Abstract

Reflection measurements in the infrared are useful in the determination of optical constants of materials, reststrahlen peaks, efficiency of black paints, and attenuated total reflection studies. While many papers have dealt with reflection, few have investigated the effect of the angle of incidence upon the reflection spectra. Besides angle of incidence, another important factor is the use of a collimated beam. Both of these parameters must be known and controlled for best results. Some results illustrating the effect of varying the incident angle on samples are discussed, as well as the relationship between angle of incidence and polarization.

Determination of specular reflectances in a liquid medium with a variable angle of incidence

S. Gil, G. A. Clarke, L. McGarry, and C. E. Waltham
Appl. Opt. 34(4) 695-702 (1995)

Phase retarders with variable angles of total internal reflection

N. N. Nagib and M. S. El-Bahrawy
Appl. Opt. 33(7) 1218-1222 (1994)

Roughness measurements of Si and Al by variable angle spectroscopic ellipsometry

Julio R. Blanco and Patrick J. McMarr
Appl. Opt. 30(22) 3210-3220 (1991)

Angle measurement based on the internal-reflection effect and the use of right-angle prisms

P. S. Huang and J. Ni
Appl. Opt. 34(22) 4976-4981 (1995)

Angle measurement based on the internal-reflection effect: a new method

P. S. Huang, S. Kiyono, and O. Kamada
Appl. Opt. 31(28) 6047-6055 (1992)