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Advances in Optics and Photonics

Advances in Optics and Photonics


  • Editor: Bahaa E. A. Saleh
  • Vol. 5, Iss. 4 — Dec. 31, 2013

Modeling photonic crystal interfaces and stacks: impedance-based approaches

Felix J. Lawrence, C. Martijn de Sterke, Lindsay C. Botten, R. C. McPhedran, and Kokou B. Dossou  »View Author Affiliations

Advances in Optics and Photonics, Vol. 5, Issue 4, pp. 385-455 (2013)

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In many research areas, the reflective properties of a bulk medium are characterized by its impedance or an impedance-like quantity. Such a quantity is essential for the efficient design of stacked structures such as antireflection coatings and thin-film filters. For 2D photonic crystals and metamaterials, the literature contains multiple definitions of impedance, not all of which are consistent. We review these proposed definitions, evaluate their regions of applicability, and numerically test their accuracy in a variety of salient photonic crystal examples.

© 2013 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(050.5298) Diffraction and gratings : Photonic crystals
(160.5298) Materials : Photonic crystals
(230.5298) Optical devices : Photonic crystals

ToC Category:
Optical Devices

Original Manuscript: February 28, 2013
Revised Manuscript: June 3, 2013
Manuscript Accepted: June 27, 2013
Published: September 12, 2013

Virtual Issues
(2013) Advances in Optics and Photonics

Felix J. Lawrence, C. Martijn de Sterke, Lindsay C. Botten, R. C. McPhedran, and Kokou B. Dossou, "Modeling photonic crystal interfaces and stacks: impedance-based approaches," Adv. Opt. Photon. 5, 385-455 (2013)

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