Determination of nongeometric effects: equivalence between Artmann’s and Tamir’s generalized methods

• Abstract

• JOSA A, Vol. 28, Issue 3, pp. 356-362 (March 2011)
• Liliana I. Perez, Rodolfo M. Echarri, María T. Garea, Guillermo D. Santiago

Effective method to extract optical bandgaps in Si nanowire arrays

• Abstract

• Optics Letters, Vol. 36, Issue 14, pp. 2677-2679 (July 2011)
• Jin-Young Jung, Keya Zhou, Han-Don Um, Zhongyi Guo, Sang-Won Jee, Kwang-Tae Park, Jung-Ho Lee

Negative Goos–Hänchen shift in periodic media

• Abstract

• Optics Letters, Vol. 36, Issue 22, pp. 4446-4448 (November 2011)
• Mikael C. Rechtsman, Yaroslav V. Kartashov, Frank Setzpfandt, Henrike Trompeter, Lluis Torner, Thomas Pertsch, Ulf Peschel, Alexander Szameit

Polarization modulation by tunable electromagnetic metamaterial reflector/absorber

• Abstract
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• Optics Express, Vol. 18, Issue 22, pp. 23196-23203 (October 2010)
• Bo Zhu, Yijun Feng, Junming Zhao, Ci Huang, Zhengbin Wang, Tian Jiang

Contrast improvement by selecting ballistic-photons using polarization gating

• Abstract
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• Optics Express, Vol. 18, Issue 23, pp. 23746-23755 (November 2010)
• Miloš Šormaz, Patrick Jenny

Large positive and negative lateral shifts near pseudo-Brewster dip on reflection from a chiral metamaterial slab

• Abstract
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• Optics Express, Vol. 19, Issue 2, pp. 1310-1323 (January 2011)
• Y. Y. Huang, W. T. Dong, L. Gao, D. W. Qiu

Nonlinear dependence between the surface reflectance and the duty-cycle of semiconductor nanorod array

• Abstract
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• Optics Express, Vol. 19, Issue 3, pp. 1680-1690 (January 2011)
• Yi-Hao Pai, Yu-Chan Lin, Jai-Lin Tsai, Gong-Ru Lin

An alternative differential method of femtosecond pump-probe examination of materials

• Abstract
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• Optics Express, Vol. 19, Issue 12, pp. 11290-11298 (June 2011)
• R. Ivanov, Jesús Villa, Ismael de la Rosa, E. Marín

Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry

• Abstract
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• Optics Express, Vol. 19, Issue 13, pp. 12809-12814 (June 2011)
• Lei Huang, Chi Seng Ng, Anand Krishna Asundi

Direct measurement of the spectral reflectance of OP-SDL gain elements under optical pumping

• Abstract
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• Optics Express, Vol. 19, Issue 18, pp. 16890-16897 (August 2011)
• Carl Borgentun, Jörgen Bengtsson, Anders Larsson

Reflection of nanosecond Nd:YAG laser pulses in ablation of metals

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21842-21848 (October 2011)
• O. Benavides, O. Lebedeva, V. Golikov

Improved sample characterization in terahertz reflection imaging and spectroscopy: erratum

• Abstract
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• Optics Express, Vol. 19, Issue 24, pp. 24782-24782 (November 2011)
• Shengyang Huang, Philip C. Ashworth, Kanis Wai Chi Kan, Yang Chen, Vincent P. Wallace, Yuan-ting Zhang, Emma Pickwell-MacPherson

Optical Interference Coatings 2010 Measurement Problem

• Abstract

• Applied Optics, Vol. 50, Issue 9, pp. C172-C177 (March 2011)
• Angela Duparré, Detlev Ristau

Is it possible to check microcomponent coatings?

• Abstract

• Applied Optics, Vol. 50, Issue 9, pp. C424-C432 (March 2011)
• Hervé Piombini, Philippe Voarino, Fabien Lemarchand

Estimation of phase shifts linked only to the coating for a dielectric mirror

• Abstract

• Applied Optics, Vol. 50, Issue 9, pp. C441-C448 (March 2011)
• Hervé Piombini

Terahertz reflectivities of metal-coated mirrors

• Abstract

• Applied Optics, Vol. 50, Issue 19, pp. 3201-3204 (July 2011)
• Mira Naftaly, Richard Dudley

Diffusion dynamics of small molecules from mesoporous silicon films by real-time optical interferometry

• Abstract

• Applied Optics, Vol. 50, Issue 27, pp. 5329-5337 (September 2011)
• Jeremy W. Mares, Sharon M. Weiss

Lava lamp optics

• Abstract

• Applied Optics, Vol. 50, Issue 28, pp. F16-F20 (October 2011)
• Thomas Alan Clark

Measurement based on fringe reflection for testing aspheric optical axis precisely and flexibly

• Abstract

• Applied Optics, Vol. 50, Issue 31, pp. 5944-5948 (November 2011)
• Yan Tang, Xianyu Su, Song Hu

Non-scanning, non-interferometric, three-dimensional optical prof ilometer with nanometer resolution

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 10, pp. 101202- (October 2011)
• Chen-Tai Tan, Yuan-Sheng Chan, Jhao-An Chen, Teh-Chao Liao, Ming-Hung Chiu