Quadriwave lateral shearing interferometry in an achromatic and continuously self-imaging regime for future x-ray phase imaging

• Abstract

• Optics Letters, Vol. 36, Issue 8, pp. 1398-1400 (April 2011)
• Julien Rizzi, Timm Weitkamp, Nicolas Guérineau, Mourad Idir, Pascal Mercère, Guillaume Druart, Grégory Vincent, Paulo da Silva, Jérôme Primot

Lateral shearing interferometry of high-harmonic wavefronts

• Abstract

• Optics Letters, Vol. 36, Issue 10, pp. 1746-1748 (May 2011)
• Dane R. Austin, Tobias Witting, Christopher A. Arrell, Felix Frank, Adam S. Wyatt, Jon P. Marangos, John W.G. Tisch, Ian A. Walmsley

X-ray spatial harmonic imaging of phase objects

• Abstract

• Optics Letters, Vol. 36, Issue 12, pp. 2209-2211 (June 2011)
• Yanan Liu, Brian Ahr, Alexander Linkin, Gerald J. Diebold, Christoph Rose-Petruck

Two-dimensional gratings-based phase-contrast imaging using a conventional x-ray tube

• Abstract

• Optics Letters, Vol. 36, Issue 18, pp. 3551-3553 (September 2011)
• Genta Sato, Takeshi Kondoh, Hidenosuke Itoh, Soichiro Handa, Kimiaki Yamaguchi, Takashi Nakamura, Kentaro Nagai, Chidane Ouchi, Takayuki Teshima, Yutaka Setomoto, Toru Den

X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer

• Abstract

• Optics Letters, Vol. 37, Issue 10, pp. 1622-1624 (May 2012)
• S. Berujon, H. Wang, I. Pape, K. Sawhney, S. Rutishauser, C. David

Hard x-ray phase contrast imaging using a tabletop Talbot–Lau interferometer with multiline embedded x-ray targets

• Abstract

• Optics Letters, Vol. 38, Issue 2, pp. 157-159 (January 2013)
• Takayoshi Shimura, Naoki Morimoto, Sho Fujino, Takaharu Nagatomi, Keni-chi Oshima, Jimpei Harada, Kazuhiko Omote, Naohisa Osaka, Takuji Hosoi, Heiji Watanabe

X-ray wavefront characterization of a Fresnel zone plate using a two-dimensional grating interferometer

• Abstract

• Optics Letters, Vol. 38, Issue 6, pp. 827-829 (March 2013)
• Hongchang Wang, Sebastien Berujon, Ian Pape, Simon Rutishauser, Christian David, Kawal Sawhney

Two-dimensional grating-based X-ray phase-contrast imaging using Fourier transform phase retrieval

• Abstract
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• Optics Express, Vol. 19, Issue 4, pp. 3339-3346 (February 2011)
• Hidenosuke Itoh, Kentaro Nagai, Genta Sato, Kimiaki Yamaguchi, Takashi Nakamura, Takeshi Kondoh, Chidane Ouchi, Takayuki Teshima, Yutaka Setomoto, Toru Den

Four-dimensional X-ray phase tomography with Talbot interferometry and white synchrotron radiation: dynamic observation of a living worm

• Abstract
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• Optics Express, Vol. 19, Issue 9, pp. 8423-8432 (April 2011)
• Atsushi Momose, Wataru Yashiro, Sébastien Harasse, Hiroaki Kuwabara

Partially coherent nano-focused x-ray radiation characterized by Talbot interferometry

• Abstract
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• Optics Express, Vol. 19, Issue 10, pp. 9656-9675 (May 2011)
• T. Salditt, S. Kalbfleisch, M. Osterhoff, S. P. Krüger, M. Bartels, K. Giewekemeyer, H. Neubauer, M. Sprung

X-ray wavefront characterization using a rotating shearing interferometer technique

• Abstract
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• Optics Express, Vol. 19, Issue 17, pp. 16550-16559 (August 2011)
• Hongchang Wang, Kawal Sawhney, Sébastien Berujon, Eric Ziegler, Simon Rutishauser, Christian David

Second-order autocorrelation of XUV FEL pulses via time resolved two-photon single ionization of He

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21698-21706 (October 2011)
• R. Moshammer, Th. Pfeifer, A. Rudenko, Y. H. Jiang, L. Foucar, M. Kurka, K. U. Kühnel, C. D. Schröter, J. Ullrich, O. Herrwerth, M. F. Kling, X.-J. Liu, K. Motomura, H. Fukuzawa, A. Yamada, K. Ueda, K. L. Ishikawa, K. Nagaya, H. Iwayama, A. Sugishima, Y. Mizoguchi, S. Yase, M. Yao, N. Saito, A. Belkacem, M. Nagasono, A. Higashiya, M. Yabashi, T. Ishikawa, H. Ohashi, H. Kimura, T. Togashi

Non-absorption grating approach for X-ray phase contrast imaging

• Abstract
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• Optics Express, Vol. 19, Issue 23, pp. 22669-22674 (November 2011)
• Yang Du, Xin Liu, Yaohu Lei, Jinchuan Guo, Hanben Niu

A tilted grating interferometer for full vector field differential x-ray phase contrast tomography

• Abstract
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• Optics Express, Vol. 19, Issue 25, pp. 24890-24896 (December 2011)
• Simon Rutishauser, Tilman Donath, Christian David, Franz Pfeiffer, Federica Marone, Peter Modregger, Marco Stampanoni

Theory of oblique and grazing incidence Talbot‑Lau interferometers and demonstration in a compact source x‑ray reflective interferometer

• Abstract
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• Optics Express, Vol. 19, Issue 25, pp. 25093-25112 (December 2011)
• Han Wen, Camille K Kemble, Eric E. Bennett

Phase contrast laminography based on Talbot interferometry

• Abstract
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• Optics Express, Vol. 20, Issue 6, pp. 6496-6508 (March 2012)
• Venera Altapova, Lukas Helfen, Anton Myagotin, Daniel Hänschke, Julian Moosmann, Jan Gunneweg, Tilo Baumbach

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

• Abstract
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• Optics Express, Vol. 20, Issue 22, pp. 24977-24986 (October 2012)
• Satoshi Matsuyama, Hikaru Yokoyama, Ryosuke Fukui, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Wataru Yashiro, Atsushi Momose, Tetsuya Ishikawa, Kazuto Yamauchi

Inner-focusing reconstruction method for grating-based phase-contrast CT

• Abstract
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• Optics Express, Vol. 21, Issue 5, pp. 6224-6232 (March 2013)
• Yan Xi, Jun Zhao

Interpretation of dark-field contrast and particle-size selectivity in grating interferometers

• Abstract

• Applied Optics, Vol. 50, Issue 22, pp. 4310-4319 (August 2011)
• Susanna K. Lynch, Vinay Pai, Julie Auxier, Ashley F. Stein, Eric E. Bennett, Camille K. Kemble, Xianghui Xiao, Wah-Keat Lee, Nicole Y. Morgan, Han Harold Wen

Determination of thickness and optical constants of solgel derived polyvinylpyrrolidone/ZrO₂films from transmission spectra using different dispersion models

• Abstract

• Applied Optics, Vol. 51, Issue 29, pp. 6937-6944 (October 2012)
• Hongbao Jia, Jinghua Sun, Yao Xu, Dong Wu