In Situ Measurements of Infrared Reflection Absorption and Emission Spectra of Oxide Film Formed on Chromium Metal at Temperatures up to 973 K
Applied Spectroscopy, Vol. 46, Issue 3, pp. 464-467 (1992)
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Abstract
An apparatus has been constructed for in situ measurements of infrared reflection absorption and emission spectra. Chromium metal oxidized at 973 K in air for 25 min was investigated at various temperatures up to 973 K. The frequencies of the bands shifted toward the lower wavenumber range with increasing temperature. In situ measurements were made for isothermal oxidation of chromium at 773 K.
Citation
Katsuya Honda, Tooru Atake, and Yasutoshi Saito, "In Situ Measurements of Infrared Reflection Absorption and Emission Spectra of Oxide Film Formed on Chromium Metal at Temperatures up to 973 K," Appl. Spectrosc. 46, 464-467 (1992)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-46-3-464
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