Abstract

The resolution enhancement technique of Fourier self-deconvolution is applied to the FT-IR spectra of linear polydimethylsiloxane oligomers. A series of pure oligomers of known chain length is analyzed in regions characteristic of silicon-methyl modes in order to separate dimethyl from trimethyl contributions. Once separated, the relative size of the deconvoluted peaks can be quantitatively related to the chain length of the oligomers. This proves to be an effective means of obtaining chain length information from the infrared spectra and is applicable to oligomers having molecular weights up to 15,000.

Noise in Fourier self-deconvolution

Jyrki K. Kauppinen, Douglas J. Moffatt, David G. Cameron, and Henry H. Mantsch
Appl. Opt. 20(10) 1866-1879 (1981)

Recent applications of FT-IR spectroscopy to polymer systems

J. L. Koenig and M. K. Antoon
Appl. Opt. 17(9) 1374-1385 (1978)

Effects of the self-emission of an IR Fourier-transform spectrometer on measured absorption spectra

J. Schreiber, T. Blumenstock, and H. Fischer
Appl. Opt. 35(31) 6203-6209 (1996)

Deconvolution of ir spectra in real time

G. Halsey and W. E. Blass
Appl. Opt. 16(2) 286-288 (1977)

Determination of line parameters from FTS spectra

V. Dana and A. Valentin
Appl. Opt. 27(21) 4450-4453 (1988)