Abstract

A dual-beam Fourier transform infrared spectrometer (FT-IR) is described. Sensitivity improvement, photometric accuracy, and instrument stability are evaluated by comparing dual-beam spectra with conventional single-beam spectra. Dual-beam FT-IR data acquisitions require an order of magnitude less measurement time than single-beam acquisitions for spectra of comparable signal-to-noise ratios. Application of dual-beam FT-IR for analysis of a highly transmitting sample is discussed. Single fiber analysis without masking and without an infrared microscope is described.

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