Self-calibrating technique for terahertz time-domain material parameter extraction

• Abstract

• JOSA A, Vol. 28, Issue 12, pp. 2561-2567 (December 2011)
• Jose A. Hejase, Edward J. Rothwell, Premjeet Chahal

Accuracy enhancement of digital image correlation with B-spline interpolation

• Abstract

• Optics Letters, Vol. 36, Issue 16, pp. 3070-3072 (August 2011)
• Long Luu, Zhaoyang Wang, Minh Vo, Thang Hoang, Jun Ma

Optical fiber-coupled InGaAs-based terahertz time–domain spectroscopy system

• Abstract

• Optics Letters, Vol. 36, Issue 16, pp. 3094-3096 (August 2011)
• Sang-Pil Han, Hyunsung Ko, Namje Kim, Han-Cheol Ryu, Chul Wook Lee, Young Ahn Leem, Donghun Lee, Min Yong Jeon, Sam Kyu Noh, Hyang Sook Chun, Kyung Hyun Park

Terahertz scattering by subwavelength cylindrical arrays

• Abstract
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• Optics Express, Vol. 19, Issue 11, pp. 10138-10152 (May 2011)
• Gretel M. Png, Christophe Fumeaux, Mark R. Stringer, Robert E. Miles, Derek Abbott

A compact orbital angular momentum spectrometer using quantum zeno interrogation

• Abstract
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• Optics Express, Vol. 19, Issue 12, pp. 11615-11622 (June 2011)
• Paul Bierdz, Hui Deng

Contact-free fault location and imaging with on-chip terahertz time-domain reflectometry

• Abstract
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• Optics Express, Vol. 19, Issue 13, pp. 12509-12514 (June 2011)
• Michael Nagel, Alexander Michalski, Heinrich Kurz

3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing

• Abstract
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• Optics Express, Vol. 19, Issue 23, pp. 22594-22599 (November 2011)
• K. Shao, A. Morisset, V. Pouget, E. Faraud, C. Larue, D. Lewis, D. McMorrow

Efficient terahertz en-face imaging

• Abstract
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• Optics Express, Vol. 19, Issue 23, pp. 23042-23053 (November 2011)
• Stefan Katletz, Michael Pfleger, Harald Pühringer, Nico Vieweg, Benedikt Scherger, Bernd Heinen, Martin Koch, Karin Wiesauer

Measurement of transient deformation by color encoding

• Abstract
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• Optics Express, Vol. 19, Issue 25, pp. 25712-25722 (December 2011)
• C. Mares, B. Barrientos, A. Blanco

Optical coherence tomography for quality assessment of embedded microchannels in alumina ceramic

• Abstract
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• Optics Express, Vol. 20, Issue 4, pp. 4603-4618 (February 2012)
• Rong Su, Mikhail Kirillin, Peter Ekberg, Arne Roos, Ekaterina Sergeeva, Lars Mattsson

Multipoint laser Doppler vibrometry with single detector: principles, implementations, and signal analyses

• Abstract

• Applied Optics, Vol. 50, Issue 10, pp. 1280-1288 (April 2011)
• Y. Fu, M. Guo, P. B. Phua

Two-dimensional quantification of the corrosion process in metal surfaces using digital speckle pattern interferometry

• Abstract

• Applied Optics, Vol. 50, Issue 10, pp. 1323-1328 (April 2011)
• N. Andrés, J. Lobera, M. P. Arroyo, L. A. Angurel

High-accuracy thickness measurement of a transparent plate with the heterodyne central fringe identification technique

• Abstract

• Applied Optics, Vol. 50, Issue 21, pp. 4011-4016 (July 2011)
• Wang-Tsung Wu, Hung-Chih Hsieh, Wei-Yao Chang, Yen-Liang Chen, Der-Chin Su

Double-exposure phase calculation method in electronic speckle pattern interferometry based on holographic object illumination

• Abstract

• Applied Optics, Vol. 50, Issue 23, pp. 4642-4647 (August 2011)
• Richárd Séfel, János Kornis

Study on a method of evaluating the alignment of pixels between fiber-optic image bundles and detector arrays

• Abstract

• Applied Optics, Vol. 50, Issue 25, pp. E189-E192 (September 2011)
• Xu He, Yang Xiang

Improvement of digital photoelasticity based on camera response function

• Abstract

• Applied Optics, Vol. 50, Issue 27, pp. 5263-5270 (September 2011)
• Shih-Hsin Chang, Hsien-Huang P. Wu

Optically enhanced sensitivity of external electro-optic polymer probing system

• Abstract

• Applied Optics, Vol. 50, Issue 30, pp. 5889-5893 (October 2011)
• Wen-Kai Kuo, Zhi-Jian Li, Hui-Chi Lin, Hsiao-Yu Chou

Scattering characterization of nanopigments in metallic coatings using hyperspectral optical imaging

• Abstract

• Applied Optics, Vol. 50, Issue 31, pp. G47-G55 (November 2011)
• José M. Medina, José A. Díaz

Characterization of strong fiber Bragg gratings using an applied thermal chirp and iterative algorithm

• Abstract

• Applied Optics, Vol. 50, Issue 36, pp. 6617-6626 (December 2011)
• Gary A. Miller, John R. Peele, Charles G. Askins, Geoffrey A. Cranch

Image vector histogram approach to nanoparticle sizing

• Abstract

• Applied Optics, Vol. 51, Issue 5, pp. 651-658 (February 2012)
• John G. Walker, Nam Trung Huynh, Rui Chen