Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 46,
  • Issue 3,
  • pp. 464-467
  • (1992)

In Situ Measurements of Infrared Reflection Absorption and Emission Spectra of Oxide Film Formed on Chromium Metal at Temperatures up to 973 K

Not Accessible

Your library or personal account may give you access

Abstract

An apparatus has been constructed for <i>in situ</i> measurements of infrared reflection absorption and emission spectra. Chromium metal oxidized at 973 K in air for 25 min was investigated at various temperatures up to 973 K. The frequencies of the bands shifted toward the lower wavenumber range with increasing temperature. <i>In situ</i> measurements were made for isothermal oxidation of chromium at 773 K.

PDF Article
More Like This
Emissivity modeling of metals during the growth of oxide film and comparison of the model with experimental results

Tohru Iuchi, Tohru Furukawa, and Shigenobu Wada
Appl. Opt. 42(13) 2317-2326 (2003)

Infrared Absorptivities of Transition Metals at Room and Liquid-Helium Temperatures*

M. C. Jones, D. C. Palmer, and C. L. Tien
J. Opt. Soc. Am. 62(3) 353-360 (1972)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.