Specularity and shadow detection for the multisource photometric reconstruction of a textured surface

• Abstract

• JOSA A, Vol. 29, Issue 1, pp. 11-21 (January 2012)
• Benjamin Bringier, Alexandre Bony, Majdi Khoudeir

Generic gamma correction for accuracy enhancement in fringe-projection profilometry

• Abstract

• Optics Letters, Vol. 35, Issue 12, pp. 1992-1994 (June 2010)
• Thang Hoang, Bing Pan, Dung Nguyen, Zhaoyang Wang

High-efficiency 5000 lines/mm multilayer-coated blazed grating for extreme ultraviolet wavelengths

• Abstract

• Optics Letters, Vol. 35, Issue 15, pp. 2615-2617 (August 2010)
• Dmitriy L. Voronov, Minseung Ahn, Erik H. Anderson, Rossana Cambie, Chih-Hao Chang, Eric M. Gullikson, Ralf K. Heilmann, Farhad Salmassi, Mark L. Schattenburg, Tony Warwick, Valeriy V. Yashchuk, Lucas Zipp, Howard A. Padmore

Flexible calibration technique for fringe-projection-based three-dimensional imaging

• Abstract

• Optics Letters, Vol. 35, Issue 19, pp. 3192-3194 (October 2010)
• Minh Vo, Zhaoyang Wang, Thang Hoang, Dung Nguyen

Gamma-distorted fringe image modeling and accurate gamma correction for fast phase measuring profilometry

• Abstract

• Optics Letters, Vol. 36, Issue 2, pp. 154-156 (January 2011)
• Zhongwei Li, Youfu Li

Single-shot profilometry of rough surfaces using hyperspectral interferometry

• Abstract

• Optics Letters, Vol. 37, Issue 3, pp. 350-352 (February 2012)
• Taufiq Widjanarko, Jonathan M. Huntley, Pablo D. Ruiz

Characterization of wet pad surface in chemical mechanical polishing (CMP) process with full-field optical coherence tomography (FF-OCT)

• Abstract
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• Optics Express, Vol. 19, Issue 14, pp. 13343-13350 (July 2011)
• Woo June Choi, Sung Pyo Jung, Jun Geun Shin, Danning Yang, Byeong Ha Lee

Contours of slopes of a rippled water surface

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 18789-18794 (September 2011)
• Charles Cox, Xin Zhang

Method of surface topography retrieval by direct solution of sparse weighted seminormal equations

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 1714-1726 (January 2012)
• Jeffrey Koskulics, Steven Englehardt, Steven Long, Yongxiang Hu, Knut Stamnes

Effect of line roughness on the diffraction intensities in angular resolved scatterometry

• Abstract

• Applied Optics, Vol. 49, Issue 31, pp. 6102-6110 (November 2010)
• Akiko Kato, Frank Scholze

Phase-locked loop based on machine surface topography measurement using lensed fibers

• Abstract

• Applied Optics, Vol. 50, Issue 4, pp. 460-467 (February 2011)
• Jin-Ho Kang, ChaBum Lee, Jae-Young Joo, Sun-Kyu Lee

Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayers

• Abstract
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• Applied Optics, Vol. 50, Issue 9, pp. C148-C153 (March 2011)
• Marcus Trost, Sven Schröder, Torsten Feigl, Angela Duparré, Andreas Tünnermann

Angle-resolved scattering: an effective method for characterizing thin-film coatings

• Abstract

• Applied Optics, Vol. 50, Issue 9, pp. C164-C171 (March 2011)
• Sven Schröder, Tobias Herffurth, Holger Blaschke, Angela Duparré

Instantaneous spatially resolved acquisition of polarimetric and angular scattering properties in optical coatings

• Abstract

• Applied Optics, Vol. 50, Issue 9, pp. C217-C221 (March 2011)
• Myriam Zerrad, Michel Lequime

Definition of roughness structures for superhydrophobic and hydrophilic optical coatings on glass

• Abstract

• Applied Optics, Vol. 50, Issue 9, pp. C257-C263 (March 2011)
• Luisa Coriand, Monika Mitterhuber, Angela Duparré, Andreas Tünnermann

Two-dimensional quantification of the corrosion process in metal surfaces using digital speckle pattern interferometry

• Abstract

• Applied Optics, Vol. 50, Issue 10, pp. 1323-1328 (April 2011)
• N. Andrés, J. Lobera, M. P. Arroyo, L. A. Angurel

High precision dynamic multi-interface profilometry with optical coherence tomography

• Abstract
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• Applied Optics, Vol. 50, Issue 32, pp. 6039-6048 (November 2011)
• Samuel Lawman, Haida Liang

Regularized multiframe phase-shifting algorithm for three-dimensional profilometry

• Abstract

• Applied Optics, Vol. 51, Issue 1, pp. 33-42 (January 2012)
• Fuqin Deng, Wui Fung Sze, Jiangwen Deng, Kenneth S. M. Fung, W. H. Leung, Edmund Y. Lam

Angle-deviation optical profilometer

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 1, pp. 011201- (January 2011)
• Chen-Tai Tan, Yuan-Sheng Chan, Zhen-Chin Lin, Ming-Hung Chiu

Non-scanning, non-interferometric, three-dimensional optical prof ilometer with nanometer resolution

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 10, pp. 101202- (October 2011)
• Chen-Tai Tan, Yuan-Sheng Chan, Jhao-An Chen, Teh-Chao Liao, Ming-Hung Chiu