Optics Express, Vol. 18, Issue 2, pp. 1159-1165 (January 2010)
• Ki-Nam Joo, Jonathan D. Ellis, Eric S. Buice, Jo W. Spronck, Robert H. Munnig Schmidt

Optical metrology of randomly-distributed Au colloids on a multilayer film

• Abstract
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• Optics Express, Vol. 18, Issue 2, pp. 1310-1315 (January 2010)
• Shih-Hsin Hsu, Yia-Chung Chang, Yi-Chun Chen, Pei-Kuen Wei, Y. D. Kim

A multi-branch, fiber-based frequency comb with millihertz-level relative linewidths using an intra-cavity electro-optic modulator

• Abstract
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• Optics Express, Vol. 18, Issue 2, pp. 1667-1676 (January 2010)
• Yoshiaki Nakajima, Hajime Inaba, Kazumoto Hosaka, Kaoru Minoshima, Atsushi Onae, Masami Yasuda, Takuya Kohno, Sakae Kawato, Takao Kobayashi, Toshio Katsuyama, Feng-Lei Hong

Noise transfer functions of mode-locked semiconductor laser

• Abstract
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• Optics Express, Vol. 18, Issue 2, pp. 624-631 (January 2010)
• Sangyoun Gee, Peter J. Delfyett

Angular probe based on using Fabry-Perot etalon and scanning technique

• Abstract
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• Optics Express, Vol. 18, Issue 3, pp. 1794-1800 (February 2010)
• Shyh-Tsong Lin, Sheng-Lih Yeh, Zhi-Feng Lin

Data filtering with support vector machines in geometric camera calibration

• Abstract
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• Optics Express, Vol. 18, Issue 3, pp. 1927-1936 (February 2010)
• B. Ergun, T. Kavzoglu, I Colkesen, C. Sahin

Simulation and validation of a prototype swing arm profilometer for measuring extremely large telescope mirror-segments

• Abstract
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• Optics Express, Vol. 18, Issue 3, pp. 2036-2048 (February 2010)
• Hongwei Jing, Christopher King, David Walker

A self-tuning phase-shifting algorithm for interferometry

• Abstract
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• Optics Express, Vol. 18, Issue 3, pp. 2632-2638 (February 2010)
• Julio C. Estrada, Manuel Servin, Juan A. Quiroga

Temporal dynamics and statistical characteristics of the microfluctuations of accommodation: Dependence on the mean accommodative effort

• Abstract
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• Optics Express, Vol. 18, Issue 3, pp. 2668-2681 (February 2010)
• C. Leahy, C. Leroux, C. Dainty, L. Diaz-Santana

Long-term deformation at room temperature observed in fused silica

• Abstract
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• Optics Express, Vol. 18, Issue 5, pp. 5114-5123 (March 2010)
• Maurizio Vannoni, Andrea Sordini, Giuseppe Molesini

Measurement of influence function using swing arm profilometer and laser tracker

• Abstract
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• Optics Express, Vol. 18, Issue 5, pp. 5271-5281 (March 2010)
• Hongwei Jing, Christopher King, David Walker

Application of maximum likelihood reconstruction of subaperture data for measurement of large flat mirrors

• Abstract

• Applied Optics, Vol. 49, Issue 1, pp. 21-31 (January 2010)
• Peng Su, James H. Burge, Robert E. Parks

Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nm

• Abstract

• Applied Optics, Vol. 49, Issue 1, pp. 32-36 (January 2010)
• I. Vayshenker, S. Yang, K. Amemiya, S. Mukai, T. Zama

Frequency-guided windowed Fourier ridges technique for automatic demodulation of a single closed fringe pattern

• Abstract

• Applied Optics, Vol. 49, Issue 1, pp. 56-60 (January 2010)
• Kai Li, Bing Pan

Demodulation of a single complex fringe interferogram with a path-independent regularized phase-tracking technique

• Abstract

• Applied Optics, Vol. 49, Issue 2, pp. 170-179 (January 2010)
• Chao Tian, Yongying Yang, Dong Liu, Yongjie Luo, Yongmo Zhuo

Wavefront reversal technique for self-referencing collimation testing

• Abstract

• Applied Optics, Vol. 49, Issue 4, pp. 668-672 (February 2010)
• King Ung Hii, Kuan Hiang Kwek

Spectral irradiance model for tungsten halogen lamps in 340-850 nm wavelength range

• Abstract

• Applied Optics, Vol. 49, Issue 5, pp. 880-886 (February 2010)
• Maija Ojanen, Petri Kärhä, Erkki Ikonen

Measurement of angle and axis of rotation in a carousel interferometer: a detailed analysis

• Abstract

• Applied Optics, Vol. 49, Issue 6, pp. 1025-1031 (February 2010)
• Ghazanfar Hussain, Masroor Ikram