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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 49, Iss. 9 — Sep. 1, 1995
  • pp: 1275–1278

Measurement of Fluid Film Thickness on Curved Surfaces by Raman Spectroscopy

Erik J. Hutchinson, Darren Shu, Fred LaPlant, and Dor Ben-Amotz

Applied Spectroscopy, Vol. 49, Issue 9, pp. 1275-1278 (1995)


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Abstract

The Raman scattering intensity from a polyphenylether fluid film entrapped between a diamond window and a one-inch-diameter steel ball is found to correlate linearly with fluid film thickness over a 0.1 to 10 μm thickness range. The calibration and precision of the technique, as well as comparisons with other methods, are discussed.

Citation
Erik J. Hutchinson, Darren Shu, Fred LaPlant, and Dor Ben-Amotz, "Measurement of Fluid Film Thickness on Curved Surfaces by Raman Spectroscopy," Appl. Spectrosc. 49, 1275-1278 (1995)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-49-9-1275


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