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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

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Vol. 54, Iss. 4 -- February 1, 2015; pp: B1-B96

LIGHT AND COLOR IN THE OPEN AIR 2014

  • Applied Optics Vol. 54, Iss. 4, pp. B1–B7 (2015)
  • Gunther P. Können, Jaap Tinbergen, and Piet Stammes

  • Applied Optics Vol. 54, Iss. 4, pp. B8–B11 (2015)
  • David K. Lynch

  • Applied Optics Vol. 54, Iss. 4, pp. B12–B21 (2015)
  • Souichiro Hioki and Hironobu Iwabuchi

  • Applied Optics Vol. 54, Iss. 4, pp. B22–B25 (2015)
  • David K. Lynch

  • Applied Optics Vol. 54, Iss. 4, pp. B26–B34 (2015)
  • Harald E. Edens

  • Applied Optics Vol. 54, Iss. 4, pp. B35–B40 (2015)
  • Gunther P. Können

  • Applied Optics Vol. 54, Iss. 4, pp. B41–B45 (2015)
  • David K. Lynch

  • Applied Optics Vol. 54, Iss. 4, pp. B46–B53 (2015)
  • Philip Laven

  • Applied Optics Vol. 54, Iss. 4, pp. B54–B63 (2015)
  • James A. Lock

  • Applied Optics Vol. 54, Iss. 4, pp. B64–B75 (2015)
  • Joseph A. Shaw, Paul W. Nugent, and Michael Vollmer

  • Applied Optics Vol. 54, Iss. 4, pp. B76–B84 (2015)
  • Michael Vollmer, Joseph A. Shaw, and Paul W. Nugent

  • Applied Optics Vol. 54, Iss. 4, pp. B85–B92 (2015)
  • Glenn Palmer and Sönke Johnsen

  • Applied Optics Vol. 54, Iss. 4, pp. B93–B96 (2015)
  • Harald E. Edens and Gunther P. Können

Vol. 54, Iss. 1 -- January 1, 2015; pp: A1-A31

2014 DIGITAL HOLOGRAPHY

  • Applied Optics Vol. 54, Iss. 1, pp. A1–A8 (2015)
  • Jean-Michel Desse and Pascal Picart

  • Applied Optics Vol. 54, Iss. 1, pp. A9–A17 (2015)
  • Hieu Nguyen, Dung Nguyen, Zhaoyang Wang, Hien Kieu, and Minh Le

  • Applied Optics Vol. 54, Iss. 1, pp. A18–A22 (2015)
  • Kaho Watanabe and Takanori Nomura

  • Applied Optics Vol. 54, Iss. 1, pp. A23–A31 (2015)
  • Longchao Yao, Xuecheng Wu, Yingchun Wu, Jing Yang, Xiang Gao, Linghong Chen, Gérard Gréhan, and Kefa Cen

Editor: Joseph N. Mait • Vol. 53, Iss. 35 -- December 10, 2014 • pp: 8151-8181

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 35, pp. 8175–8181 (2014)
  • Türkay Kart, Gülşen Kösoğlu, Heba Yüksel, and Mehmet Naci İnci

Lasers and Laser Optics

  • Applied Optics Vol. 53, Iss. 35, pp. 8157–8166 (2014)
  • B. Parker, G. Marra, L. A. M. Johnson, H. S. Margolis, S. A. Webster, L. Wright, S. N. Lea, P. Gill, and P. Bayvel

Optics at Surfaces

  • Applied Optics Vol. 53, Iss. 35, pp. 8167–8174 (2014)
  • Katarzyna Gasior, Tadeusz Martynkien, and Waclaw Urbanczyk

Vision, Color, and Visual Optics

  • Applied Optics Vol. 53, Iss. 35, pp. 8151–8156 (2014)
  • Jiang Lei, Gu Xin, and Muqing Liu

Editor: Joseph N. Mait • Vol. 53, Iss. 34 -- December 1, 2014 • pp: 8006-8150  Feature pp: J1-J18

