Abstract

An electrical circuit based on analog computer principles has been designed that calculates spectrographic results directly from spectral line transmission values. It operates by solving the equation of the working curve of the element under analysis which must be a straight line in the range that includes all the percentage values of interest. If not straight, the intensity ratio of the analysis and standard lines can be calculated and percentage read from the working curve. Corrections for background and variation in emulsion response with wavelength can also simultaneously be included in the calculation.

Calculation of Integrated Intensities in Spectrographic Microanalysis*

J. K. Hurwitz
J. Opt. Soc. Am. 44(1) 30-34 (1954)

Effect of Stray Light in Prism and Grating Spectrographs on Emulsion Calibration Curves and Its Significance in Spectrographic Analysis*

Richard N. Kniseley and Velmer A. Fassel
J. Opt. Soc. Am. 44(5) 390-393 (1954)

Matrix formalism for calculation of electric field intensity of light in stratified multilayered films

Koji Ohta and Hatsuo Ishida
Appl. Opt. 29(13) 1952-1959 (1990)

The Spectrographic Analysis of Ferro-Silicon

J. H. Coulliette
J. Opt. Soc. Am. 37(8) 609-613 (1947)

A Possible Extension of the Density-Difference Method of Spectrographic Analysis

B. Verkerk
J. Opt. Soc. Am. 41(12) 1017-1022 (1951)