ADVANCES IN LITHOGRAPHY

  • Applied Optics Vol. 53, Iss. 34, pp. J1–J6 (2014)
  • Aamod Shanker, Lei Tian, Martin Sczyrba, Brid Connolly, Andrew Neureuther, and Laura Waller

  • Applied Optics Vol. 53, Iss. 34, pp. J7–J18 (2014)
  • Kenneth C. Johnson

REGULAR PAPERS

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 53, Iss. 34, pp. 8111–8115 (2014)
  • Miaomiao Tang and Daomu Zhao

Detectors

  • Applied Optics Vol. 53, Iss. 34, pp. 8078–8085 (2014)
  • S. Hubert and V. Prévot

Fiber Optics and Optical Communications

  • Applied Optics Vol. 53, Iss. 34, pp. 8049–8054 (2014)
  • S. E. Alavi, I. S. Amiri, H. Ahmad, A. S. M. Supa’at, and N. Fisal

  • Applied Optics Vol. 53, Iss. 34, pp. 8145–8150 (2014)
  • Ning Jing, Jie Zheng, Xiaowei Zhao, and Chuanxin Teng

Image Processing

  • Applied Optics Vol. 53, Iss. 34, pp. 8060–8070 (2014)
  • A. Mahalanobis, R. Shilling, R. Murphy, and R. Muise

Imaging Systems

  • Applied Optics Vol. 53, Iss. 34, pp. 8131–8139 (2014)
  • Min Wu, Krista Jansen, Geert Springeling, Antonius F. W. van der Steen, and Gijs van Soest

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 34, pp. 8020–8031 (2014)
  • Yanyan Zhao and Yan Yuan

  • Applied Optics Vol. 53, Iss. 34, pp. 8116–8122 (2014)
  • S. Padin

Integrated Optics

  • Applied Optics Vol. 53, Iss. 34, pp. 8012–8019 (2014)
  • Jian Zhou, Huiping Tian, Daquan Yang, Qi Liu, Lijun Huang, and Yuefeng Ji

  • Applied Optics Vol. 53, Iss. 34, pp. 8071–8077 (2014)
  • S. Soudi and B. M. A. Rahman

Lasers and Laser Optics

  • Applied Optics Vol. 53, Iss. 34, pp. 8032–8035 (2014)
  • Zhenzhen Yu, Mingjian Wang, Xia Hou, and Weibiao Chen

  • Applied Optics Vol. 53, Iss. 34, pp. 8055–8059 (2014)
  • Hailong Yu, Xiaolin Wang, Rumao Tao, Pu Zhou, and Jinbao Chen

Materials

  • Applied Optics Vol. 53, Iss. 34, pp. 8043–8048 (2014)
  • Hossein Alisafaee and Michael A. Fiddy

  • Applied Optics Vol. 53, Iss. 34, pp. 8086–8094 (2014)
  • Haoyu Li, Yue Qi, James P. Ryle, and John T. Sheridan

Optical Devices

  • Applied Optics Vol. 53, Iss. 34, pp. 8036–8042 (2014)
  • Qiliang Li, Zhen Zhang, Dongqiang Li, Mengyun Zhu, Xianghong Tang, and Shuqin Li

  • Applied Optics Vol. 53, Iss. 34, pp. 8104–8110 (2014)
  • Shengjun Zhou, Bin Cao, Shu Yuan, and Sheng Liu

  • Applied Optics Vol. 53, Iss. 34, pp. 8140–8144 (2014)
  • Thomas Weber, Stefanie Kroker, Thomas Käsebier, Ernst-Bernhard Kley, and Andreas Tünnermann

Spectroscopy

  • Applied Optics Vol. 53, Iss. 34, pp. 8095–8103 (2014)
  • Avishek Guha and Ingmar Schoegl

  • Applied Optics Vol. 53, Iss. 34, pp. 8123–8130 (2014)
  • D. I. Naydenkova, V. Weinzettl, J. Stockel, and J. Matějíček

Thin Films

  • Applied Optics Vol. 53, Iss. 34, pp. 8006–8011 (2014)
  • Pravakar P. Rajbhandari, Amin Emrani, Tara P. Dhakal, Charles R. Westgate, and David Klotzkin
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